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Primary Current Injection Test
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Primary Current Injection Test Sets
Our primary current injection test sets cover from 750A through to 6000A. Available in single phase, testing applications include testing and timing of under and over current relays, circuit breakers and CT ratio testing.
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Primary Current Injection Test Set
DDG / 580
Wuhan Huatian Electric Power Automation Co., Ltd.
It is suitable for large current places in power system and laboratory.
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Primary Current Injection Test Set
T 2000
T 2000 is a portable current transformer test set which allows to perform many different measurements such as saturation, ratio and polarity tests and CT winding resistance test. Substation maintenance and commissioning test equipment, T 2000 is extremely appreciated by electrical engineers for its high accuracy and portability.
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Large Current 1000A Primary Current Injection Test Set
TEST-901
Beijing GFUVE Electronics Co.,Ltd.
TEST-901 primary current injection test set adopts ARM Chip to control its output process and large capacity of toroidal transformers. It is equipped with LCD display and current meter; it can show primary current value, second current value, turn ratio and the action time. Packing is used as aluminum alloy body with PC panel. TEST-901 is mainly applied to CT turn ratio testing in the power system and contact resistance test which need large current.
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Primary Current Injection Test Set
T 3000
T 3000 is a primary current injection testing system designed to perform primary tests requested in substations commissioning. It allows to perform different tests and measurements on current transformers, voltage transformers, power transformers, protection relays, energy meters and transducers
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High DC Primary Current Injection Test Set
PDC15k
PDC15k High DC Primary Current Injection Test Set adopts high-frequency invert principle to realize the high DC current output capability, with very small size and light weight. PDC15k is modular designed with changeable modules and multi-functions local control software.
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Primary Current Injection Testing
KAM
This substation testing device is designed to grant high current output when needed in substation commissioning activities.
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Primary Current Injection Kits
During installation,testing,especially if the protective gear is connected to the power line via a current transformer it is advisable to use our Primary Injection Test Set. Keeping this in mind a wide range of Primary Current Injection Test Sets are being manufactured by "NMC”.
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Primary Injection Kit
Prima Series
Prima Series is designed for Primary Current Injection Testing of Current Transformers, Protection Relays & Circuit Breakers during their Factory Test, Commissioning and Routine Testing.
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Primary Current Injection Test Trolley
SCR ELEKTRONIKS have developed primary and secondary Current injection test trolley for Switchgear manufacturers for testing of ACB , MCB , MCCB. It is low Voltage high Current source with control circuitry, digital read out for test current and trip time measurement. We can select different links of CT range as per the required test Current.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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NI-9208, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module
785041-01
500 S/s, ±20 mA, 16-Channel C Series Current Input Module - The NI‑9208 is designed with industrial systems in mind. It includes a high-resolution mode with 50/60 Hz rejection to remove low frequency noise. It has high-channel density to reduce the number of modules needed, which leaves slots open for other measurement types or for reducing the overall per channel cost of the system. The NI‑9208 uses a standard D‑SUB connection for use with cables and connector blocks.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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NI-9203, 200 kS/s, ±20 mA, 8-Channel C Series Current Input Module
783731-01
200 kS/s, ±20 mA, 8-Channel C Series Current Input Module - The NI‑9203 is intended for high-performance control and monitoring applications. It features programmable input ranges and variable connectivity options. To protect against signal transients, the NI‑9203 … includes a channel‑to‑earth ground double‑isolation barrier (250 Vrms isolation) for safety and noise immunity.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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NI-9208, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module
780968-02
500 S/s, ±20 mA, 16-Channel C Series Current Input Module - The NI‑9208 is designed with industrial systems in mind. It includes a high-resolution mode with 50/60 Hz rejection to remove low frequency noise. It has high-channel density to reduce the number of modules needed, which leaves slots open for other measurement types or for reducing the overall per channel cost of the system. The NI‑9208 uses a standard D‑SUB connection for use with cables and connector blocks.
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sbRIO-9207, Non-Enclosed, 500 S/s, 16-Channel C Series Voltage and Current Input Module
781069-01
Non-Enclosed, 500 S/s, 16-Channel C Series Voltage and Current Input Module - The sbRIO‑9207 is a combination voltage and current input module designed with industrial systems in mind. It features eight current and eight voltage input channels, with built-in noise rejection. Non-enclosed modules are designed for OEM applications.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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NI-9253, 50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module
785989-02
50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module - The NI-9253 is an 8-channel analog input module for ComapctDAQ and CompactRIO systems. Each channel provides a ±20 mA input range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9253 has several diagnostic features to ensure your system is operating nominally at all times with open channel detection, power supply detection, and configurable thresholds. The NI-9253 has eight LEDs to indicate the status of each channel and the power supply so that a user in the field can easily validate that the system is operating normally. The NI-9253 also features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
