Automated X-ray Inspection
See Also: AXI
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Product
Automatic and Accurate Inspecting Systems
Circuit AOI
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The Circuit AOI system is designed to perform automatic and accurate inspecting systems. It integrates rigid mechanical system with advanced vision technology and manufactured and tested by strict is standards. It is suitable for circuit inspection for PCB/FPC, verification and repair. Innovation and unique inspection algorithms are applied to inspect open, short, protrusion, nick, scratch, pin hole, island, line width/space violation, object missing and others defects. AOI system can use offline setup project and check results. It will improve the throughput.Compare to halogen lighting, the full angle LED lighting of Circuit AOI can obtain the best image contrast and is good for different panel type inspection.
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X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Automated Connector Tester
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GCI's Automated Connector Tester is a self-contained test bench providing reliable testing of filtered and non-filtered electrical connectors. The ACT automates the tedious process of testing each pin against all others and shell for DC and AC leakage. For filter connectors, the ACT accurately measures pin-to-shell capacitance. For pins protected by diodes, the ACT provides leakage and breakdown measurements. The ACT also verifies pins which are intentionally shorted to each other or to the shell.
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Ultrasound Inspection
ULTRAPROBE 10,000
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The Ultraprobe 10,000 brings Ultrasound Inspection technology to a whole new level. With this one system, inspectors can perform condition analysis, record sounds, store and manage data.
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Solid-State Battery Test Cell For X-Ray & CT Analysis
SBT1
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Solid-state battery test cell designed for X-ray imaging, CT analysis, and electrochemical testing, featuring an X-ray-transparent structure for advanced battery materials characterization.
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High Speed Solder Paste Inspection
VisionPro HSi
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The VisionPro HSi offers high speed solder paste inspection. Utilizing the most advanced high resolution staging and sensor technologies, the VisionPro HSi provides the accuracy and reliability needed to compliment your overall screen print process improvement strategy.
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Medical And Dental X-Ray
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Teledyne DALSA offers powerful, innovative CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for applications such as orthopedic and surgical radiology, mammography, intra- and extra-oral dental radiology, CT, and bone densitometry
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Automated Hipot Accessory Device
CX-K12
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Shenzhen Chuangxin Instruments Co., Ltd.
Purpose, To test thin insulating materials for dielectric voltage withstand strength when connected to a hipot tester.
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Product
Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Codeless Test Automation
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Run automated end-to-end test scenarios directly on a Smart TV, set-top box or Xbox. Works with any retail infrared based device. Suitest can utilize devices located anywhere in the world for interactive sessions or automated parallel test execution. Enjoy test automation with our state-of-the-art visual test editor. Utilize JavaScript snippets for complex automation scenarios.
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Industrial Automation
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Industrial automation involves integrating Data Acquisition and control logic with various third-party components, devices, and sensors. Bringing together this broad mix of technologies, and integrating them into a final solution requires Mechanical, Electrical, and Software Engineers, and a common technology platform to ensure all system components work cohesively. Leveraging the LabVIEW, PXI, and CompactRIO, platforms we can solve extremely complex industrial automation challenges and deliver success for our customers that could not otherwise be achieved.
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Automated Memory Analyzer
Volatility
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Volatility has become the world’s most widely used memory forensics platform. The project is supported by one of the largest and most active communities in the forensics industry. Volatility also provides a unique platform that enables cutting edge research to be immediately transitioned into the hands of digital investigators. As a result, research built on top of Volatility has appeared at the top academic conferences and Volatility has been used on some of the most critical investigations of the past decade. It has become an indispensible digital investigation tool relied upon by law enforcement, military, academia, and commercial investigators throughout the world.
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Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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X-Ray Inspection System
TruView™ Cube
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The Perfect Solution for a Powerful Small Form Factor X-ray Inspection System. The all new TruView™ Cube X-Ray Inspection System is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. Ideal for applications where space is premium, the the TruView™ Cube X-Ray sits comfortably on your laboratory bench.
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Robotic 2D & 3D Vision Inspection
EyeT+Inspect
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EyeT+Inspect is the outstanding 3D device for robotic visual inspection combining robust 3D vision to inspect product shape with fast 2D vision to inspect product surface. EyeT+Inspect optimizes production thanks to automatic and objective removal of defective products from the production line.
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X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
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XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
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Product
Universal Automated Programming System
4900
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The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Automation Solutions
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We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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Appearance Inspection
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We perform quality assurance agency of customers' important products through inspection.
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Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Automated Earthquake Processor
SMARTQuake®
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Local/distant event discrimination. Event location andmagnitude determination. Moment Tensor Inversion. Source parameters determination. Email notification
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Test Automation Framework
softTAF
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SoftTAF is Softdel’s test automation framework for testing your embedded systems products. SoftTAF provides automated test coverage with no manual intervention required. SoftTAF was developed to use fewer resources and requires less time compared to manual testing.
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X-ray CT System
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The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
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Automatic Flight Inspection System
AT-930DG
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Fully Automatic OperationAll-Weather CapabilityDifferential GPS Position ReferenceHigh Accuracy and Maximum ReliabilityWindows User Interface SoftwareEasy to Operate and Easy to LearnMinimum Maintenance RequirementsModular System ArchitectureLong-Term Supportability
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In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Magnetic Particle Inspection
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Magnetic Particle InspectionMagnaflux Magnetic Particles are used for magnetic particle inspection method in the detection of SURFACE and SUBSURFACE indications in FERROUS materials.
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Automated Headlight Tester
VLT 0936/MK2
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Fully computerized controlled CCD Head-light Beam Tester, with fully automated vertical and horizontal movements, with automated searching of the hot spot of the beam. This robot type Headlight Beam Tester is connected to the Vehicle Test Lane Computer system and displays instructions and results to one of the large overhead SVGA monitors of the Test Lane.
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Non-Destructive Test Resonant Inspection System
RAM-AUTO
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Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition.
