Antenna Test
See Also: Antenna Measurement, Test Ranges
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High Gain Horn Antenna
BBHA 9120 K
The BBHA 9120 K is a linear polarized high gain horn antenna for immunity testing at short distances, especially optimized forAutomotive 600 V/m Pulse Radar Test 1.2 - 1.4 GHz. Standard: General Motors: GMW3097, Ford: EMC-CS-2009.
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Low Noise Pre-Amplifiers
Low Noise Pre-Amplifier and companion external low noise amplifier (LNA) are used to amplify low level microwave signals. The Pre-Amplifier contains an AC/DC power supply, internal low noise amplifier, and a bias tee to source a DC bias voltage on the RF input connector.To overcome cable loss between the test antenna and the Pre-Amplifier assembly, a remote low noise amplifier (LNA) is mounted directly onto the 10 GHz antenna. A bias tee inside the Pre-Amplifier chassis powers the remote LNA through the coax cable interconnecting the pre-amplifier and the 10 GHz test antenna.
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Antenna, Biconical
EM-6917B-1 | 30 MHz To 3 GHz
The EM-6917B-1, a hybrid combination of the industry standard biconical and log periodic antennas, delivers an unmatched combination of frequency coverage and high power handling capability. Featuring exceptionally broad frequency coverage of 26 MHz to 3 GHz, the EM-6917B-1 eliminates the need for adjustments or switching antennas in most test applications up to 3 GHz, and it does so without compromising power handling capability for transmit applications.
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Active Loop Antenna
AL-130R
Also known as Magnetic Loop Antenna, the AL-130R is compliant with CISPR 16-1-4. It is ideal for emissions measurements as required by various EMC standards such as FCC 18, CISPR 11, CISPR 13, CISPR 14, CISPR 32 and many more. The built-in, low-noise preamplifier, increases overall measurement sensitivity as well as the overall signal to noise ratio. As per ANSI C63.4-2014, the use of active loop antenna for compliance testing is permitted in a non-sheilded environment ONLY if the saturation indicator is continuously monitored during the course of testing. Com-Power’s Remote Antenna Interface (RAI-100) comes in very handy for this application. It is a compact controller which can be used to enable/ disable RF measurement circuit and monitor saturation and battery low conditions remotely via a fiber optic cable up to 30 mtrs in length.
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CATR Benchtop Antenna Test System
ATS800B
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Rapid Antenna Testing Services
At JEM we understand the challenges facing antenna, microwave and communication system engineers, and we realize that accurate measurement of antenna electrical performance is critical. That’s why we offer a range of rapid antenna testing services from 50 MHz to 40 GHz.
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Medium-size Compact Antenna Test Range
H-Series CATR
The H-Series CATR chamber provide complete 3D performance assessment for 5G OTA devices and antennas including gain, efficiency, directivity, polarization and beam characteristics for frequencies from 3 up to 110 GHz, capable of supporting forthcoming 5G Sub-6 GHz (from 3 to 6 GHz) and mmWave (24 to 110 GHz) standardized testing including TRP/TIS, EIRP, EIS, IBB and emissions in accordance to 3GPP TR38.810 and TR37.842.
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Antenna Testing Services
Our chamber measures 28' x 14' x 14' with 12" to 36" pyramidal anechoic absorbers and is fully shielded using a dual layer metal enclosure. Our test chamber is designed to for frequencies ranging from .700 to 6.00 GHz.
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PNA-X Measurement Receiver for Antenna Test
N5264B
A new industry standard for antenna test with 400,000 point per second data acquisition on all five measurement channels Twice as many receivers available compared to any other antenna receiver on the market Replace existing 8530A and 8360 solutions for a system speed improvement that is 10 times faster Built-in 8510/8530A code emulation software provides a drop-in replacement for existing antenna ranges utilizing an 8530A
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Saluki S5105 Series Microwave Analyzer (SA/VNA/CA)
S5105 series microwave multifunctional analyzer has the wide frequency range from 30kHz to 40GHz. It integrates multiple functions such as dual-port vector network analysis, cable and antenna feeder test, vector voltage measurement, spectrum analysis, field strength measurement, and power measurement, providing you with powerful comprehensive test capabilities. S5105 series RF analyzer is widely used in the radar performance test and cable TV, wireless communication field.
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High Power, Low PIM Switch Unit
LPSU
Low PIM coaxial switch matrix 5 x 6 or 1 x 4 configurationFrequency range 698-2700 MHz.SCPI commands via Ethernet (wired or wireless).Significantly reduces test time for multi frequency PIM applications.Applications: ATE systems, multi-band antenna and component testing.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Test Fixture (SMD Components)
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
