Electronics Test
Devices whose quality of operation is based on the effects of electrons.
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Product
F86311B064G080L
1035111
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The F86311B064G080L model is a highly specialized Basic Contact Probe designed for reliable and precise applications in various electronic testing environments. This switch probe operates in a Normally Open (NO) configuration, featuring a robust construction that ensures longevity and consistent performance. With a temperature range of -45°C to +100°C, this probe is well-suited for use in challenging conditions, making it an excellent choice for a wide array of tasks in laboratories and production lines alike.In terms of technical specifications, the F86311B064G080L boasts a continuous current capacity of 2.00 A and a low typical contact resistance of 65.00 mOhm, ensuring efficient electrical performance. The mechanical characteristics include a preload of 20 cN and a maximum travel distance of 5.00 mm. These features contribute to the probe's reliability, allowing for accurate measurements with a pointing accuracy of +/- 0.10 mm. The advanced materials used in construction, such as beryllium copper for the plunger and brass with gold plating for the barrel, enhance the durability and functionality of the probe.
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Product
Basic Contact Probes (138 Mil) F77317B230G100
1145913
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The Basic Contact Probes (138 mil) F77317B230G100 are engineered for high-performance applications requiring precision and reliability. With a pitch of 3.50 mm and a temperature tolerance ranging from -45°C to +80°C, these probes are versatile in various environments. Ideal for electronic testing, the continuous current capacity of 10.00 A ensures they can handle demanding tasks without compromising efficiency.
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Product
Adapter/Stainless Steel
WADP-24MSM
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Switch Probes (Normally Open (NO)) F88617B400G120SM
1006140
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The Switch Probes (Normally Open, NO) F88617B400G120SM is a highly specialized contact probe designed for precision applications. With a robust temperature range of -45°C to +100°C, these probes are ideal for various electronic testing environments, ensuring reliability and consistent performance. The design features a basic contact style, specifically within the F886-NO family, highlighting its utility in testing scenarios that require accurate and dependable connections.
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Product
Test Probe
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A physical device used to connect electronic test equipment to a specific point on a circuit or device under test.
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Product
Miniature Hammer F56406B400G150
1169824
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The F56406B400G150 Miniature Hammer is an advanced basic contact probe designed for precision applications in electronic testing. This product is engineered to deliver reliable performance with a continuous current capacity of 7.00 A and a typical contact resistance of only 35.00 mOhm, making it ideal for demanding electrical specifications. The design incorporates a specialized beryllium copper plunger, which is gold-plated for enhanced conductivity and resistance to corrosion, ensuring longevity and effective operation in various testing environments.
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Product
PXIe-2514, 7-Channel, 40 A PXI Signal Insertion Switch Module
780587-14
Signal Module
PXIe, 7-Channel, 40 A PXI Signal Insertion Switch Module—The PXIe‑2514 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2514 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).
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Product
Push Back Probes (VF3) VF305B190G10
1011471
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The Push Back Probes (VF3) VF305B190G10 is specifically designed for high precision applications, making it a critical component in a wide range of electronic testing and prototyping requirements. With a defined pitch of 3.00 mm and a temperature range of -45°C to +100°C, this basic contact probe ensures reliable performance even in extreme conditions, providing exceptional electrical and mechanical stability. The product features an advanced design that minimizes contact resistance to a typical value of just 30 mOhm, allowing for efficient transference of current up to 8.00 A.
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Product
Basic Contact Probes (100 Mil) F10014S130L400
1057662
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The Basic Contact Probes (100 mil) F10014S130L400 is a highly precise measuring instrument designed for rigorous applications. This product, with the order code 1057662, boasts a robust design tailored for exceptional reliability and performance. Engineered to operate within a temperature range of -45°C to +80°C, it ensures great adaptability in varying environmental conditions. Each probe features a pitch of 2.54 mm (100 mil) that allows for accurate measurements crucial in electronic testing and diagnostics.
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Product
Coaxial Probe HF66HSCm016G540MSMPmF
1024462
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The HF66HSCm016G540MSMPmF is a high-performance coaxial probe designed for precise electrical measurements in a variety of applications. With a nominal travel of 1.50 mm and a substantial preload force of 280 cN, this probe can handle demanding conditions while ensuring reliable signal transmission. Operating effectively across a temperature range of -45°C to +100°C, it is built to withstand both extreme cold and heat, making it ideal for challenging environments. This versatility is complemented by its impressive electrical specifications, including a 50 ohm impedance and a frequency capacity of up to 6 GHz, ensuring that it meets the needs of advanced electronic testing applications.
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Product
Electronic Test Instruments
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We offer all types of electronic test equipment for the design, troubleshooting and repair of products and devices. Our handheld, bench, fixed and portable equipment covers virtually every electronic testing application. You can capture measurements, verify performance and conduct analysis with oscilloscopes, spectrum analyzers, decade boxes, bridges and other instruments. With one LCR meter, measure inductance, capacitance and resistance. Our frequency counters and function generators give you professional RF test equipment performance. Manufacturers such as Fluke, Keysight Technologies, Rigol and B&K Precision, provide proven technologies and innovation within our electronic instrument category.
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Product
Electronic Type Universal Testing Machines
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Our list of current Electronic Type Universal Testing Machines products are listed below. If you cannot find what you are looking for, please contact us and we will try our best to help you.
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Product
LCR Meters
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A type of electronic test equipment used to measure the inductance, capacitance, and resistance of an electronic component.
