Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Test Program Management
TP-M
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TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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Test Program Sets (TPS)
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Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Test Program Quality Verification
CodeReport
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CodeReport is an easy-to-use application for verifying test program quality. CodeReport comes with many different, known quality screening rules that can be used to verify your test program is complete and ready for production. CodeReport also provides a graphical Rule Editor that allows you to create your own, custom rules. Ensure your coding standards and quality specifications are correct by generating your set of rules, checks, and screenings. Easily generate a detailed report for locating, correcting, and documenting the state of your test program. Quickly identify the tester hardware and instrumentation needed to run your program with the Tester Resource report. Save a session file to quickly return to your project after edits have been made or use the Session on other similar projects to transfer your configuration and custom rules.
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Test Program Development
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Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Flying Probe Test
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Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In addition to test program development, we offer board test services, maintaining the systems and staff that allow for high throughput and the ability to consistently deliver the rapid turn times that customers can depend on. And, with 7,000 square feet of space, we feature a modern, clean, ESD safe and ITAR registered facility that surpasses expectations.
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Test Adapter
FECVF1600
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Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
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Highly Accelerated Stress Screening (HASS) Test
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HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
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Virtual tester
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Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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Content based revision compare of Test Programs
Test program Comparator
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TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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Boundary Scan Test and JTAG Programming Tool Set
onTAP® Series 4000
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onTAP is a comprehensive boundary scan testing and JTAG programming tool set that bolsters the most accurate possible fault coverage in an affordable and expedient manner, while providing support for the entire product life cycle.
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288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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UDIMM DDR3L 1600
SQR-UD3N
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Micron Original memory IC, FIXED BOM. 3yrs longevity & lifetime warranty, Undergo strict test program. Support Smart Monitoring (SQR Manager)Select Product.
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MODBUS RTU Test Software
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MODBUS RTU Communication Test Program that helps users troubleshoot MODBUS RTU Communications. The software supports function codes, #3, #6 and #10(hex)
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CAD / BOM Translation Software
ProntoTEST-FIXTURE
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In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Certification Programs
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With the intention of creating confidence among customers and facilitating interoperability across multi-vendor networks, the UNH-IOL has partnered with several industry forums to create certification programs. Testing plays a large part in these certification programs, and the use of independent third-party test houses, like us, is key to their success. We do not certify devices, rather we supply unbiased information these certification programs need to accurately certify devices
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Test Program Modules
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The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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Electric Vehicle Battery Tester
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The Electric Vehicle Battery Tester (EVT) is designed for testing traction batteries in electric vehicles or HEV batteries in hybrid electric vehicles. The EVT realizes the functions charge and discharge with freely programmable set values for current, voltage, power or resistance in test programs, as well as the registration of the corresponding measured data.
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In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Climate Test Control
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The visibility and intuitive clarity of the created interface ensures the simplicity of creating climate testing programs and significantly reduces the possibility of operator error. Monitoring of the climate chamber parameters can be carried out both in manual mode and automatically. The program for measuring the electrical parameters of the tested product can also be configured. The data saved during the test can be presented in a graphical format and converted into Excel format.
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Test Requirement Document for Developing and Documenting Strategy and Structure of Test Programs
TRD System
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The TRD System helps users develop and document the strategy and structure of test programs using TRD format screens, flowchart generation tools and documentation formats, all in accordance with the most popular military standard format ( MIL-STD-1519) or with unique custom formats. It also has the ability to automatically generate an ATLAS test program from the TRD information provided by the user.
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Digital Battery & Electrical System Analyzer w/Printer
726
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*Accurate Battery & Electrical System Tester *Features programmed test for new Start/Stop Batteries 3 Testers in ONE! 1) 6 & 12 Volt Battery Tester + 12V Start/Stop Battery Test 2) 12 & 24 Volt Charging System Tester 3) Alternator-Starting-Charging System Tester *Wide Testing Range from 40 to 2,000 CCA *Built-in Printer - print the results for permanent service records *Removable/Replaceable Cable Set *Patented Dynamic Resistance Technology
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Ring Wave Generator
SKS-1206IA/SKS-1206IB
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Shanghai Sanki Electronic Industries Co., Ltd.
The ring wave generator is fully compliant with the new standards of IEC61000-4-12 and GB/T17626.12. The interface contains standard differences between IEC and Chinese national standards. Users can choose to enter the corresponding interface to perform different Test: Program -controlled high-voltage power supply and electronic switch have the characteristics of high precision, long life and good reproducibility.
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Heavy Duty Dynamometers
MD-250-HD
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The MD-250-HD series dyno (SE/DE) was designed to be a performance dynamometer first with the added benefit of being able to test 2-wheel-drive heavy-duty vehicles such as truck, buses and commercial vehicles in addition to the standard car or light duty pick-up. The 250-HD is certified in the states of Colorado, Nevada and Utah for use in loaded-mode diesel smog testing programs because of its accuracy and reliability. No other dyno in its class offers more value or better in-house motor vehicle testing capabilities than the Mustang MD-250-HD. For starters, the MD-250-HD boasts a 1,500 horsepower measurement capacity at a top speed of 175 mph and a powerful air-cooled eddy current brake provides the MD-250-HD-SE with 900-hp worth ofloading capacity for steady state testing. Loading capacity can be increased to 1,500-hp via the optional DE model. The 250-HD can be upgraded to the 250-HD-SE-M via the addition of a 100 or 200 hp AC motor for transient testing of electric buses to measure range and regeneration or for emissions testing of IC engines. Do not be fooled by its compact size – the MD-250-HD is a serious dynamometer with serious tuning capabilities. The MD-250-HD uses a powerful eddy current power absorber, a frictionless, air-cooled braking device, to enable it to apply variable and steady state loading. A complete control and data acquisition system lets you design a wide range of tests or select from a host of pre-configured tests included with the standard system. The 250-HD’s four roller design makes setting up vehicles a snap – simply drive onto the 250-HD and let the tires settle in between the rollers. The 250-HD can be installed above-ground or below-ground, it’s your choice. The above-ground system utilizes an optional premium platform and ramp system with an above-ground restraint kit. The addition of an axle pull-down kit help keep the tires from slipping or trying to “climb out” of the rollers.
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XJLink2-3030
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The XJLink2-3030 provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from SPEA 3030 ICT machines.
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4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
Controller
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
790406-12
Vector Network Analyzer
The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Pattern Conversion
Wave Wizard
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Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
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Test & Measurement Services
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We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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Single Channel Signal Buffer Module
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Alliance Support Partners, Inc.
Signal quality problems caused by mismatched impedance can result in intermittent measurements and faulty diagnostics. This is most often observed when transporting a test program from one system to another, such as re-hosting it from an older generation system to a new one. The primary root cause of the impedance mismatch is the signal path from the UUT to the measurement instrument. The switching system technology often is responsible for much of the distortion. The Signal Buffer Module (SBM) is designed to receive a signal from the UUT with high impedance output and accurately reproduced it at the output for delivery to the measurement instrument. The SBM output matches the 50 ohm input impedance of most measurement instruments and result in significantly reduced signal distortion.
