Functional Test Systems
See Also: Functional Test, Functional ATE
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Product
Automatic System Function Tester
3260
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Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Product
Edge AI HPC System
AIR-500D
Edge AI Inference System
Edge AI HPC system powered by Intel® Xeon® D-1700 Series processors with support for up to 4 PCIe slots. Intel® Xeon® D-1700 series processor 4x DDR4 SO-DIMM sockets support ECC/nonECC memory up to 128GB.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Universal In-Line Test Platform
Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Single Site Test Handler
3210
Test Handler
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Test Systems
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Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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Product
Wireless Functional Test Fixtures
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Circuit Check’s wireless fixture technologies reduce debug time, simplify ECO’s and reduce maintenance. This allows for the highest test performance, ability to probe denser smaller targets and achieve ultra-high node counts. Higher density more complex circuit boards complicate testing requirements. Smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board (T-Board).
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Product
Functional Testing For Critical Software
RapiTest
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*Requirements-based testing for Ada, C & C++ on-host & target*Reduce test authoring effort through easy-to-use test formats*Manage project artifacts with requirements traceability*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Modular Kiosk System
UTK-7000
Kiosk System
UTK-7000 is an innovative, modular kiosk system incorporated by Advantech's UTC-100, UTC-300, UTC-500, and USC-300 series all-in-one computers.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 5.82MΩ
40-298-052
Programmable Resistor Modules
The 40-298-052 is a high density programmable resistor module with 6 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Test System
ETS788
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The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Product
Test System
MFTS500
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Computer Gesteuerte Systeme GmbH
The MFTS500-System is specially designed for the testing of electronic control units (ECUs). It can be configured to be used as a development or as a production tester. Every effort has been made during development and design to ensure that the system is flexible and cost effective.
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Product
Topside Probing for Functional Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
Airbag Test System
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Dongguan City Simplewell Technology Co. Ltd.
Airbag Test System by Simplewell
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Product
TOV Test System
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Shanghai Guantu Technology Co., Ltd.
1. Safety protection: traffic light indication status, emergency stop and interlocking of the test product door2. Equipped with a computer, set the TOV power supply parameters through the software interface, and automatically test3. Equipped with alarm function, equipped with emergency brake switch, equipped with safety cover and door switch4. The computer interface displays real-time voltage and current data5. Automatically draw voltage and current waveforms, and can save the waveforms as BMP format pictures, which is convenient for editing experiment reports.6. Automatically record test time, test current, test voltage, etc., and save the recorded data to files7. Installation method: cabinet installation.
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Product
Basic Unit - Medical Equipment Functional Test Module System
GS-X
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The GS-X Testing System consists of a Basic Unit and various plug-in test modules which the user can purchase as required. The range of functions of these Module-Box is being continuously expanded, and presently includes functions for testing the following devices: - Infusion pumps, Cardiac pacemakers, Defibrillators, High-frequency Surgical equipment, electrical safety ECG Simulation, Equipment for electro-stimulation.
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Product
Mezzanine System
5033
System
ECM P/N 5033 provides eight channels of RS485 / RS422 I/O. The 110 ohm termination for each channel is enabled or disabled in software. Disabling termination saves power by eliminating unneeded or redundant termination. Speeds of up to 20 Mega bits per second are possible, but this design also features a 250K bits per second slower edge rate mode. The 250K bit mode is valuable when EMI is more of a concern and throughput is not important. All channels power up as inputs with the outputs disabled.
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Product
Standalone Test System
1000 Series ATE
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The Circuit Check 1000 Series ATE provides a configurable standard platform that can utilize multiple mass interconnect interfaces while providing ease of maintenance and the ability to accept a wide variety of test fixture solutions. With the 1000 Series ATE, test procedures become automatic, with test steps and go/no-go limits easily programmable.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
