Open Area Test Sites
test objects to 30MHz to 3000 MHz frequency range.
See Also: OATS, Comb Generators
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Product
Switch Probe (Normally Open (NO)) F87516B070G135
1006704
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The Switch Probes (Normally open (NO)) F87516B070G135 is designed for precision in various applications, offering exceptional performance and reliability. Its basic contact probe design is part of the F875-NO family, optimized for versatility and durability under a wide temperature range of -45°C to +100°C. With a pitch of 2.54 mm, this probe is ideal for circuit testing and other applications requiring accurate contact and switching capabilities.
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Switch Probes (Normally Open (NO)) H878RD
1016481
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The Switch Probes (Normally open (NO)) H878RD are exceptionally designed for precision applications requiring reliable performance and minimal dimensions. With a total length of just 16 mm, they feature a press ring diameter of 2.20 mm and an outer diameter of 2.00 mm, making them ideal for compact installations. The collar height of 0.20 mm ensures a snug fit while maintaining high sensitivity and reaction speed, essential for applications where responsiveness is critical.
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Product
Switch Probe (Normally Open (NO)) F88406B230G200SM
1003791
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The Normally Open Switch Probe F88406B230G200SM (item number 1003791) combines spring-loaded contacting with a defined switching or sensing function. F88406B230G200SM combines electrical contacting with a switching signal so that DUT presence or position can be evaluated directly in the test sequence. In F88406B230G200SM, the normally open function closes the electrical contact at the defined actuation travel, combining contacting with presence or position information. For F88406B230G200SM, spring force is 200 cN at a nominal travel of 4 mm. F88406B230G200SM is rated for 10 A continuous current with a typical contact resistance of 50 mΩ. F88406B230G200SM combines a pitch of 3.5 mm / 138 mil with tip style 06 (Serrated stepped) and a tip diameter of 2.3 mm.
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Product
Switch Probes (Normally Open (NO)) F86311B064G040L
1041999
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The Switch Probes (Normally open (NO)) F86311B064G040L offers an exceptional solution for applications that require dependable performance under challenging conditions. Designed under the F863-NO family, this basic contact probe is capable of operating within a temperature range of -45°C to +100°C, making it suitable for various environments. With a precise switch travel of 3.50 mm and an impressive continuous current capacity of 2.00 A, users can expect reliable and accurate operations in mechanical applications.
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Product
Switch Probes (Normally Open (NO)) F88506B100G900LM
1004248
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The Switch Probes (Normally Open (NO)) F88506B100G900LM is a high-performance basic contact probe designed for precision applications. With a family designation of F885-NO, this probe exhibits a pitch of 3.50 mm, making it ideal for compact setups. It operates efficiently within a temperature range of -45°C to +100°C, ensuring reliability in diverse environments. Moreover, its unique design includes a nominal travel of 4.00 mm and a maximum travel of 5.00 mm—critical for accurate measurements and actuations. The probe's advanced spring mechanism provides a preload of 220 cN and a spring force of 900 cN, guaranteeing consistent performance under stress.
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Product
Innovative Open Standard
PROFINET
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PROFINET is the innovative open standard for Industrial Ethernet, development by Siemens and the Profibus User Organization (PNO). With PROFINET, solutions can be implemented for factory and process automation, for safety applications, and for the entire range of drive technology right up to clock-synchronized motion control. PROFINET is standardized in IEC 61158 and IEC 61784. Profinet products are certified by the PNO user organization, guaranteeing worldwide compatibility.
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Product
Switch Probes (Normally Open (NO)) F88706B300G300
1007249
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The Switch Probes (Normally open (NO)) F88706B300G300, with order code 1007249, is engineered for precision and reliability in various applications. Designed as a basic contact probe, it belongs to the F887-NO family and features a compact pitch of 4.00 mm (157 mil), making it ideal for tight spaces. With operational temperatures ranging from -45°C to +100°C, these probes are versatile enough to handle diverse environmental conditions. This precision probe offers a superior measuring capability with a switch travel of 1.70 mm and a nominal travel of 4.00 mm, ensuring accuracy within +/- 0.10 mm.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
Intrinsically Safe Test Tools For Hazardous Areas
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Intrinsically Safe is a protection method employed in potentially explosive atmospheres. Certificate IS tools are designed to prevent the release of sufficient energy to cause ignition of flammable material. IS standards apply to all equipment that can create one or more of a range of defined potential explosion sources.
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Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Area Scan Cameras
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Area scan cameras, also known as matrix cameras, are one of the most widely used technologies in industrial image processing. They capture images in two dimensions (the X and Y directions) and are ideal for applications requiring a complete image in a single capture.
