Broadband Test
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Broadband Test
458-3SLB
This compact, versatile unit accepts 1, 2 or 3 line modules or other products that use Telebyte's convenient line module form factor. At home in the lab or a high-volume production environment, it is capable of controlling from 1 - 24 channels and is ideal for testing DSL modems and other bandwidth-compliant telecom devices. While it can be used as a stand-alone unit, the built-in Control Module interfaces with a PC via RS-232, IEEE-488, or Ethernet. In addition, the 458 Universal GUI (included with purchase) may be used to control the unit from a PC. For added convenience, the Control Module firmware is field-upgradeable through the RS-232 port.
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Active biconical Antennas
BicoLOG X Series
Only a single broadband test antenna for the complete frequency range from 20MHz up to 3GHz. Optimal for usage with spectrum analysers for EMC measurement. Active Antennas with high gain up to 41dBi.
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Serializer/Deserializers & Selector Muxes
Serializer/Deserializer muxes use both rising and falling edges of the clock to serialize the data from parallel inputs to serial output while demuxes deserialize the data from its serial input to parallel outputs. Selector muxes routes the differential inputs to either one or more of the desired outputs upon assertion of the appropriately selected port. Muxes can be used in various applications including High Data Rate Ethernet, Fiber Communication, Signal Routing and Broadband Test & Measurement Equipment.
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Broadband Network Test
Whether testing via Voice Switch, DSLAM, OLT or external access device, Enghouse LoopCare comprehensively manages testing in mixed technology networks.
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2.0 ~ 68.0 Gb/s Pulse Pattern Generator
CA9809
The UC INSTRUEMNTS CA9809 2.0 ~ 68.0 Gb/s Pulse Pattern Generator pulse pattern generator and error detector is a high performance, flexible and costeffective broad band data rate covered Pulse Pattern Generator that can operate from 2.0 Gb/s to 68 Gb/s. The CA9809 can be used with existing equipment to generate higher rate bit streams for use in telecom applications up to 68 Gb/s. Broadband test systems will benefit from the low power dissipation, precision connectors, and excellent output waveform characteristics. The compact size of the equipment allows the CA9809 to be placed at the measurement plane, reducing or eliminating artifacts related to long cables.
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Clock Generation Devices
Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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Impedance Matching Pads
Surface mount and coaxial 50 Ohm / 75 Ohm impedance matching pads for CATV systems, broadband networks, test setups and more!
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Microwave Power Amplifier 10W 100 MHz to 20 GHz
GT-1000B
The Spanawave GT-1000B Microwave Power Amplifier offers linear high-power amplification across multi-octave bands. It is ideal for testing in EMC, wireless communications applications and Defense EW systems. For EMI/EMC and standards laboratories, the GT-1000B with 100 MHz to 20 GHz frequency range allows broadband testing without band switching or swapping narrow band amplifiers resulting in faster and more accurate testing.
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RF And Microwave Modules
Unlike specialized RF and microwave module product suppliers, Shengbo Technology has accumulated rich experience in designing and developing broadband microwave test products. As a sophisticated RF and microwave test system, a large number of high-performance RF and microwave modules are required for system integration. To this end, we have conducted in-depth research.
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DSL/Gfast Test Software
Test Sentinel is a full suite of automated DSL and Gfast tools that allow a user to easily perform experiments and run standardized testing. This is the same set of tools used in our DSL and Gfast Testing Services to perform a wide variety of requests including Broadband Forum standardized tests and the Broadband Forum Gfast Certification.
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TEM Cells
Transverse Electro Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz., EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Test Fixture
N1295A
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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In-Circuit Test
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