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Product
Step Probes (F732SP) F73211B1056G150SP
1009694
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The Step Probes (F732SP) F73211B1056G150SP are precision-engineered components designed for high-performance applications in various electronic testing environments. With a robust design, these probes operate effectively across a temperature range of -45°C to +100°C, ensuring reliability in challenging conditions. Their exceptional pointing accuracy of ±0.08 mm and a substantial preload force of 60 cN make them ideal for delicate electronic measurements. Each probe is constructed using high-quality materials, featuring a plunger made of beryllium copper and plated with gold, which enhances conductivity and reduces contact resistance to just 20 mOhm. These probes come with optimized dimensions, including a total length of 35.50 mm and a projection height of 10.10 mm. The design ensures minimum space usage while maximizing functionality, with a nominal travel of 4 mm and a maximum travel of 5 mm. The Step Probes boast a powerful spring force of 150 cN, providing the necessary pressure for accurate readings and minimal wear over time. This combination of materials and design underscores the Step Probes’ efficiency and durability, making them a vital tool in both production testing and R&D applications.
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Product
PXIe-2512, 7-Channel, 10 A PXI Signal Insertion Switch Module
780587-12
Signal Module
PXIe, 7-Channel, 10 A PXI Signal Insertion Switch Module—The PXIe‑2512 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2512 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).
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Product
Basic Contact Probes (100 Mil) F77206B150G300
1001621
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The Basic Contact Probes F77206B150G300, with order code 1001621, represent a precision-engineered solution for reliable electrical connections. Designed to operate over a wide temperature range of -45°C to +80°C, these probes are constructed to provide top-tier performance under varying operational conditions. Their unique design, including a pitch of 2.54 mm (100 mil), ensures ease of integration into various applications, making them versatile for use in electronic testing equipment and custom applications requiring robust connections.
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Product
Basic Threaded Probes (F731) F73106B090G150IK03
1000963
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The Basic Threaded Probes (F731), specifically the model F73106B090G150IK03, offer exceptional performance in various applications, featuring a robust design and superior electrical and mechanical specifications. This model is engineered for versatile use in environments requiring precise measurements and reliability under temperature fluctuations, with a temperature range of -45°C to +100°C. The probe's design ensures efficient contact with a pitch of 2.40 mm, making it a vital component in electronic testing and measurement setups.
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Product
Notch Filter/SMA
WFIL-N1737.5-1742.5F
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Clips
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A complete offering of the most desired electrical test clips and electronic test clips including alligator clips, miniature alligator clips, crocodile clips, battery clips, heavy duty clips, general purpose clips, telecom clips, and many more.
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Product
Deci-Center™ Jumpers
Series 112, 113 & 114
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Deci Center Jumpers. Reliable, electronically tested solder connections. Pitch bars help maintain .100 [2.54] conductor spacing. 10-color cable allows for easy identification and tracing.
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Product
Basic Contact Probe F73339B180G300
1005280
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The Basic Contact Probe F73339B180G300 is engineered for high-performance applications requiring reliability and precision. This probe features a robust design with a pitch of 4.00 mm, making it ideal for various electronic testing environments. Its operating temperature range of -45°C to +100°C ensures functionality across diverse conditions, which is essential for both industrial and laboratory settings.
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Product
Push Back Probes (VF4) VF483B0001G20
1005202
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The Push Back Probes (VF4) VF483B0001G20 is a precision-engineered basic contact probe designed to meet the rigorous demands of electronic applications. With a pitch size of 4.00 mm (157 mil), this probe operates in extreme conditions, tolerating temperatures ranging from -45°C to +100°C. Its robust construction guarantees reliability, whether in harsh industrial environments or delicate electronic testing applications.
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Product
Misc. Electronic Instruments
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Electronic components for test and measurement come in all sizes.
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Product
Frequency/Waveform Generator
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Use our function generators to output a variety of signals for demanding applications, whether that involves electronic testing, system troubleshooting, product design or education. We have the generators for accurately characterizing products and system components. A function generator will supply standard output, including ramp, triangle, sine, and square signals with variable frequencies. Models can also provide pulse, noise, and DC waveforms. Arbitrary waveform generators are function generators that allow you to create a custom waveform with optimal versatility. If you need to produce purer signals and pulses with less jitter, Transcat provides the top devices. Our generators with DDS technology deliver more frequency control and stability of output over time. B&K Precision, Sigilent, Keysight Technologies, and Instek lead our selection with high performance, stability, and accuracy.
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Product
Basic Contact Probes (138 Mil) F77305B230G300
1001577
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The Basic Contact Probes (138 mil) F77305B230G300 is meticulously designed to meet stringent technical needs, boasting an impressive range of features that enhance its functionality in various applications. Engineered for precision, this model operates effectively within a temperature range of -45°C to +80°C, making it suitable for diverse environments. With a pitch of 3.50 mm (138 mil), these probes ensure reliable connectivity and performance, ensuring they meet the high standards expected in electronic testing and assembly applications.
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Product
Digital Instruments
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Digital Instruments generate and acquire high-speed digital waveforms for transmitting data, communicating with devices under test, or testing digital interfaces. These instruments are ideal for semiconductor characterization and production, interfacing to LVDS and TTL digital electronics, and testing the functionality of high-speed serial links.
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Product
PXI Signal Insertion Switch Module
Switch Module
PXI Signal Insertion Switch Modules, also known as fault insertion units (FIUs), provide a set of feedthrough channels, which make the switch transparent to the system when closed. You can open or short these channels to one of two fault buses, allowing you to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI Signal Insertion Switch Module can validate the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs). You can also use the FIU models for hardware-in-the-loop (HIL) applications and electronic reliability tests.
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Product
1KVA 3KVA 5KVA Digital AC Power Source
RK5001
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Shenzhen Chuangxin Instruments Co., Ltd.
The AC Power Source is widely used in home appliance manufacturing, electrical and electronic manufacturing industry, IT industry and computer equipment etc. manufacturing industries and Laboratories and electronic products testing organization.
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Product
Spring Probes
Spring Probe
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
