Integration
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Passive Component Integration
Integrate passive optical components of your choice such as WDM couplers, splitters, band-pass filters, PM beamsplitters and circulators. PXIe and benchtop models support SMF, MMF and PMF.
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Passive Component Integration - PXIe
Passive Series
The Passive PXIe module is a highly customizable PXIe module that can integrate the passive components of your choice.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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Complete Integration
It is important to make sure your product looks and feels like your product. To the best of our ability, we will match your look and branding. We understand the importance of maintaining a consistent brand image, and we strive to fully integrate our components into your instrument in a way that aligns with your brand. This includes matching the software interface and control, ensuring a mechanical fit that seamlessly integrates with your product, and ensuring that our components match the look and branding of your product.We strive to ensure that our components contribute to the overall success of your brand, because our goal is to make your customers satisfied with you.
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Integration API
Testdroid API is an easy-to-use gateway for managing your development and testing effort on real Android and iOS devices. As an alternative for an official Testdroid Cloud site, the API provides all infrastructure through different clients (e.g. Java, Python, Ruby) following the RESTful architecture paradigm and returning JSON with appropriate HTTP response codes.
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Systems Integration & Test
Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Systems Integration for Circuit Card Assembly
Teledyne Advanced Electronic Solutions integrates CCAs and other sub-assemblies, cables and fabricated parts into system modules shipped directly to customers for integration into their products.- Box Build: custom built to order system solutions- High complexity box assemblies and subsystems- High frequency RF box assemblies and subsystems- Full functional RF testing up to 26 GHz (K band)- Multi-level systems integration – build and test modules and CCAs and integrate into higher level assemblies- Custom cell design for customer subsystems- Special bonding processes including thermal management and vibration- Robust torque and FOD control programs- System level testing including functional, vibration and thermal- Complex harness fabrication and integration- Fiber-Optic and RF waveguide integration and testing- Large system capacity in excess of 200 lbs.- Configure to order – Integrate different options, firmware, configurations, etc across a single order as required
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Integration testing
Integration testing primarily focuses on verifying data communication among different modules of the software project. Integration tests determine the effectiveness and performance of different software modules when they are connected to each other.
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ESI(Electronics Systems Integration Unit)
MS 2004
The ESI subsystem provides platform interfaces like Gyro and on board Radar Blanking. This unit receives Analog and Digital GYRO inputs from ship and pre- trigger pulses from on board radars of the ship. This unit measures and provides the ship heading data to VARUNA ESM system. It also provides Heading, Roll and Pitch data to the ECM system. This unit also generates band wise composite ESM Rx. Blanking gates and provides all the required interfaces to ESM receiver, ECM System and System Controller units.
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Mission Computer Software Integration Rig
MS 1124
The HSIR is the ground test facility and it simulates various LRUs/sensors interfaced with the HAWK Mission Computer. RIG consists of Industrial computers with Simulation modules, Acquisition modules, Video generator module and video display monitors. RIG provides the simulated inputs to both the MCs from each simulated sensor/ LRU through hardwired signals, through the MIL-1553B, Arinc 429, RS-422, RS232 and Ethernet etc. The rig is capable of testing two MCs together either of which can be used as the Bus Controller (BC) or the Remote Terminal (RT). The rig provides the facility to monitor and acquire the MIL-1553B, Arinc 429, RS-422, and RS232 Ethernet bus, Analog IOs, Synchro IOs, Discrete IOs and transactions that takes place between the MCs and various sensors/units. The RIG has the capability to test individual MCs also.
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Integration Spheres
Offers a wide range of integration spheres (0.25m to 3 m diameter) and spectrometer options, application-specific modules as well.
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Signal Integration Systems
Avenue
The Avenue system includes modules for video up/down conversion, audio embedding, synchronization, conversion, routing, noise reduction, protection switches, test signal generators and more. Avenue signal processing modules are used worldwide in broadcast, mobile, satellite, cable, worship and post production facilities. Avenue is a tray-based signal integration system housed in a 1RU or 3RU frame. Any combination of 1.5 Gb/s HD, 3 Gb/s HD, SD, MPEG, analog video and audio processing modules can be used together in the same frame.
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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System Integration
The provision of a basket of services for Auditoriums such as audio-visual systems, stage lighting, stage rigging, building control systems, communication systems and information technology systems. A proper understanding of the various disciplines involved is the key to successfully integrating the diverse component parts. The final solution must perform as one unit with a high degree of simplicity to the end-user. The result will be a solution that, while extremely complex, appears simple, logical and easy to use. Sri Comm has successfully designed, installed and commissioned several projects of this nature.
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Components for System Integration
Bh offers a wide range of accessories to improve your photon counting experiment such as experimental control modules, optomechanics or implantable fiber probes for in-vivo applications. For PMTs and MCPs we offer different preamplifiers and a variety of routing devices for multi-detector operation. For a perfect SYNC signal, trigger modules and a SYG are available.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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24-Channel Digital I/O With Digital Integration Features On PCI Express Mini Card
mPCIe-DIO-24A
The mPCIe-DIO-24A is a type F1 PCI Express Mini Card (mPCIe) and optional cable assembly (D-Sub 37-pin Male connector) designed to be easily panel-mounted in any application environment. It uses the high speed PCI Express bus to transfer digital data to and from the card. The digital I/O is compatible with 8255 PPI chips making it easy to program. This also allows for simple and trouble-free migration from other ACCES PCI and PCI Express digital I/O cards, but also provides for advanced features enabled by the onboard FPGA logic.
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Systems Integration (SIL) Lab Data Acquisition
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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System Integration
Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Wafer Auto Line Integration
The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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System Integration Services
Systems integration services to meet a wide variety of industrial needs. It includes the following key expertise: Desktop, Embedded Simulation and Real-time system, Data Acquisition and Report generation/extraction, Factory automation, Testing, Control and Monitoring system, Vision inspection, Equipment calibration, Special purpose machine, and many more.
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Digital Integrated FET Regulators
Renesas' digital power conversion and management ICs combine an integrated synchronous step-down DC/DC converter with key power management functions in a small package, resulting in a flexible and integrated solution.
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Integrated Solution for Control and Automation
One
Building new machines for today’s smart factories requires sophisticated control and automation that can only be delivered through multiple solutions and components – including a PLC, HMI, I/Os and motion components such as AC Servo systems and VFDs. As all components must be integrated, selecting the right combination is crucial to the efficiency and success of any project.
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Integrated Transformer Test Van
XD90
Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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Semiconductor Test
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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Integrated TFT-LCD DC-DC Regulators For Automotive
Renesas' portfolio includes automotive-grade multiple output regulators for use in TFT-LCD automotive applications.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Functional Testing
Interface Testingevaluation of correct system module interaction Smoke Testinginitial testing process to check whether software is ready for further testingSystem Testingconducted on a complete, integrated system to evaluate the system's compliance with its specified requirements Integration Testingperformed to test units of code to verify interaction between various software components and detect interface defectsRegression Testingtesting to ensure changes made are not impacting previously working functionality Acceptance Testingperformed to make sure the software handles required tasks in real-world scenarios, according to specifications
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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Semiconductors on Film-Frame
Ismeca NY32W
32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enables extended autonomous operation and productivity.





























