X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Precision Targeting Systems
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Designed to meet the various missions of the United States military, the Common Laser Range Finder-Integrated Capability (CLRF-IC) provides rugged day and night capabilities for reconnaissance, surveillance, and targeting operations. Within a three pound package, the CLRF-IC employs the latest in advanced and lightweight handheld technologies. Featuring a Single Wave-IR night camera, high definition color day camera, eye-safe laser rangefinder, digital magnetic compass and a global positioning system, CLRF-IC increases precision targeting capabilities. Powered by either L91 or CR123 batteries, the system recognizes targets over 3 kilometers in day light and1 kilometer at night.
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Machine Vision Systems
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This precision engineered range of Machine Inspection System is manufactured using superior technology and high grade raw material. Widely popular in the market, this range can be availed at industry leading prices.
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External Measuring Systems
LAN, USB
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An alternative for measuring cards integrated in a PC are external data acquisition systems from BMCM. In this case, sampled data are transmitted to the PC via the USB interface or the LAN network - perfect for mobile applications!
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QE System
PVE300
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The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
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X-ray and CT inspection System
UX20
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Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
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Advanced Spectroscopy System
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Nuclear Physics is the field of physics that studies atomic nuclei and their constituents and interactions. We offer Geiger-Mueller tube systems for investigating the statistics of radioactive decay, as well as scintillator based systems for gamma spectroscopy.
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Vibration Measuring System
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here are several parameters to express about vibration.For conventional vibrometers, repetitive measurements at each point switching parameters is necessary.However,for CardVibro Air2 equipped with a simultaneous measurement function, measurements of Displacement, Velocity, Acceleration and furthermore Envelope for bearing condition diagnosis is possible by just pressing a start key at the same time.
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Recording System
Surveyor DFR DDR
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The Surveyor Recording System is a DFR/DDR with local Input Modules connected to a Controller. The Input Modules are connected to the Controller by multiconductor cables. The Controller contains a single board computer running 64-bit Microsoft Windows 10® and the E-MAX Director program, for recording, storing and transferring data.
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Product
Hardware-Software System
Shock Impact Recorder
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This system is complex of recording instruments intended for measurement and recording of shock impact parameters produced by shock testing machines.
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Meter Test System
MTS-50
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Kongter Test & Measurement Co., Limited
This meter test equipment features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 50A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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3D Digital Inspection
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Digital stereo 3D imaging is a unique, advanced, stereo image presentation system designed to provide fully interactive real time natural 3D viewing and visualisation with outstanding depth perception.
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Fiber-Based TCSPC System
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*Hybrid Fiber System With Implantable Fiber Tip*Tip Removable from Fiber System*Seperate Excitation and Detection Fibers*Extremly Low Background Fluorescence*One or Two bh ps Diode Laser (BDS-SM or BDL-SMN Series)*High-Efficiency HPM-100-40 or -50 Hybrid Detector*Optional: Multi-Wavelength Detector
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UV-VIS Systems
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The tec5 UV systems offer fast and reliable measurements starting from 190 nm. The modular system platform enables multiple integration options for easy and efficient handling of various measurement tasks in research and production applications. Due to the system’s dedicated design for industrial processes, even applications in harsh environments are possible without any difficulties, including simple and safe connection to process control systems utilizing common interface concepts established on the market.
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Test System
Series 303
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The 303-Relay Test System tests the integrity of electromechanical relays and switches. The system can perform an array of tests and control output binning in a fraction of the time of any other tester on the market. Ease of use and overall system flexibility make the 303 ideal for applications in development, incoming inspection, and production line testing.
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High-Tc Systems
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We offer easy to handle high-Tc systems with liquid Nitrogene as coolant. You can choose between fibre reinforced plastic vessels or glass dewars with robust Teflon shell.
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Test System
Series 4x
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The 4x is the next generation test system for discrete semiconductors. Designed with high volume production in mind, the system is also ideal for incoming or general purpose test applications.
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Monitoring System
TriGas X5000
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The TriGas X5000 Monitoring System is an integrated gas detection solution that helps plant operators comply with NFPA 820. The system monitors for combustible gases, hydrogen sulfide and oxygen with on-board alarming and communication interface to plant and remote location control stations.
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Monitoring Systems
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Sensors alone do not provide the complete answer to measuring vibration and using the data to better understand machine health. Monitran offers a short range of monitoring systems that can be used not only to measure vibration but to display values, constantly watch the levels and take action in case of excess and dangerous vibrations.
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Test System
DA-1 ATS
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The DA-1 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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FPGA Test System
DO-254/CTS
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DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Lithography System
JetStep X500
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The JetStep X500 panel lithography system is optimized for volume manufacturing of high-end AICS and advanced packaging panels. The system incorporates a large field exposure system with advanced features to meet the challenging requirements encountered in production of AICS or panel level packaging, such as; fine resolution to 3µm with large depth of focus (DOF), high overlay accuracy of ±1µm, automatic magnification compensation with independent x and y magnification adjustment of ±100 ppm, and automatic handling of panel substrates of various dimensions, thicknesses, and levels of warp.
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Defect Inspection Module
EB40
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The Class 1 certified E40 and B40 modules (available separately or combined in one module) can automatically detect defects on the entire edge, from zone 1 to 5, and the entire backside. The ability to inspect the entire backside allows for faster root-cause analysis of zone 5 defects since such defects can migrate from the wafer interior.
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Portable Security System
Sensor-1
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The portable security system that fits in the palm of your hand. Sensor-1 detects real-time changes in motion and alerts you when your important items move. Operates independent of the mobile app. Communicates with smartphones, tablets, laptops and desktops.
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Uninterruptible Power Systems
CMN Series
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The Clary CMN Series Uninterruptible Power Systems are built specifically for fixed and mobile military applications.
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AI Inference System
MIC-743-AT
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AI Inference System Accelerated by NVIDIA® Jetson Thor™. Embedded with NVIDIA® Jetson T5000™ / Jetson T4000™ up to 2070 TFLOPS (FP4). Supports 1 x QSFP28 (T5000: 4 x 25GbE / T4000: 3 x 25GbE).
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Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Automated Optical Inspection Solutions
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Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
