X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
-
Product
Handheld X-Ray Backscatter Imaging System
Nighthawk™
-
Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
-
Product
Constant Potential Generator Metal Ceramic X-Ray Tube 30 to 300 kV
CP300C
-
The CP300C is the first panoramic x-ray generator of the CPSeries product range. Equipped with a metal-ceramic tube, the CP300C is a light (less than 30kg) and powerful generator (300 kV), able to penetrate up to 52mm of steel in 10 minutes, making it the best power-to-weight ratio in the world.The efficiency of the CP300C is also maximum thanks to its real 100% duty cycle that allows longer exposure time (> one hour).A full range of accessories is available (holding bars, tripod…) and even a 60°x40° lead diaphragm to convert the CP300C into a directional unit.
-
Product
Reject Station for X-Ray Image Analyser
IV-110I
-
IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
-
Product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
-
HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
-
Product
Real Time X-Ray Imaging
GO-SCAN C-VIEW
-
Go-Scan C-view is a light weight ruggedized real time X-ray imaging system specifically designed for hand-held inspection such, among other, Corrosion Under Insulation (CUI) inspection. It includes a high speed and high resolution CMOS imager and a battery-operated 70kV x-ray tube designed for portable field operation. The video imaging system captures images and displays them on a hand held display in real-time.
-
Product
In-Line X-ray Inspection System for Secondary battery
X-eye 9000 Series
-
X-ray Tube100 kV / 200 µAMin. Resolution5 µmInspection Ability120ppm , 150ppm, 180ppmSystemConveyor / Index / Pick&Place 방식 LoadingDimension1,800(W) x 1,560(D) x 2,070(H)mm / 5,000kg
-
Product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
-
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
-
Product
X-Ray Components
-
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
-
Product
X-Ray Inspection System
MXI Ruby XL
-
Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
-
Product
X-ray sources / X-ray optics
-
X-ray sources are the heart of every X-ray analytical instrument. In combination with advanced X-ray optics, they generate the required X-ray radiation for structure analysis in various fields of material and life sciences. X-ray sources must offer perfect thermal constancy for excellent position stability of the X-ray beam as well as high intensity, even at low power levels. The design has to guarantee easy integration into advanced X-ray equipment paired with straightforward operation to keep uptimes high and to guarantee maximum radiation safety for operators and equipment.
-
Product
NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
-
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
-
Product
X-ray and CT inspection System
UX20
-
Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
-
Product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
-
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
-
Product
Bulkflow X-Ray Inspection System
-
Designed to be integrated into line with optional reject stations, the Bulkflow X-ray System is perfect for loose and free flowing products. Offering a good detection levels on a wide range of contaminants including all metal, bone, glass and dense plastics.
-
Product
Refurbished And Demo X-ray Inspection Systems
-
Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
-
Product
X-ray CT System
-
The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
-
Product
X-ray Fluorescence Spectroscopy (XRF) Services
-
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
-
Product
X-ray Inspection Of PCB Boards And More
The RTX Series
-
Glenbrook’s RTX Series of modular, real-time systems include models designed to meet a variety of production requirements including circuit board components. Numerous options make it easy to customize any RTX model to your specific application. All hardware and software elements are fully compatible to ensure the continued value of your equipment.
-
Product
X-ray Inspection System
JewelBox-90T/100T/110T™
-
All JewelBoxes deliver precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and image distortion prevalent in other systems.
-
Product
Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
-
Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
-
Product
X5 XL800 X-Ray Inspection
-
Designed to be integrated into the production process at either the beginning to protect equipment or at the end to protect consumers, the X5 XL 800 is perfect for products such as meat in Euro crates or cheese in bulk boxes.
-
Product
Pulsed X-ray technology
-
Golden Engineering X-ray generators are based on Pulsed X-ray technology. Pulsed X-rays generate a high intensity X-ray burst (pulse) in a very short period of time (10 to 50 nanoseconds depending on the model). The output dose of each pulse is 3-6 mR measured 12 inches from the front of the X-ray generator. The operator varies the overall dose of each exposure by changing the pulse setting. The pulse rate varies from 10 pulses per second to 25 pulses per second depending on the model. The generators can fire up to 200 pulses before a four-minute rest period.
-
Product
X-Ray Inspection System
MXI Quadra 5
-
Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
-
Product
X-ray Fluorescence Spectrometers
-
Is a non-destructive analytical technique used to determine the elemental composition of materials.
-
Product
Automated X-ray Inspection (AXI)
-
Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
-
Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
-
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
-
Product
Total Reflection X-Ray Fluorescence (TXRF) Products
-
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
-
Product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
-
Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm. X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure. Mapping area size up to 350 x 350 mm2 <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution. Dual types of detectors for transmission and fluorescent X-rays. Detectable element range down to C with a light element detector and He purge module.
-
Product
X-ray Fluorescence, XRF Analysis Services
-
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.





























