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Optical Loss Test Set
measures the total amount of attenuation in a length of fiber.
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Pro Optical Loss Test Set
CertiFiber
The CertiFiber Pro Optical Loss Test Set improves the efficiency of fiber optics certification. The Taptive user interface simplifies set-up, eliminates errors and speeds troubleshooting. A set reference wizard ensures correct reference setting and eliminates negative loss errors. Built on the future-ready Versiv platform, CertiFiber Pro Optical Loss Test Set (OLTS) provides merged Tier 1 (Basic) / Tier 2 (Extended) testing and reporting when paired with OptiFiber Pro module.
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Quad Optical Loss Test Set
KI27624-INGAAS
A Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber optic systems at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful optical multi-meter style solution to improve test flexibility and productivity.
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Two-Way Optical Loss Test set
KI23403OLV-INGAAS-APC
A Dual Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on multimode fiber at 850 / 1330nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. A multimode APC connector on this model is required for reliable ORL test performance.
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Quad Optical Loss Test Set
KI27624-INGAAS-APC
A Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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OPTICAL LOSS TEST SET (OLTS) MQJ KIT
4000-1025
The OLTS (Optical Loss Test Set) - MQJ Kit includes a soft, padded carrying case with strap that is provided to protect all of the components during transportation and/or storage.
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SM & MM Quad Optical Loss Test Set
KI2724-INGAAS-APC
A SM & MM Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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Two-Way Optical Loss Test Set
KI23410OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at triple 1310 / 1550 / 1625 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Two-Way Optical Loss Test set
KI23422OLV-INGAAS
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber at 1310 / 1550 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use.
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Optical Loss Test Set (OLTS)
MaxTester 940/945
First tablet-inspired, multifunction optical loss test set (OLTS) delivering insertion loss, optical return loss and fiber length measurements at two wavelengths in five seconds via fully automated bidirectional FasTesT™ analysis. With its step-by-step reference wizard and intelligent fault diagnosis, the MAX-940/945 provides expert guidance throughout the test process to ensure immediate efficiency by first-time users while removing risk of errors or negative loss—a common source of issues when testing low loss fibers.
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SM & MM Quad Optical Loss Test Set
KI2724-INGAAS
A SM & MM Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber optic systems at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it is a powerful fiber optic multimeter / OLTS with improved test flexibility and productivity.
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Optical Loss Test Set/Light Source/Optical Power Meter
The CMA5 series (Optical Loss Test Set/Light Source/Optical Power Meter) offer superior accuracy and reliability for evaluating a wide range of optical devices and systems including WDM.
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Two-Way Optical Loss Test Set
KI23422OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at 1310 / 1550 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Optical Loss Test Set
KI23424OL-INGAAS-APC
A Quad Two-Way Optical Loss Test set / OLTS fiber tester that's perfect for medium to ultra high fiber count loss, length & optical return loss testing applications on both multimode and single mode fiber with APC connectors on both ports at 850 / 1330nm 1310/1550 nm. A pair of these compact SM & MM instruments set new standards of productivity, ultra-stable source accuracy and ease of use.
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Optical Loss Test Set
KI 23400
A Bidirectional Optical Loss Test set (OLTS) that's perfect for medium to ultra-high fiber count loss, length & ORL testing. A pair of compact instruments set new standards of productivity, accuracy, and ease of use.
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Two-Way Optical Loss Test Set
KI23427OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at triple 1310 / 1490 / 1550 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Optical-Electrical Converter - MATRIQ
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Broadband Optical Source - MATRIQ
Our SLED MATRIQ instrument is a compact super-luminescent LED light source with high output power, large bandwidth and low spectral ripple.The SLED comes in various wavelength models to address various key applications across telecom and datacom, and is ideal for building a customized optical testing platform that delivers reliable and repeatable results.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
