Automated X-ray Inspection
See Also: AXI
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Automated Pressure Calibration System
4322
The Fluke Calibration 4322 Automated Pressure Calibration System enables almost any user to calibrate almost any pressure gauge, transducer, transmitter or switch, including vacuum, compound, absolute and high-pressure devices. It provides high-end, laboratory-grade performance across a very wide range, on the bench or in situ.
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Real-time X-ray Inspection Systems
Ultra-Compact™
Glenbrook Technologies redefines X-ray Inspection with our smallest JewelBox Micro focus x-ray system yet. With dimensions of just 22”W x 26”L, it’s small enough to fit on a standard desk, in an office or small lab. But it’s big in capabilities with >500x magnification , 5 axis manipulator and advanced image processing. To view our product video, please click below the product image to the right.
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1RU Automated Switch Unit
UC1
Universal Switching Corporation
The UC1 switch system provides a modular solution for a variety of signals up to 50GHz, and is designed for smaller requirements. This product delivers ultra-high signal performance coupled with advanced remote/manual control and monitoring with 10/100 LXI certified Ethernet port, multi-serial port, front panel control, direct alarm input port, and auto-sense (on some PUC's).
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Security Policy Change Automation
FireFlow
Confidently automate your security policy change process - from planning through risk analysis, implementation and validation.
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Wafer Internal Inspection System
INSPECTRA® IR Series
An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Video Inspection
MacroZoom
Our MacroZoom Video Inspection packages are useful is countless industries. MacroZoom solves the problems that customers have with traditional microscopes, by offering an unlimited working distance, as well as field of view, and hugely generous 1-80x magnification range.
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Real-time X-ray Inspection Systems
JewelBox Series
JewelBox x-ray inspection systems feature ultra-high resolution, powerful microfocus x-ray tubes, five-axis, and positioners. The JewelBox Series is divided into three broad categories: JewelBox 70-T, JewelBox 90-T and Ultra Compact each of which can be customized for specific applications.
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Industrial CT- And X-Ray Solutions
To examine things, to get to the bottom of them, to get to their core – this desire has always driven science, research, and development. X-ray technology from ZEISS has provided perfect insights for years in these and other areas. When it comes to quality and process control, it reveals what would otherwise remain hidden from even the most watchful of eyes – without destroying the part.
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Industrial Automation Solutions
LXinstruments FCT systems for industrial electronics assemblies are particularly suited for applications with a large variant diversity for medium volume sizes. They are used for testing utility electronics as well as for drive control and grid management systems. We have also implemented systems for functional test, repair and calibration of decentralized PLC I/O assemblies.Since early failures in the field often lead to enormous costs, we not only provide functional test systems, but also burn-in systems for simultaneous testing of many assemblies in a climate chamber. Due to the modular structure of our software, it is possible to establish a logical separation between the definition of the climatic profile to be executed and the actual test sequence, during which the different electrical tests are processed. Connections to HALT/HASS systems can also be established without problems.
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Optical Inspection
3D AOI
In contemporary electronics manufacturing, automatic optical inspection (3D AOI) is an established component of quality control. A company purchasing a 3D AOI system wants to ensure that it is manufacturing its electronic products in the very best quality and can guarantee they will have a long service life. The Viscom systems feature superlative 3D and software attributes to deliver excellent measurement accuracy and exceptional image quality. Our 3D AOI systems are designed for simple programming and can also be flexibly adapted to new requirements, allowing them to easily accommodate fast product changeovers as well as large production quantities.
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Test Automation System for Driveline Testing
STARS Driveline
STARS Driveline is an integrated automation, acquisition and control system that provides a broad range of application functionality in a single, powerful environment. It has been designed to fulfil the specialist requirements and applications for driveline testing from simple modal testing on two or four wheel drive systems, to RLS simulation or advanced applications such as service load replication (SLR).
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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X-Ray Inspection
MXI Jade Plus
Restrictions in manufacturing materials and ever increasing expectations for reliability mean ensuring quality product manufacture is more important than ever. Jade Plus enables you to Prove Your Quality and reduce product returns from the field, and the associated cost and damage to reputation.
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Laser Sherography NDT Sensor for Post-Production Quality Control or In-Field Component Inspections
FlawExplorer
The FlawExplorer is a laser shearography NDT sensor designed to be used for post-production quality control applications or in-field (in-service) component inspections. Depending on the application, the sensor can be configured with thermal or vacuum (partial) excitation systems and may also be automated. It incorporates the very latest in phase-shifting technology delivering accurate and reliable measurement results through clear and sharp imaging with sub-micrometer displacement resolution.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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3D Inspection Software
Metrolog X4
Metrolog X4 architecture is designed not only to benefit from current computer and OS technologies (Windows 64-bit, and multiprocessor PCs) that significantly increase the performances and throughput of your Metrology software, but is also aimed at simplifying your day-to-day measurement work. Metrolog X4 is a perfect Point Cloud software able to analyze large data size. High Performances in Point Cloud analysis: Large Data file import (CAD files, Point clouds, ...)
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Semiconductor Package Inspection System
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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Baggage and Parcel Inspection
Inspection of bags and parcels has to be effective, efficient, and meet the toughest regulatory requirements. Rapiscan® Systems products deliver on both levels.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Distribution Automation
Schweitzer Engineering Laboratories, Inc.
Scalable and modular distribution automation solutions help increase system operational efficiency and reduce operating costs.
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Turnkey NDT Corrosion Inspection Services
Robot-enabled ultrasonic inspection that produces thickness grid maps to identify areas where corrosion and other damage mechanisms have caused wall-thinning.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Automation
Signal Filtration
Signal Filtration is used for filtering signals coming to the input channels of spectrum analyzers, strain-gauge stations, and seismic stations, for further processing by ZETLAB programs. Signal Filtration can also be used for processing virtual channels created by such programs as Vibration Meter, Strain-Gauge Sensor, etc. Signal Filtration operates with signals both in real time and with reproduced of recorded signals.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Sensor for Filament Inspection
EyeFI
EVT presents the EyeFI - the sensor for the inspection of filaments. The sensor contains two cameras with an Aptina sensor and S-Mount lenses. The cameras are perpendicular to each other. It is therefore possible to inspect two sides of the filament, which means that the EyeFI can detect if the filament is out-of-roundness. Additionally the errors and defects can be detected. For example the occurring flaws are point-shaped or partly flaked, or point-shaped and transverse, or also looking like a longitudial rib, or only spots in different shapes. The defects can be detected with the EyeFI sensor. The EyeFI contains board cameras with sensors from Aptina, the IoCap and an evaluation processor. The housing is about 14x10x4 cm in size. The IoCap is the image-capture-IO-board, which is designed and developped by EVT.
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Infrastructure Automation & Compliance At Enterprise Scale
puppet
Puppet enables you to deploy and manage infrastructure with confidence.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
