Electronics Test
Devices whose quality of operation is based on the effects of electrons.
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Electronics
Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Electronic Tachometers
1 1/4″, 2 1/4″ & 3 1/8″ Aircore Propeller tach for Rotax912/914 engines, connects to tach coil, calibrated to Propeller RPM, not Engine RPM! Custom color marking available, internal light optional! Hourmeter can be set to count engine time or flight time and preset to any numbers —(must be done at UMA facility)!—Standard setting 800rpm & above. White or Antique yellow dial with black numbers available, per request!
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Control Electronics
Data acquisition and control electronics for optical radiation sources and measurement systems including precision current and voltage supplies for LEDs and tungsten halogen lamps.
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ELECTRONIC MEGOHMMETER
MI-1050e
The MI-1050e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 1 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 2.000.000 MΩ with four test voltages: 100 V, 250 V, 500 V and 1.000 V.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Test System
UltraFLEX
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Adapter/Stainless Steel
WADP-QSMSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Open Test Platform for High Performance Automotive Applications
TSVP
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Development Test for Electric Motors with Power Electronics
Test bench for electric machines and inverters in hybrid applications*Control of mechanical parameters*Verification of electrical properties*Checking the LL characteristics*Short circuit measurement*Recording the performance process*Noise measurement*Temperature measurement
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Electronic Units
Electronic units for field installation and mounting rack installation control the actuators. They are fed with 115 or 230 V AC. A local control panel allows for easy basic settings.
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Electronic Ammeters
The device puts out a voltage that is proportional to a magnetic field to which it is exposed.
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Off-Line Testing Platform
6TL29
6TL29 Testing platforms are based on the modularity concept; its construction is completely modular and scalable, allowing the user to take advantage of a powerful and reliable platform with a minimum investment.The platform is compact and due to its reduced footprint can be integrated easily into any production line. It’s ideal for High-Mix Low-Mid Volume production environments.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Electronic Loads
Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
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Electronic Loads
Electronic loads are indispensable tools in several fields of electrochemistry, for example in the research of batteries and fuel cells. Using an additional external power supply you easily can extend an EL to a two-quadrant potentiostat you need e.g. in the field of electrolysis.
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Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Electronics Manufacturing Services
In many cases variability of production and test platforms available restricts production flexibility and may cause bottlenecks in factories. Therefore, standardization of existing test equipment and reusability of fixtures/needle beds in off-line and in-line platforms are essential aspects.
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Electronic Design
We design and build custom racks, special switching systems, RF systems and custom Digital/ Analog sub assemblies. The hardware can be packaged per your requirements, using industry standard modules, rack mounted instruments, or custom made packaging. Extensive LabVIEW, embedded and other programming languages development are available as part of our hardware control support.
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AC Electronic Load
IT8600 Series
IT8600 is ITECH latest series of AC/DC electronic loads with power range 0~14.4 kVA and adjustable frequency 45 Hz ~ 450 Hz. The unique oscilloscope waveform display function of IT8600's can display input voltage & current as waveform. It is equipped with measurement modes for different parameters such as inrush current, peak value, effective value, PF (power factor).
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
