Highly Accelerated Stress Test
High reliability testing using a destructive high temperature, humidity and pressure enviroment.
See Also: HAST
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Test Fixture
N1295A
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Acceleration Simulation Mode (ASM) Roller Set
ASM-P | VP 230046
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-P roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The increased tractive force of its eddy current brake means that the ASM-P is also suitable for power measurements at constant speed and constant tractive force.
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Accelerated Aging
The purpose of accelerated aging testing is to speed up the effects of time on a product. This is done to predict the long-term durability and to support shelf-life and expiration dating claims. This is often used in the medical device packaging industry. The relationship between temperature and product life is utilized to determine the test duration of accelerated aging.
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Acceleration Meter (Top/Side Output)
BC 111
*General-purpose acceleration meters with integrated electronics;*Sensitivity: 10 mV/g;*Frequency band: 1 ~15 000 Hz.
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Virtual Platform Simulation Acceleration
QuantumLeap
QuantumLeap is a parallel simulation performance accelerator that leverages a new synchronization algorithm to provide the fastest virtual platform software execution speed available. The execution performance of this new technology has been measured on average at 15 times faster than the nearest commercial solution using standard benchmarks.
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PCB Interconnect Stress Test System
PWB Interconnect Solutions Inc.
Integrated package including PC, Software with real time graphing and all related systems and hardware for 8 head, dual sense testing model IST-HC
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Accelerate the Process of Evaluating
Simulia
Powered by the Powered by the 3DEXPERIENCE® Platform, SIMULIA delivers realistic simulation applications that enable users to explore real-world behavior of product, nature and life.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Accelerate Semiconductor Development With IP-Centric Design
MethodicsIPLM
Methodics IPLM provides a scalable IP lifecycle management platform that tracks IP and its metadata across projects, providing end-to-end traceability and enabling effortless IP reuse. Learn more by connecting with an IP expert today.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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SmartNIC Storage Accelerator Card Zynq Ultrascale+
iW-RainboW-G35P®
Your product description goes here.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Optical Receiver Stress Test Solution
N4917BSCB
The Keysight N4917BSCB optical receiver test solution is a complete, automated and repeatable solution for optical receiver stress test.
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Automated Screenshots of Webpages for Accelerated Layout Testing
Auto-generate full-paged screenshots of your webpages across multiple devices, operating systems, browsers, and resolutions - in a single go! LambdaTest Automated Browser Screenshot feature accelerates your UI and Layout testing helping you quickly identify layout issues across browser versions and screen sizes.
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High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Inclination & Acceleration Sensors
Whether leveling crane trucks, monitoring the condition of large systems, or controlling the acceleration of elevators - the areas of application for inclination and acceleration sensors from Pepperl+Fuchs are diverse. Even in harsh outdoor conditions, they always guarantee precise measurements.
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Stress Analysis Strain Gages
Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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OM Thermal Stress System
Conductor Analysis Technologies, Inc
The OM Thermal Stress System is a cost-effective performance based reliability test methodology which performs convection reflow assembly simulation and air-to-air thermal cycling. The methodology is utilized by both the IPC PCQR and the IPC 6012-QLM programs. OM systems are available for sale or lease, and test services are provided from both CAT and our service partners.
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Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Highly integrated, PC-compatible embedded modules
ETX®
Highly integrated, PC-compatible embedded modules based on x86 CPU architecture all that on a footprint of 95 x 114 mm.Full featured Multimedia PC from Intel Atom via AMD or VIA Eden to Intel Core2 Duo on 95 x 114mm - the standard for custom designs.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
