Sensor Test
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
10 MHz To 6 GHz LAN Wide Dynamic Range Average Power Sensor
L2051XA
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Frequency range of 10 MHz – 6 GHzLAN connectivity with a wide dynamic range of -70 to +26 dBm for small signal measurementsFast real-time measurement of 50,000 readings/secReal-time measurement with zero dead time to ensure every single continuous pulse is measuredAverage mode time-selectivity function allows full dynamic range for average and time selectivity average power measurementsInternal zero and automatic calibration saves time and reduces measurement uncertaintyA BenchVue software license (BV0007B) is now included with your instrument. BenchVue makes it simple to connect, control instruments, and automate test sequences
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Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
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High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
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The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
10 MHz – 6 GHz USB Power Sensor
U2001B
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U2001B USB power sensor measures average power over the frequency range 10 MHz to 6 GHz and power range -30 dBm to +44 dBm.
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Product
E-Series Average Power Sensor
E9304A
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Refer to the E9301A for standard power sensor features Low frequency coverage (9 kHz to 6 GHz) for EMC/EMI test applications such as the radiated immunity test (IEC61000-4-3)High sensitivity (-60 to +20 dBm) and fast measurement speed to reduce the time taken to calibrate radiated field uniformity and EMC/EMI test receivers Measure transmitter power and receiver sensitivity at Very Low Frequency (VLF) to microwave frequencies Special option available to 18 GHz Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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Product
Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
10 MHz - 18 GHz USB Power Sensor
U2000A
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U2000-series USB Average Power Sensor enable fast, simple setup by providing plug-and-play USB connectivity and by eliminating the need for a separate power meter.
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Product
S2 Penta Sensors
ULP-S2 PCI/V
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Optomistic Products’ best-selling Sensor, the ULP S2 Penta Sensor, is relied upon for its versatility in accommodating most LED color and intensity test applications. Implemented in a unique and customizable 2-Part solution, the S2 Penta Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption:Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Loads: ‘Int.’& ‘Color’- 2Kohms min., 100pF max.Output Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longTypical response times: Typical response time: <10mS capture time; <100mS overall responsetime for color and intensity simultaneouslyFiber-Optic Probes: Can be paired with any Universal LightProbe Fiber-Optic Probe
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Product
6TL22 Off-Line Testing Platform
H71002200
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Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Test System Replication/Build-to-Print
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Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Safety Compliance Test System
EN 60601
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Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
Wireless Device Functional Test Reference Solution
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The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
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The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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Product
PCB Test System
Circuit Wizard - CW409
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Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
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The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
LoRaWAN 7 In 1 AQI Sensor
LEO-S592-AQ
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Integrated with multiple sensors: humidity, temperature, CO2, Brightness, PM2.5, PM10, HCHO. Multiple display modes and clear emoticon to easily understand the comfort levels via screen. Equipped with LED indicator and buzzer to indicate device status and threshold alarms.
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Product
Digital Functional Test
CTS100i
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Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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Product
Dual Channel, ±12 V, 100 MHz, 40 NA – 1 A
CX1102A
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The CX1102A dual channel current sensor is a dedicated accessory for the CX3300 series mainframe and features wide dynamic measurement ranges due to the simultaneous capture technology.
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Product
Waveguide Power Sensor
Q8486D
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Excellent SWR for reducing mismatch uncertainty50 MHz calibration port Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 33 GHz to 50 GHz Diode power sensing element
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Product
Diode Power Sensor
8487D
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Excellent SWR for reducing mismatch uncertainty Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 50 MHz to 50 GHzDiode power sensing element
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Product
S2 Ultra High Sensitivity Sensors
ULP-S2 UHS
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Universal LightProbe S2 Ultra-High Sensitivity Sensors are designed for the test of very dim LEDs, as low as 0.01 mcd minimum, and including very low light-level LED-illuminated action-indicator switches, controls and status indicators for night/dark viewing in automobile interiors. Recommend the use of wide-aperture stainless- steel encased Fiber- optic Probes with contacting tips.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Loads: 20 mA max. Non-inductive.Output Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. long.Typical response times: <190mSFiber-Optic Probes: Wide-Aperture Fiber-Optic Probe recommendedDesigned for the test of very dim LEDs, as low as 0.01 mcd minimum
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Mini In-Circuit Test System
U9403A
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The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Memory Test System
T5830/T5830ES
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Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Power Sensor and SNS Noise Source Cable (1.5m / 5 feet)
11730A
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The Keysight 11730 series power sensor cables are used with the 8480 and E-series power sensors (except the E9320 family of peak and average sensors). These cables are designed to reduce RFI effects on low power readings with an improved shielding design in the cable itself. Cables may be ordered individually or in pairs in any combination desired for single and dual-channel measurements.
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Product
Disk Drive Test System
Saturn
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The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
