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Secondary Injection Test
Low voltage signal injected to test circuit breaker operation.
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Secondary Injection Test Set
PTE-100-C Plus
In the Pro version this voltage source incorporates a dedicated LCD display and its own BUS-PTE connection that make the operation easier and enable it to be used also with other sets in the PTE range.
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Secondary Injection Test Sets
KINGSINE Electric Automation Co., Ltd.
K30 series relay tester is extremely design for overseas user, with Friendly PC software as your need, unique features and functions helps you all the way!
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Secondary Injection Relay Test Set
T 1000 PLUS
T1000 PLUS is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment.
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Single Phase Secondary Injection Test Set
T200A
T200A Single Phase Relay Testing Kit is the best universal secondary injection test set for engineers who need to do all single phase relay test and other basic primary testing which may require single phase long-term high current injection.
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Secondary Current Injection Test Sets
Our range of units covers applications up to 200A and includes single phase and three phase units with applications for testing and timing of IDMT relays, thermal overloads, MCB’s and auto-reclosers.
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Secondary Injection Relay Test Set
TD 1000 PLUS
TD1000+ is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment. In comparison with T 1000 PLUS model, TD 1000 PLUS has two current outputs to test the differential relay characteristic curve, besides the pick-up current.
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Secondary Injection Test Set
PTE-100-C
The PTE-100-C is a portable Universal test equipment for testing electromechanical, electronic, and digital relays. The equipment can output a variable current up to 250A, a variable AC Voltage up to 250V, a variable DC Voltage up to 350V. Also the unit incorporates a variable stabilized auxiliary DC Voltage supply up to 250V and a fixed AC Voltage output up to 110V, which can be variable with the PTE-FCF option.
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Three Phase Secondary Current Injection Test Set
TEST-330B
Beijing GFUVE Electronics Co.,Ltd.
Three phase secondary current injection test set is testing relay set, protective device, instruments, output ac dc current and voltage source, embedded Window XP system.
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Three-Phase Relay Protection Tester
GDJB-PC
Chongqing Gold Mechanical & Electrical Equipment Co.,Ltd
1.GDJB-PC Universal Secondary Injection Relay Test Set is applied to test the relay unit in relay protection system. 2.At the same time GDJB-PC Universal Secondary Injection Relay Test Set could be considered as a universal three phase AC/DC voltage source or current source. 3.It can work alone or connected to computer, inside the relay controller there are new speed digital signal mini PC and real DAC (Digital-to-Analog Converter) template with new high fidelity and high power, the machine has large panel screen and rotating mouse. It is small in volume, high precision.
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Secondary Current Injection Test Trolley
SCR ELEKTRONIKS have developed SECONDARY CURRENT INJECTION TEST TROLLEY for Switchgear items, CT manufacturer and where three phase current application is called for. It is low Voltage, 3 phase Current source with control circuitry, digital read out for test current and trip time measurement. We can select different CT ranges for each phase independently and adjust the current as per the required test Current.
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Secondary Injection Test Set
PTE-100-C Pro
The values which are presented in the LCD display are highly accurate, easy to read, and independent of the injection made by the PTE-100-C base unit.The display shows continuously the phase difference between the voltage and the current injected, and can be adjusted during the test with an accuracy of 0.1º. This facilitates the test for directional relays or reclosers and synchronizing relays, etc.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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ADAS Test
Advanced driver assistance systems (ADAS) are introducing new technology into vehicles. They demand test systems that are adaptable and future-proof, so they can integrate all the technology used today and be ready for whatever tomorrow brings.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Communication Test System
CTS-2700
The CTS-2700 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
