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Product
High-Temperature Test Systems
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HT-PEM (high-temperature polymer electrolyte membrane) technology represents a further development of PEM fuel cell technology. Unlike conventional PEM fuel cells, which operate at lower temperatures, HT-PEM fuel cells can reach temperatures of up to 200 °C.
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Product
EV Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
CDM Test System
1100-CDM series
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Tokyo Electronics Trading Co., Ltd.
Model 1100-CDM is the latest model developed as a successor to the conventional CDM-550, and supports testing methods (Field-Induced CDM) that conform to international standards. In addition, a camera and a high-accuracy robot can apply CDM stress to a precise position.
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Product
Measuring System
K-5201MA
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To solve this problem, the following composition of the complex was chosen in the test stand conditions:laptop in a protected version PanasonicTBCF-53;measuring block - NIUSB-4431 with a set of vibroaccelerometers AP-2037;vibration excitation system LW 139.151-30 with mounting kit for the disk.The software of the complex provides the following functions:spectral analysis of vibration signals in the regulated range;search for natural excitation frequencies in given frequency ranges;Formation of database of existing disks;generation of reporting forms;and etc.
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Product
200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
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Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Product
Functional Testing and Test Engineering
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Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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Product
Inspection System
CIX100
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The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. The system’s intuitive software guides users through each step of the process so even novice operators can acquire cleanliness data quickly and easily.
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Product
C-Mic Auto Test System
BK9010B
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Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Product
Double IC Optic Node
OX 732
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Converts even weak Optic Signals to a high quality RF Signal. LED BAR Optic Level Display has been provided for ease of system maintenance. They are best suitable for Analog as well as Digital transmission to maintain BER, MER Characteristics. Green Technology incorporated - Aluminium Housing for maximum heat dissipation.- Frequency 40 ~ 1000 MHz- Optical Wavelength : 1290 ~ 1600 nm- Flatness ±0.75 dB- LED Bar Display for Optic Signal Level- High C/N, CSO & CTB Characteristics- Inward Extruded Aluminium Channels for Maximum Heat Dissipation- High Voltage Surge Protection- -11 dBm Sensitivity- RF O/P at 0 dBm : 110 dBµV
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Product
AC Voltage Test Systems
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HIGHVOLT Prüftechnik Dresden GmbH
AC resonant test system is used for factory testing of middle, high and ultra-high voltage cables, capacitors, generators, motors, power transformers and gas-insulated switchgears.
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Product
Advanced Driver Assistance Systems (ADAS) Testing
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Advanced Driver Assistance Systems (ADAS) TestingAll modern vehicles are now being equipped with Advanced Driver Assistance Systems (ADAS). The development of such systems requires complex testing, including the ability to control and calculate relative positions between multiple vehicles and objects in real-time. We provide an effective solution for ADAS testing with highly accurate GPS positioning systems to measure relative positions and velocity between multiple vehicles and objects.
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Scientific Systems
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Teledyne e2v has been producing turnkey focal plane arrays, camera systems, electronics and astronomical cameras for over 15 years. As part of our advanced system and instrument group we act as your partner to collaborate and develop the next generation of scientific products and technologies.
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Product
Testing Services Test
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Aero Nav Laboratories is uniquely positioned to provide testing services that promote safe and reliable products, which are in compliance with the government and industry standards.
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Product
Thermocouple System
Model TCIC
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Industrial Measurement Systems Ltd.
High Speed 8 Channel Thermocouple Interface CardPDF VersionModel TCIC Thermocouple Interface Card with USB or RS232 / 485Main FeaturesLow cost high speed thermocouple measurement 400 channels / second
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Control Systems
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GCA leverages decades of electronics and software experience as we build control panels and PLC software that bring machines to life and orchestrate how the machine's various components work together.
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Product
Hub of the System
Net-ESVR
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The Enterprise Server NET-ESVR is a hub of the system. Its central role is to receive every 5 seconds the alarm status of each probe NET-XXX and to store the status and update system alarm matrix. It also provides communication with the multiple Clients NET-NMSC.
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Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product
Display Test System
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PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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Product
Autofocus System
CRISP
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Applied Scientific Instrumentation
The CRISP system is designed to maintain focus over time i.e. compensate for thermal & other factors that may cause the sample to drift out of focus over time. It also can be used to maintain a given focal point while scanning the sample in XY. If you are looking to find the optimal focal point while scanning through the sample in Z phase.
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
Low Frequency Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Product
Power Management ICs (PMICs)
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Telecommunications and defense industries demand ever-increasing functionality in equipment such as satellites, probes and spacecrafts. CAES offers a family of radiation hardened Power Management Integrated Circuits (PMICs) designed for high reliability applications.
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Product
PXI System for LRU Test
ARINC 629
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PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
