Signal Conditioning Systems
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Mezzanine System
5158
The 5158 Electrical Conversion Module (ECM) provides eight (8) RS-232 outputs and eight (8) RS-232 inputs. Built around Maxim 1488 & 1489 chips for true RS232 levels and voltage tolerance, all outputs come up in the 1, mark or idle state. Electrically this is a negative output voltage, the start bit is always a 0 or a positive voltage level.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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NVIDIA® Jetson Xavier™ NX Edge AI Vision Inference System
EOS-JNX Series
The EOS-JNX series has a built-in Smart PoE feature to control PoE power remotely to reduce maintenance efforts in challenging environments and provides PoE power loss detection to alert of any unexpected PoE disconnection. The EOS-JNX-I is designed as an AI PoE switch for connecting to IP cameras to enable AI inferencing, and also provides an uplink port to connect to a network video recorder (NVR) for recording video streams, making upgrading existing surveillance systems easy. The EOS-JNX-G is designed for industrial AI machine vision applications, providing a dedicated bandwidth of 1Gb per channel with a GigE camera connection, which is crucial for production line and manufacturing applications.
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Signal, Patchcord, Receiver, 36", QuadraPaddle, 22 AWG White, Single Ended (5 Amps)
7-124922000-036
Signal, Patchcord, Receiver, 36", QuadraPaddle, 22 AWG White, Single Ended (5 Amps).
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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PXIe-5673E, 6.6 GHz PXI Vector Signal Generator
781340-03
6.6 GHz PXI Vector Signal Generator—The PXIe‑5673E is a wide-bandwidth module that, when combined with the appropriate software, can generate a variety of signals. With the Modulation Toolkit for LabVIEW, it can generate different waveforms including AM, FM, CPM, ASK, FSK, MSK, PSK, QAM (4‑, 16‑, 64‑, and 256‑QAM), multitone signals, arbitrary waveforms, and many others. In addition, you can combine these vector signal generators with standard-specific software to generate signals for GPS, GSM/ EDGE/WCDMA, WLAN, WiMAX, DVB‑C/H/C, ISDB‑T, ZigBee, and others. With PXIe‑5673E stream‑from‑disk capabilities, you can generate continuous waveforms that are up to several terabytes in length.
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Signal, Patchcord, Receiver, 36", TriPaddle, 22 AWG, Single Ended ( 5 Amps)
7-104922000-036
Signal, Patchcord, Receiver, 36", TriPaddle, 22 AWG, Single Ended ( 5 Amps).
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12GHz Four Channel Signal Generator
LS1294B
The LS1294B is a 12GHz Four Channel RF Analog Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VME Data Acquistion System
ADM-31
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Signal, Patchcord, ITA, 36", TriPaddle (30 Micron), 4 Conductor Shielded 22/24AWG 120Ω
7-103889000-036
Signal, Patchcord, ITA, 36", TriPaddle (30 Micron), 4 Conductor Shielded 22/24AWG 120Ω
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Signal Patchcord, ITA, 36", QuadraPaddle, 24 AWG Black Teflon, Single Ended
7-121024000-036
Signal Patchcord, ITA, 36", QuadraPaddle, 24 AWG Black Teflon, Single Ended.
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UXA Signal Analyzer, 2 Hz to 110 GHz
N9042B
Test the real performance of your millimeter-wave (mmWave) innovations in 5G, satellite, radar, and more with our N9042B UXA X-Series signal analyzer and measurement applications. The N9042B provides the industry's widest analysis bandwidth and deepest dynamic range to help you solve your most difficult mmWave challenges — tight design margins and timelines, complex modulation, and stringent standards.
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PXA Signal Analyzer, Multi-touch, 3 Hz to 50 GHz
N9030B
Accelerate innovation in demanding applications with measurement options that range from excellent to exceptionalExtend frequency up to 110 GHz with Keysight smart mixersCapture transient or intermittent signals with real-time spectrum analysisSimplify application-specific testing with X-Series appsPerform deeper troubleshooting with the 89600 VSA software
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Signal, Patchcord, ITA, 36", TriPaddle, 26 AWG Twisted Pair White/Black, Single Ended (1.5 Amps)
7-105426000-036
Signal, ITA, TriPaddle (7 Amps) 26 AWG Twisted Pair White/Black (1.5 Amps)
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Computing VITA System
CRS 48.5
The CRS 48.5 is a complete, integrated, pre-tested, ready-to-run HPEC rugged subsystem enabling faster development/deployment at lower cost and risk using the most advanced VITA 48.5 compliant air-flowthrough cooling to allow the integration of up to eight quad core Intel® Core™ i7 processing nodes.
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PXI Breadboard Module, 2-Slot, 20-Pin GMCT
40-220A-802
The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
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PXI-2514, 7-Channel, 40 A PXI Signal Insertion Switch Module
778572-14
7-Channel, 40 A PXI Signal Insertion Switch Module—The PXI‑2514 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2514 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls
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PXIe System Sync Module, 2 Port
M9032A
The M9032A has a Soft Front Panel (SFP) that provides a graphical user interface to the system sync module. It allows the user to set up the most commonly used functionalities of the module. The SFP also gives you the ability to check the module's connection status, configure the reference clock and IO settings, and perform firmware udpates.
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Signal, Patchcord, Receiver, 72", QuadraPaddle, 22 AWG Twisted Pair, Single Ended ( 5 Amps)
7-124422000-072
Signal, Patchcord, Receiver, 72", QuadraPaddle, 22 AWG Twisted Pair, Single Ended ( 5 Amps).
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Communications System Analyzer
Freedom R8200
The Freedom R8200 from Astronics Test Systems represents a major step in the evolution of the Land Mobile Radio Test. The Freedom R8200 is the first and only test instrument that combines comprehensive digital and analog LMR testing with the ability to measure important RF network characteristics, such as Distance to Fault (DTF), Return Loss, and Voltage Standing Wave Ratio (VSWR). The Freedom R8200 is also the only service monitor with the abilityto display advanced RF Parameters in a Smith Chart for more complicated network analysis
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NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
