Radar Test
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Product
PSG Analog Signal Generator, 100 kHz to 67 GHz
E8257D
Signal Generator
Address your toughest requirements with metrology-grade frequency & level accuracy with excellent distortion & spurious characteristicsTest high-power devices & overcome test system losses with 1 W output powerAddress the demanding needs of Doppler radar, ADC & receiver-blocking tests with the PSG's extremely low phase noiseCharacterize devices & circuits by adding AM, FM, PM & pulse modulation to your signalMeet test system needs up to 1.1 THz with frequency extender modules
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Product
NI PXIe Based Platform for Radar/EW Test
BAT
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• NI PXIe Based Platform for Radar/EW Test- Leverages a Variety of NI FPGAs/VSTs/Upconverters up to 44GHz- LabVIEWTM and LabVIEWTM FPGA Software Environment• Provides PDW to IQ Generation• Multi-Emitter System- Faster Simulation Setup- More Complex Scenario Testing- Ease of Changing Scenarios• Supports Multiple PDW Formats- Simple, Built-In PDW Format- Industry Standard PDW Formats (e.g., NEWEG)- Custom PDW Formats• PDW Data Accessible via Stored Files, or Live Streaming• Factory to Field Deployable
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Product
Radar Altimeter Test Set
Core Technology
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Eastern OptX core technology enables the conversion of microwave signals to optical signals (E/O), time delaying this signal then reconverting the light back to original microwave signal (O/E) with superior fidelity over traditional time delay methods. Products include Radar Target Simulation, Radar Altimeter Testing, Channel Simulation (Air Interface) and Multipath Creation.
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Product
Radar Cross Section (RCS) Measurement and Evaluation System
XRC
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KEYCOM develops various radars for versatile applications based on its knowledge and expertise on millimeter wave and microwave technologies. KEYCOM’s product line of radars includes Radar Test Systems (RTS) to evaluate distance accuracy or output, Radar Alignment Systems (RAS) to help you adjust the alignment of radars, and Radar Cross Section (RCS) measurement systems to measure RCS of such radar targets as aircraft, ships and automobiles.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-03
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Radar Altimeter Test Set
6000
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The Eastern OptX Series 6000 Altimeter Test Set is designed to test and calibrate radar altimeter systems. The Series 6000 provides multiple, programmable delays with front panel and/or remote computer control. It features ultra wide bandwidth, low loss, high isolation, and high dynamic range. Able to simulate altitudes up to 50,000 feet, the test set operates from 4.2 to 4.4 GHz and offers altitude accuracy up to 0.1 %.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-02
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Pulse Radar Reference Test Solution
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Compact Reference Solution with ADP7104, M8195A, WR15CCU, WR15CCD, N5183B combines commercial off-the-shelf COTS modular hardware and software from Guzik, Keysight Technologies, KJ Microwave and Virginia Diodes, which provides a flexible testbed for radar waveform generation and analysis. Generate and analyze pulse radar waveforms. Pre-correct waveforms for overall channel response. Supports many topologies for radar transmitter / receiver testing (IQ, IF, RF, microwave, millimeter-wave).
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Product
Microwave Power Amplifiers
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Spanawave/Giga-tronics Microwave Power Amplifiers deliver outstanding performance and exceptional value. These ultra-broadband amplifiers have excellent pulse performance and modulated signal fidelity, ideal for testing in wireless communications, defense EW and radar testing and general purpose microwave laboratory applications. Have the power you need to overcome cable and switching losses, or to drive higher power mixers, detectors and very high power amplifiers.
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Product
Automotive Radar Testers
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Rohde & Schwarz provides automotive manufacturers, components suppliers and test houses with innovative, cutting-edge solutions which bring realistic test scenarios from the road to the lab and production line.Our range of solutions include a signal generator-based target simulator, a radome & bumper tester and an anechoic automotive radar test chamber allowing for over-the-air (OTA) testing. These solutions are at the heart of the development of advanced driver assistance systems (ADAS) with its safety-critical features such as emergency braking. Using T&M solutions by Rohde & Schwarz enables a thorough testing of chipsets, sensors and modules at each phase from development and conformance to production.
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Product
Double Taper Horn Antenna
MDTH series
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This product is the antenna that corresponds to the radar pulse immunity test for automotive equipments. Automotive manufacturers have required the electric field strength of 600 v/m. Amplifier system and cable will be cheaper, and will contribute to the ecology.
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Product
High Gain Horn Antenna
BBHA 9120 K
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The BBHA 9120 K is a linear polarized high gain horn antenna for immunity testing at short distances, especially optimized forAutomotive 600 V/m Pulse Radar Test 1.2 - 1.4 GHz. Standard: General Motors: GMW3097, Ford: EMC-CS-2009.
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Custom Test System Solutions
Test System
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Compact EMS/EMI Test Platform
CEMS100
Test Platform
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
