Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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CS/ONH-Analysis
G4 PHOENIX DH
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The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Product
Impact Analysis
MetaDex™
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Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Surface Analysis
Dimension FastScan Bio
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The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Sustainability Analysis
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ETAP's Sustainability Analysis module estimates the carbon footprint of electrical networks by tracking electricity generation from sources and consumption across network elements, such as loads and distribution systems, over time. The tool utilizes region-specific, time-varying emission factors from a dataset covering 172 balancing authorities worldwide, providing critical insights to improve accessibility. Custom values can also be entered to ensure flexibility in regions where data is unavailable.
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Biomolecule Analysis Tools
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In gene therapy and vaccine products, ensuring purity during downstream processing is especially challenging. Fast and efficient tracking of target biomolecules and removal of impurities is critical, because it directly affects product yield and purity. Sartorius‘ analytical chromatography column solutions can help provide this information in real-time, through at-line monitoring of large biomolecules including viruses, pDNA, and mRNA.
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Multi-omics Analysis Package
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The Multi-omics Analysis Package, developed for metabolic engineering applications, provides the ability to automatically generate metabolic maps and perform a variety of data analysis for the vast data generated in fields like metabolomics, proteomics and flux analysis. It offers a powerful platform to support drug discovery, bioengineering and other life science research applications.
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Powertrain Analysis System
KiBox2
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With the KiBox2 analysis system, you have all the data related to vehicle powertrains under control.
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Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
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Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Product
PLTS N-Port Measurement And Analysis
N19307B
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PLTS N19307B extends the N19301B base product to perform N-port (greater than 4 ports) measurements and analysis
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Live Cell Imaging And Analysis
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The Incucyte Live-Cell Analysis system is designed to efficiently capture cellular changes where they happen - in the incubator. Capture high-resolution fluorescence and bright field images and record data in real time over hours, days or weeks. From proliferation assays to immune killing of tumor spheroids, this flexible system enables users to observe and quantify complex biological changes in real time. Integrated software simplifies data analysis to speed time to answer while producing publication-quality graphs and plots.
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Product
System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Mercury Porosimetry Analysis
AutoPore V
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The AutoPore V Series Mercury Porosimeters can determine a broader pore size distribution more quickly and accurately than other methods. This instrument also features enhanced safety features and offers new data reduction and reporting characteristics of your material.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Quantitative Analysis Program
AutoQuant Pro
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AutoQuant Pro is a powerful new automated, multi-component, quantitative analysis program for analyzing gas phase mixtures in real time. The program provides a comfortable user interface for operating a MIDAC FTIR analyzer, defining analytical methods for computing concentrations of compounds, displaying and outputting results, and automating data collection for multiple sample stream installations.
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Product
04 With Soldering Eyelets | 4 Wafers | 24 Positions
04-4xx3-00/30-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Sensor Placement & FEA Analysis
GageMap - GM
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APEX Turbine Testing Technologies
Apply strain gages and accelerometers to your finite elementmodel independent of the mesh anywhere you want, or letGagemap do it for you.
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Cross-Section Analysis Laboratory
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PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Headspace Gas Analysis
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The headspace gas analyzer adopts a professional structure design and is equipped with a high-precision sensor, which can accurately and conveniently determine the content and mixing ratio of O2 and CO2 in hollow packaging containers such as sealed packaging bags, bottles and cans. The equipment is used for headspace gas analysis and detection of various sealed packaging bags, packaging containers, vials, ampoules and other products.
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Transformer Oil Gas Analysis
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It is necessary to analyze outgas in transformer insulation oil in power plant facilities. Shimadzu offers a System GC compliant with ASTM D 3612 Method B (oil stripper sampling) or ASTM D 3612 Method C (headspace sampling). The Nexis GC-2030TOGAS3 system, equipped with a PDHID, enables the analysis of more trace amounts of permanent gas than conventional systems.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Wi-Fi Spectrum Analysis
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The Spectrum Bundle is your ultimate tool for mastering spectrum analysis. Gain real-time visibility into your 2.4 GHz, 5 GHz, and 6 GHz (Wi-Fi 7) networks, pinpoint interference sources, monitor channel saturation, and detect even the most elusive intermittent issues. With professional-grade tools for analysis and reporting, you’ll have everything you need to optimize network performance and ensure reliable coverage.
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Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Gas Analysis
HPR-20 DLS
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The Hiden HPR-20 DLS gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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On-line FT-NIR Analysis
MATRIX-F
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The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Multi-Track Spectral Analysis
FreqAnalyst Multi
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FreqAnalyst Multi is a unique multiple tracks real time spectrum analyzer: it lets you visualize the spectral content of several audio tracks on the same screen with extreme smoothness and high resolution for both time and frequency. It is the ideal solution for mixing: you can use it as a frequency overlap detector and actually see which part of the spectrum every single instrument uses.
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04 With Soldering Eyelets | 3 Wafers | 24 Positions
04-3xx3-00/30-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Manual Media Analysis Solutions
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Truly one tool to view them all. The Ultimate Analyzing Tool for manual in-depth analysis, verification and validation of various file formats and containers. Metadata extraction and stream manipulation available.
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Multi-Track Stereo Analysis Tool
StereoScope Multi
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This plug-in is based on the same stereo analysis algorithms as Blue Cat's StereoScope Pro analysis plug-in, and the instant, peak or average responses of several audio tracks can be displayed on the same graph (the plug-in supports up to 16 curves).
