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Ionic Contamination Test System
Omegameter SMD 650
The SCS Omegameter SMD 650, the long-time industry standard for ionic testing utilizing “static test” methodology, is designed to perform cleanliness testing on printed circuits and assemblies. Identifies the presence of ionic contamination on bare and assembled printed circuit boards and other electronic components. Provides an accurate and repeatable method for determining cleanliness on site. Provides immediate process control results, eliminating the need for outside laboratory testing.
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Automatic Transformer Test System
TH2840NX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Battery Testing System
C8000
The Cadex C8000 stands in a class by itself in flexibility and affordable price. Test SMBus batteries, monitor cell balance and capture load signatures to observe batteries with a unique load protocol. Add a thermal chamber, an external load bank, a safety circuit and alarm to form a command center and you begin realizing the unique qualities of this fine battery testing system.
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Visible / Infrared / Imaging Test System
System 1808
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Systems
Walter Stauffenberg GmbH & Co. KG
Custom-design and ready-to-install hydraulic pipe, tube and hose assemblies from port to port
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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System
SpecMetrix
SpecMetrix systems by Sensory Analytics were designed from the ground up to precisely measure the absolute thickness of just about any coating on any substrate. All our systems are flexible for use in virtually any manufacturing environment. They provide coating thickness data of unprecedented accuracy—helping manufacturers reduce costs by optimizing coating process control and product quality. Our systems are easily configured to measure webs, coils, flat sheets, small samples or finished parts.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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LST-2000 Laser Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
The system can measure the spectral power distribution, radiant power, radiant energy, apparent light source size, pulse energy and other parameters of the laser light source, and classify the laser light source according to the standard IEC 60825.1. Because laser measurement involves more condition parameters, limit calculation and judgment process is complex, so this system adopts systematic design, the measurement complexity is simplified, the hardware adopts componentization module, users only need to follow the software prompts, carry out the corresponding steps of operation can accurately measure the effective radiation value under the corresponding conditions. The software calculates the relevant reachable emission limits and automatically classifies the laser product's safety level.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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AC Hysteresis Graph Test System
DX-2012M
Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Portable Test Systems
We refer to test meters with an integrated source as test systems. Test systems are particularly useful when you need custom current and voltage values when testing meter installations, but only want to use a single device.
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Cellular Base Station Factory Test Systems
*Factory Test System*Designed and Built by BCO*100% Functional Testing*Environmental Stress Screening Testing
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Test System
LB301
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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Tire Rolling Resistance Test System
This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Power ICs - MicroBUCK® - Voltage Regulator
*Highly integrated microBUCK POL solutions deliver high efficiency while reducing costs*Each family offers a large portfolio of high density parts with common pinouts, allowing designers to scale for the best combination of cost and performance*Our PowerCAD simulation tool allows users to select the appropriate microBUCK regulator and generate a full circuit schematic**For performance optimization and comparison purposes, the schematic can then be edited as required.**Once the basic circuit is created, the user can perform DC, transient, and start-up simulations with visibility of all the circuit node waveforms.**Following these steps, the PowerCAD 2.0 simulation tool generates a bill of materials (BOM) available for online ordering.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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System Solutions
Diamond offers a range of off-the-shelf and ready-to-build computer and ethernet switch systems that feature great flexibility and expansion capability. Our systems include industrial grade and rugged / Military grade products. Due to the wide range of configuration options, please contact your local Diamond salesperson for specific ordering information and part numbers.
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Multiple-Bus Architecture Cable/Harness Test System
CKT1175-MBA
The CKT1175-MBA (for multiple-bus architecture) will provide seamless testing of electronic racks, panels and chassis containing passive and active components such as relays, solenoids, switches, circuit breakers, lamps and LED's, diodes, resistors, capacitors, etc. This functionality is made possible by a switching matrix that is up to 10 levels deep, plus a multiplexer that controls the various stimuli sources, instrumentation connections, and external energization outputs.
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Industrial System
Axiomtek has a full range of fanless, industrial PCs that are suitable for different environments and applications. These industrial PCs deliver powerful computing performance, expansibility, high storage capacity, reliability, solid design, and cost-effectiveness. Axiomtek’s IPC products offer CE marking, popular interfaces and rich I/O options.
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Development System
FE-C450
* Emulates Dallas Semiconductors DS89C450 * 62K Code Memory * Real-Time Emulation * Frequency up to fmax at 5V * Windows Debugger For C/C++ And Assembler * 44-PLCC Emulation Header * Target Board and Programmer Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Metrology System
Echo
The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
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Test System
Griffin III
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Cleanliness Test Systems
CM Series
The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Multi-Sensor Systems
Multi- sensor surveillance systems represent a fast growing group of electro-optical systems of critical importance in both defense and civilian applications. At the same time they are the most expensive groups of electro-optical systems. Most advanced but rarely met multi-sensor surveillance systems are built from a long series of sensors like thermal imager (or two thermal imagers, color VIS camera, low light VIS-NIR camera, SWIR camera, laser range finder, laser designator, laser pointer, illuminator located on a stabilized platform and such systems. Simpler systems built from two-three sensors located on smaller stabilized or non-stabilized platforms are more common.
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Ultrasound Pulser ICs And HV Multiplexers
ST's Ultrasound Imaging IC Solutions offer a complete range of integrated high-voltage transmitters from quad and octal, to the latest device, the state-of-the art STHV1600 ultrasound pulser IC, to high-voltage multiplexer IC, the STHV64SW, a 64-channel, high voltage analog independent switches. ST’s proprietary BCD6s-SOI and BCD8sSOI process technologies enable the combination of low-voltage CMOS logic, precise analog circuitry, and robust power stages on the same chip, offering unprecedented level of integration.





























