Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Signal Analysis
Super-Resolution Spectrum
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Super-resolution Spectrum is used for spectral signal analysis with high frequency resolution. The program is used in diagnostics and monitoring systems of buildings and for analyzing non-stationary signals. The Software enables solving the following tasks:
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Product
CS/ONH-Analysis
G8 GALILEO
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All state-of-the-art detectors used in the G8 GALILEO are equipped with internal reference channels for utmost stability and allow detection limits in a sub-ppm range (based on 1g sample mass)
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Product
Impact Analysis
MetaDex™
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Allows you to instantly see the impact of any changing data object or application on all downstream objects and applications.
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Product
Enable Non-Invasive Analysis
Sparklike Handheld™
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Sparklike Handheld™ is practical and quick method to test IG gas concentration. Technology is based on plasma emission spectroscopy. A high voltage spark is launched in the IG unit's cavity causing a light emission which is observed and analyzed further.
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Product
Signal Analysis
CPB (Constant Percentage Bandwidth) Analysis
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The program is used for transfer fractional octave (1/1, 1/3, 1/12, and 1/24 octave) spectral analysis of signals coming from the input channels of FFT spectrum analyzers (in real time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Product
Fast Timing Analysis
Zero-Time Box
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The Zero-Time Box is designed to compare the start times of source units with the recording system. It is compatible with every source encoder that outputs a start signal on a BNC connector, and also supports every source controller and decoder that does the same. The Zero-Time Box can also be used as a 5 channel precision measurer of timing intervals.
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Bioacoustic Analysis and Experimentation
SIGNALtm
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Is the recognized standard in bioacoustic analysis for accuracy, flexibility, mathematical power and automation.
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Product
Chemical Analysis
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Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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Material Analysis Laboratory
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Trialon’s world class Material Analysis Laboratory consists of state-of-the-art equipment and experienced staff. Our specialty is to determine failure analysis of design, material, process and root cause in both current and future products across multiple industries.
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Product
Solder Paste Analysis
SPA1000
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The SPA 1000 also introduces new process control capability by accurately measuring the suitability of the solder paste prior to its implementation on the production line. It achieves this by determining the "Open-Time" for the paste. It also performs the Slump Test and both of these methods provide a "Go/No Go" answer in less than 30 minutes to ensure minimum delay for the production line.
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Product
On-line FT-NIR Analysis
MATRIX-F
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The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Product
Wafer and Cells PL System
HS-PL
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Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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Product
Communication Analysis System
ACQUA
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ACQUA is a dual channel analysis system for diagnosis of acoustic and/or electric transmission paths up to 24 kHz. By means of predefined modifiable measurement descriptors measurement data can be gathered and evaluated in a simple and quick manner. All telecom specific analyses comply with the international standards of ETSI, ITU, TIA, 3GPP, GCF, PTCRB, DECT Forum, GSMA, CTIA.
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Data Analysis
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Power Monitoring and Diagnostic Technology Ltd.
PMDT Engineers are always available to review your test samples and to provide guidance to users in the field. Our PD experts have the ability to accurately analyze various types of field test data based on PRPD/PRPS spectrums, waveforms and audio files collected during a field test.
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Failure Analyziz and Quality Assurance
NX20
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There's no room for error in the data provided by your instruments. Park NX20, with its reputation as the world's most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
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Product
Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Product
Wafer Internal Inspection System
INSPECTRA® IR Series
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An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Product
Water Sodium Analysis
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The Navigator 500 Sodium analyzer provides a continuous measurement of the sodium ion concentration in demineralization plants and in the steam / water cycle of steam-raising plants.
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Gas Analysis
HPR-20 DLS
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The Hiden HPR-20 DLS gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Product
Rotating Machinery Analysis
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The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Gas Analysis
Si-CA 030
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The Si-CA 030 offers everything heating engineers need to inspect and maintain residential and commercial boilers, with wireless connection to our smartphone app and automatic generation of servicing reports and certificates.
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Power Analysis Software
PAS
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PAS is SATEC's comprehensive analysis and engineering software designed to program and monitor all SATEC devices. It includes a variety of additional tools to assist in system setup, such as the communication debugging module.
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Product
Standard Parameters for Analysis
C-Cell Mono
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C-Cell Mono is the original system and comes with the standard parameters for analysis. C-Cell Mono takes 1 image of the sample to produce analytical results such as crust wall thickness, size, shape and location. C-Cell Mono is the entry level model of the C-Cell range and offers all the basic image analysis needs for a baker.
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Data Acquisition & Analysis
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Avionics Interface Technologies
We provide fully integrated avionics data bus and high speed network analyzer and data acquisition systems. Combining our extensive product catalog of Avionics interface modules, and our easy to use Analyzer software applications, with our Engineering Expertise, we are able to satisfy a wide range of avionics network data capture and analysis requirements with our COTS products or with customized solutions.
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Product
WAFER MVM-SEM® E3300 Series
E3310
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The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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C/C++ Source Code Analysis
CODECHECK
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CodeCheck is a programmable tool for checking all C and C++ source code on a file or project basis. CodeCheck is input compatible with all variants of Standard K&R C, Standard ANSI-C/C++, and all C and C++ compiler vendors. We support GCC-GNU Open Source C/C++ compilers. CodeCheck is designed to solve all of your Portability, Maintainability, Complexity, Reusability, Quality Assurance, Style Analysis, Library/Class Management, Code Review, Software Metric, Standards Adherence, and C++ Corporate Compliance Problems.
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Data Reporting and Analysis Software
TRACS
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TRACS (Trending-Reporting-Analysis-Capture-Software) is a graphical reporting software tool, which runs over a network and captures data from connected machines for analysis and reporting from a remote computer. Developed in partnership with AutoCoding Systems, TRACS displays live and historical batch data for all production runs and is designed to work with LOMA’s Metal Detectors, Checkweighing, X-ray Inspection and Combination Systems.
