Transistor
damage check for polarity, gain (5-1000 volts), and shorts.
See Also: Field Effect Transistor, NPN Transistor, GaN
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Product
Transistor Tester
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*Measure rich DC parameters of maniford semiconductors, e.g. diode, transistor, controlled silicon, FET.*Measure capacitor, varistor, DC voltage signal source*Measure 78 and 79 three terminal voltage regulator*Data hold, low battery warning*Complete with carry case and six 1.5V AA batteries
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Product
Photocouplers/Optocouplers Transistor Output
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The PS2xxx series, a range of transistor output type general-purpose photocouplers (optocouplers), feature a high isolation voltage, high temperature operation and compliance with various international safety standards.
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Transistor Testing
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Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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Transistor Arrays
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Renesas' portfolio of transister arrays include NPN, PNP, NPN-PNP combination transistor arrays based on our complementary UHF-1 SOI process. This portfolio also includes ultra high frequency transistor arrays for VHF/UHF amplifiers, VHF/UHF mixers, IF converters, synchronous detectors. Dual long-tailed pair transistor arrays and Gilbert Cell UHF transistor arrays are also available for wireless communication systems, radio and satellite communications and high performance instrumentation.
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Product
AC /DC Withstand Voltage Tester 5KV/100mA
2672C
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Shenzhen Chuangxin Instruments Co., Ltd.
*High voltage, large current, high accuracy.*Leakage current, testing time, continuous arbitrarily, well-adapted.*Synchronized display measuring value( time, voltage and current).*Can choose manual or remote control test*High voltage breakdown protection, sound and light alarm, safe and reliable *Easy operation, suitable for use in production line*DC output can test small capacitance, high-voltage silicon stack, reverse voltage of transistors
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Product
PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument
778952-02
Digital Waveform
50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.
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Product
Heavy Duty Digital Multimeter
DMM 8007
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1.999 count LCD display. Resistance to 2000 M£[. Frequency to 20MHz. Capacitance measurement. Inductance measurement. Logic Test. Transistor hFE test. Audible continuity test
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Product
High Impedance Preamplifier
1671
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The Model 1671 is a single ended low noise field effect transistor
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Product
Steam Aging Test Chambers
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Dongguan Amade Instruments Technology Co., Ltd
Steam aging test chamber is a climatic test machine used to judge the products performance to resist extreme circumstance under high temperature, high humidity and high pressure during the transportation, storage and usage. The principle is very simple, water in the tank is heated turning into steam to form a simulated test environment under specified temperature and humidity. Specimens are placed into the drawers of machine to carry out test lasting for preselected time. It is applicable to electronic connectors, semiconductor IC, transistor, LCD, diodes, resistances etc.
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Optoelectronics
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Renesas provides a wide range of optoelectronic devices, including IC output photocouplers (optocouplers) featuring a high response from 1Mbps to 15Mbps, as well as general purpose transistor output devices featuring high isolation voltage, high temperature operation and compliance with various international safety standards. For motor drive applications, dedicated photocouplers provide high isolation voltage, high temperature operation, high output current, and high-speed switching. These are complemented by a diverse range of ultra-high speed devices for fiber-optic applications, as well as solid state relays (OCMOS FETs).
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Product
FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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NI-6581, 100 MHz, 54 Single-Ended-Channel Digital I/O Adapter Module
780565-01
Digital I/O Adapter
100 MHz, 54 Single-Ended-Channel Digital I/O Adapter Module for FlexRIO—The NI-6581 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO, creates a digital instrument for interfacing with 54 single-ended digital pins. You can use the NI-6581 to do real-time interfacing of standard protocols and implement customized protocols. The NI-6581 can operate sample digital waveforms at up to 100 MHz. It includes support for common transistor-to-transistor logic (TTL) voltage levels, or other voltage references can be sourced externally using a front panel connector.
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Product
Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
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Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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Product
AstroAI Digital Multimeter
TRMS 6000
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WIDE RANGE of tests for Voltage, Current, Resistance, Continuity, Capacitance, Frequency; Tests Diodes Transistors, TemperaturePROFESSIONAL LEVEL features include Auto-Ranging capability, and True RMS for measuring both AC Current and Voltage
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Vibration Monitors
VS1 / VS2
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Features• VS1 protects against excessive vibration levels• VS2 is ideal for use deliberately vibrating machinery• Settable RMS vibration velocity alarm trip-point and delay time• LED’s provide an instant view of machine status• Isolated SPDT relay output or transistor output• 24 VDC (18-30 VDC) powered
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Voltage Controlled Oscillators
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Teledyne Microwave Solutions (TMS) offers Voltage Controlled Oscillators (VCOs) utilizing bipolar transistors & silicon varactors over the frequency range of 40 MHz to 18GHz. Many of the VCO designs incorporate internal filtering, regulation & amplifiers to meet total system requirements in a small integrated package. Additionally, our hermetic hybrid designs can be screened to the most demanding military and space applications.
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Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Product
Diode Tester
FEC VF40CM
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Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
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Amplifier Module
LNAM-B
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Fully differential ultra-low-noise voltage amplifier module (LNAM) with selected bipolar rf transistors at the input stage. The amplifier exhibits ultra-low voltage noise, very high speed, and good dc precision. 50 Ohm input termination realized by negative feedback allows for the lowest possible noise temperature.
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Product
Compact Semiconductor ATE
QST286
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Product
PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument
778952-03
Digital Waveform
50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.
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Product
MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
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The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
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PXIe-6544, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument
780992-03
Digital Waveform
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Product
AC Input Single
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AC input/single transistor output photocouplers (optocouplers) are optically coupled isolators containing GaAs infrared light emitting diodes and an NPN silicon phototransistor. This type consists of two infrared light emitting diodes connected in inverse-parallel, and operates directly on AC input current.
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Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Inductive Sensors
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In general, inductive proximity switches consist of four basic elements: a coil, an oscillator, a threshold switch and an output stage with short-circuit protection.The oscillator generates a high frequency, electromagnetic alternating field which is emitted from the active face of the coil.Eddy currents are induced in a metal object that enters this field. These eddy currents draw energy from both the electromagnetic field and from the oscillator which is consequently attenuated.The more energy taken the closer the metal object moves towards the active face. The threshold switch switches on the output stage at a defined attenuation value.In proximity switches with a DC voltage supply, this switch is designed as an NPN transistor which switches the connected load to the negative pole or as a PNP transistor which switches the load to the positive pole. The output stage is a thyristor or a triac in AC voltage switches.
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Power Discrete Tester
Mostrak-2
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M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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PXI Matrix Switch Module
Switch Module
PXI Matrix Switch Modules are organized into rows and columns and provide maximum flexibility for switching systems by allowing you to connect any channel to any other channel. PXI Matrix Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor (FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a matrix that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NI Switch Executive provides additional software tools to help you design, build, and deploy your switching system.
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In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Darlington Arrays
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Darlington devices are high-voltage, high-current switch arrays containing multiple open-collector Darlington pairs or multiple Darlington transistors with common emitters, and integral suppression diodes for inductive loads. The nominal current rating of each output is 500 mA for the 7- and 8-output devices and up to 1.5 A for quad-output devices. The inputs are pinned opposite the outputs to simplify the application board layout. These devices interface standard logic families.
