X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Real-time X-ray Inspection Systems
JewelBox Series
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JewelBox x-ray inspection systems feature ultra-high resolution, powerful microfocus x-ray tubes, five-axis, and positioners. The JewelBox Series is divided into three broad categories: JewelBox 70-T, JewelBox 90-T and Ultra Compact each of which can be customized for specific applications.
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*Micro-fluoroscopic X-ray Inspection System
Cath-X
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The Cath-X is a bench top system employing Glenbrook’s micro-fluoroscopy technology providing highly detailed x-ray video of the critical components of the needle device. The transparent, safely shielded, view chamber permits the operator to locate the critical areas of the needle for inspection. The x-ray image can be further magnified using the electro-optical zoom feature of the Cath-X.
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X-ray Fluorescence Spectroscopy (XRF) Services
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Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
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Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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(X-ray and XUV) Streak Cameras
AXIS-PX
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We build streak camera systems that can achieve time resolution on the femtosecond time scale while conserving and ultra-fine spatial resolution on a very long slit length.
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Real-time X-ray Medical Device Inspection System
The Bench-X
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Our latest real-time, compact system used for Medical Device X-ray Inspection. Very configurable and compact with high resolution at relatively low radiation levels.
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X-ray Camera
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Up until the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.These Indirect Conversion Method X-ray Detectors comes with multitude of issues. These problems include but not limited to; Low Sensitivity, Fuzziness, Time Degradation, Inadequate Life
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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For Real-Time X-ray Inspection Systems
Image Processors
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A number of image processing software packages are available. Features include frame averaging, measurement, text, label, marking, 3-D rendering, video recording and image storage. Additionally, BGA analysis and void measurement software can be added as well as other options. See our image processors for x-ray inspection machines below.
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X-ray fluorescence spectrometers
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SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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X-ray Microscopy
Xradia Family
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✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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X5 Pack X-Ray Inspection
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Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
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X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
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Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
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SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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X-Ray Inspection
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X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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Xray Food Inspection
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FlexXray has developed leading, certified technology and processes to use advanced x-ray technology to inspect products specifically for food companies. Although they look like a TSA line at the airport, our systems are highly customized machines and processes built specifically to find contaminants like metal, glass, wood, stone, plastic, and rubber in food products of all types. What we do is find needles in haystacks – but the needles we find are even smaller than needles in a haystack. In fact, FlexXray can find contaminants down to 0.8mm or smaller.
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X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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X-RAY Cameras Based On CCD
XiRAY
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*High resolution direct phosphor imaging, ideal for Micro CT*Ultra-low readout noise with CCD and especially the new sCMOS sensors*Crystal clear 14 bit/pixel images*Partial readout and binning modes for enhanced sensitivity and higher speed*Non-linearity over full dynamic range <2% (of full scale) to 95% of full scale*External triggering, LVTTL*Low power consumption 6 Watt with Cooling or 2W without*Antiblooming, Enhanced Statistical Extra-Mural Absorption*Radiation hardened, Support of Energy levels 7 to 100keV*Measures just 63 x 63 x 46 mm*Peltier TE Cooled with Heatsink and optional fan
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Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
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SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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X-ray CT System
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The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
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Conveyor X-ray Scanners
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Innovative baggage X-ray screening units for quick and easy identification of the material composition of scanned objects.



