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Product
PCI Express UltraScale+ FPGA Carrier Board With FMC+ Site, X16 PCIe Gen 4
PG4+
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The PG4+ continues DEG’s commitment to delivering high performance processing solutions for mission critical applications requiring the latest in AMD UltraScale+ FPGA computing power. The PG4+ is a PCI Express, standard form factor, FPGA processor board designed to meet the needs of challenging, embedded high-performance digital signal processing applications. The AMD UltraScale+ VU37P or VU47P delivers superior processing capabilities and supports operations such as: FFTs, FIR filters, fixed-point and repetitive processing tasks. The PG4+ FPGA node processes input from the FMC HPC + (Vita 57.4) site, allowing for maximum application configurability and performance when coupled with DEG’s market leading ADC and DAC FMC modules that operate up to 12 GSPS.
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Product
AM Open Path FTIR Air Monitoring Systems
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AM Open Path FTIR Air Monitoring Systems bring the versatility of multicomponent analysis and the immediacy of real-time results to a variety of field applications. Now you can avoid the "hit or miss" guesswork of point sampling and the inaccuracy and delays of "bag and carry" offsite analysis.
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Product
Switch Probes (Normally Open (NO)) F88617K300U200SM
1006214
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The Switch Probes (Normally Open (NO)) F88617K300U200SM, with order code 1006214, is designed to provide dependable performance for a variety of applications. Featuring a basic contact probe design, this product boasts remarkable technical specifications, including a pitch of 3.50 mm or 138 mil. This device can operate within a broad temperature range of -45°C to +100°C, ensuring versatility in various environments. With its family designation of F886-NO, the probe stands out due to its reliability and efficiency in signal detection, making it an essential component in electronic circuitry.
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Product
VNA & SWR Site Analyzers
6050
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SWR Site Analyzer with VSWR, Return Loss and FDR (Frequency Domain Reflectometer) measurements. VNA Site Analyzer with full Vector Network Analyzer measurement suite S11 and S21 ports, Spectrum Analyzer, Power Meter and FDR (Frequency Domain Reflectometer) measurements. Quickly shift between VNA and SWR/Return Loss only.
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Product
Switch Probes (Normally Open (NO)) F88617B350G350SM
1004228
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The Switch Probes (Normally open (NO)) F88617B350G350SM are engineered for precision and reliability in various applications. With a robust design featuring a family designation of F886-NO, these probes are capable of operating within a temperature range of -45°C to +100°C, making them suitable for demanding environments. They boast a continuity current rating of 10 A and showcase a typical contact resistance of just 50 mOhm, ensuring effective electrical performance under different conditions.
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Product
Test Solution Offering BER Testing
Eye-BERT Micro LR
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The Eye-BERT Micro LR is a low cost, easy to use test solution offering BER testing at any rate between 6.312 and 125Mbps on either optical or electrical interfaces. Features include: continuously variable bit rate, user programmable pulse generator, internal CDR with retimer mode, bit rate measurement, and recovered clock output. The Unit is supplied with anti-skid bumpers for bench use, and is small enough to be integrated into larger systems for dedicated link verification.
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Product
Switch Probes (Normally Open (NO)) F87511B064G135
1005249
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The Switch Probes (Normally open (NO)) F87511B064G135 is a highly versatile contact sensing solution tailored for precision applications. It operates seamlessly within a temperature range of -45°C to +100°C, making it suitable for diverse environments. This product is part of the F875-NO family and features a standard pitch of 2.54 mm (100 mil). With a robust design, it can handle a continuous current of 5.00 A and offers minimal contact resistance of 65 mOhm, ensuring efficient signal transmission.
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Product
Switch Probes (Normally Open (NO)) F88717K300U150
1030478
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The Switch Probes (Normally open (NO)) F88717K300U150 is specifically designed for various applications requiring precision and reliability. With a family designation of F887-NO, this probe is engineered to operate effectively within a temperature range of -45°C to +100°C, making it suitable for diverse environments. The device features a basic contact probe design, allowing for efficient electrical conductivity and minimal contact resistance, rated at just 40 mOhm. This ensures robust performance, crucial for high-precision tasks.
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Product
Open Standard Module (OSM)
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Advantech's OSM, the SGeT standard for PCB soldering design with NXP platforms, boasts an ultra-low power, miniaturized design for AIoT endpoints.
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Product
Test Set
TS® 19
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The Fluke Networks TS19 Test Set combines all the essential test set features at an affordable price. This test set was specifically designed for in-house telecom technicians. Its high impedance monitor prevents accidental disruption of service from clipping onto a data line while in monitor mode, thus ensuring the integrity of critical data lines.
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Product
Site Testing and Investigations
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EMC Technologies has a dedicated In-Situ test team that carries out EMC testing nationwide and in the Asia-Pacific region. Equipped with portable EMC test equipment, we are able to support a wide range of EMC emissions and immunity tests and measurements at your site.
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Product
EMI Testing
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Independent Testing Laboratories
ITL offers compliance and qualification testing for virtually any type of electronic product or system.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Microwave Testing
220
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The PICOPROBE® MODEL 220, a high performance microwave probe which incorporates a WR-5 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
