Ramp Test Sets
airborne avionic and communication test equipment used on the tarmac.
See Also: Flightline, NAV/COMM
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Test Sets
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A set of examples used only to assess the performance of a specified classifier on unseen data.
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True Concurrent Test
TestStation Duo
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The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Test Set Solutions
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This product category contains specialized low-PIM filter-based offerings for 3GPP/4G/5G LTE test sets and broadband emissions monitoring.
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Test Sets For Transformer Industries
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Contemporary Test Sets For Transformer Industries are developed to recognize the potentially disastrous current transformer errors. They prevent the primary current from overpowering insulation and short circuits. They are used for developing a testing and maintenance plan for addressing the errors before any failure to save money and time. With these powerful test sets, they are sure to perform saturation testing to test the knee point of a signal by comparing primary and secondary windings.
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Test Fixtures & Test Sets
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Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Test Set For Instrument Transformer
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This modern Test Set For Instrument Transformer is used for measuring relative errors of Instrument Voltage and Current Transformers. This is developed for reading out the unbalance of any bridge circuit. It also calculates the burden associated to the test sample. In addition to this, it further converts it to ratio and phase error values for presenting them on a LCD screen. With high-tech microprocessor controller, it ensures to provide quick and correct measurements.
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Loss Test Set, Return Loss Test Set
LTS1315, LTS1315R
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The KD Optics LTS1315 is a combined mains / battery powered laser source and power meter designed to make attenuation testing in the field easy, reliable and most importantly, consistent. The LTS1315R incorporates return loss measurement (RLM) capability with the ability to switch very easily between dBrel and return loss.
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Optical Signal Test Set
OST
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The Optical Signal Test Set (OSTS) combines a state of the art optical power meter, a variable attenuator, and a high stability laser source. The unit is able to measure optical signals below -100dBm with 0.001dB resolution at a fraction of the size, power, and cost of competing solutions. Other features include data logging, programmable filtering, and auto calibration. Its small shielded ruggedized package, USB/power interface, and low cost make this unit perfect for lab use or for integration into larger systems.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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In-Line RF Test Platform
AR925
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This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
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The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Phantom Load Test Set
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Is a testing accessory, wisely designed for field testing service. This equipment helps in providing artificial load that is unaltered by the change in power supply.
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Multifunction Substation Test Set
STS 4000
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STS 4000 is a multifunction substation maintenance & commissioning test system for current, voltage and power transformers, designed to perform primary tests requested in substations commissioning. It allows to perform accurate tests on CTs, VTs, PTs and ground grid.
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Communication Test Set
Eye-BERT 100G
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The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Universal Test Set
UTS
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The Universal Test Set (UTS) is a portable, battery-powered, programmable, ruggedized radio frequency test set designed to validate improvised explosive device (IED) jamming equipment. Our unit is intended to provide an in-field confidence testing for warfighters employing IED jammers prior to departure.
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TDR Test Set
TS® 54
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Fluke Networks’ new TS52 PRO Test Set features the latest in test set technology. Designed with a superior, radiant liquid crystal display (LCD) user interface, it allows you to see what cannot be heard in any outside plant environment.
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SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
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The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Advanced SoC Test System
3680
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The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Radar Altimeter Test Set
Core Technology
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Eastern OptX core technology enables the conversion of microwave signals to optical signals (E/O), time delaying this signal then reconverting the light back to original microwave signal (O/E) with superior fidelity over traditional time delay methods. Products include Radar Target Simulation, Radar Altimeter Testing, Channel Simulation (Air Interface) and Multipath Creation.
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FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Portable, Integrated O-Level Test Platform
Guardian™
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Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Telcom Test Sets
T62 Recon
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The RECON is the first true 21st century telecommunication line analyzer setting a new standard for POTS butt sets. It is a field instrument that delivers more information of online conditions & status than any other test set on the market, anywhere in the world!!
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35kV 3 Collector Test Set
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Polarity designs and manufactures the most reliable Microwave Tube Test Sets in the industry. Polarity understands the delicate structure of microwave tube devices and has built an extensive product line supporting the manufacturing process. Polarity designed and developed this Microwave Tube Test Set with the following specifications:
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Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Pil Dielectric Test Sets
DTS Series
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The DTS Series provides repeatable and accurate measurements of the breakdown voltage of insulating oils used in electrical equipment. The DTS-60D & DTS-100D offer 60 kV AC and 100 kV AC output respectively. They include three user-selectable, automatic voltage rates-of-rise, and automatic voltage shutdown with the meter indicating the flashover voltage. Various test cells are available.
