Accelerators
increase speed of an object.
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Probe Card Solutions
Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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Environmental Test Chamber
Shenzhen Bonad Instrument Co., Ltd.
Climatic Test Chambers are also referred to as environmental test chambers, which are the general name of various test equipment used to simulate the natural environments of raining, high temperature, low temperature, dewing, salt mist, illumination, dusting, etc. There are kinds of testers including constant temperature chamber, constant humidity chamber, ozone aging test chamber, UV accelerated weathering tester, vacuum hot air oven, salt spray chamber, steam aging tester, rain test chamber, dustproof test chamber, ventilation aging chamber, xenon lamp weathering test chamber and so on. BONAD provides various environmental test chambers. You are welcome to contact us. BONAD will provide you with professional technical consultation and high-quality testing equipment.
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High Temperature Charge Mode Accelerometers
Charge mode output accelerometers from PCB® use piezo-ceramic sensing elements that output an electrostatic charge signal proportional to the applied acceleration. These sensors can operate at extremely high temperatures because they do not contain the built-in signal conditioning electronics that limit the temperature range of ICP® accelerometers. Charge mode sensors are used in the testing of gas and steam turbines, jet engines, high power motors, exhaust systems and automobile engines where temperatures can range from 500° F (260° C) to 1200° F (649° C).
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Network Testing
Service Providers are under significant pressure as service revenues plateau, competition intensifies and traffic growth skyrockets. Service Providers have relied on Enghouse Networks automated network testing for decades because this mission-critical solution adds significant and tangible business value. The solution enables Service Providers to improve network reliability and performance, accelerate time to revenue for new services, minimize expensive truck rolls and improve customer satisfaction.
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Highly Accelerated Life (HALT) Test
HALT consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated life testing is performed to identify design weaknesses and problems prior to production. HALT subjects equipment to overstress conditions at a level which does affect life, but offers an advantage by reducing the design and development phases of a program.
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Wheel Torque Transducer
WTT-Dx
In automotive development, it is important to know the exact torques acting on the vehicle – especially under acceleration and braking maneuvers. With the WTT-Dx wheel torque transducer, a high-precision tool is available for making such measurements. The WTT detects the mechanical load directly where it is produced: the wheels that form the interface between the vehicle and the road.
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Machine Vision Camera - 0.4 MP, 291 FPS, Sony IMX287, Color
Blackfly S GigE
The Blackfly® S leverages the industry’s most advanced sensors in an ice-cube form factor. It is packed with powerful features enabling you to easily produce the exact images you need and accelerate your application development. This includes both automatic and precise manual control over image capture and on-camera pre-processing. On-camera features including IEEE1588 clock synchronization and full compatibility with popular third-party software supporting GigE Vision, gives system designers the tools to quickly develop innovative solutions. GigE models featuring Lossless Compression (LLC) are also available with higher maximum frame rates and lower bandwidth requirements, helping maximize output without compromising image quality. The Blackfly S is available in GigE, USB3, cased, and board-level versions.
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Accelerated Aging Testing
Accelerated aging is a testing method used to estimate the useful lifespan of a product when actual lifespan data is unavailable. This occurs with products that have not existed long enough to have gone through their useful lifespan: for example, a new type of car engine or a new polymer for replacement joints or medical products and packaging.
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Bump Tester
KD-163
King Design Industrial Co., Ltd.
*Comply with IEC-68-2-29 testing specification(10g/ 16ms、15g/6ms、 40g/6ms、100g/2ms).*Easy installation and simple operation; Low noise; no maintenance required; function holds long.*Well-designed and no resonant-structure, air anti- vibration pad can effectively isolate floor vibration.*Accelerometer adopts repeated measurement and adjustable half-sine wave generator; to control the data is precise.*Magnesium alloy platform is anodized, Servo motor cam to drive, and can adjust the frequency automatically.*The adjustable acceleration value and shock domain is patent design (1ms-13ms).
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Acceleration (Centrifuge) Testing
Environment Associates provides centrifuge equipment for acceleration testing. Our acceleration testing equipment measures 3 ft. (0.91 m) and a 6 ft. (1.82 m) lengths that provides constant accelerations of 50 Gs and can handle payloads of 20 lbs. to 50 lbs. The Acceleration Testing is also called G-Force Testing
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Composite Salt Spray Test Chamber
YWX/Q-010X
Composite Salt Spray Test Chamber stimulate the actual natural conditions to do accelerated corrosion test, all the testing are based on common states on the natural environmental: such as combine with salt spray, hot air drying, humidity, low temperature and so on. The test samples are widely used on the intense changes in the environment, like automobile parts, aviation equipment, building materials, coating, electric and electrical machinery so on. YWX/Q-150X series is full compliance with ASTM D4728I, EC 60068-2-1, IEC 60068-2-14 and EIA/JEDEC JESD22-110-B standard requirements etc.
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Multi-Layer Analyzer
VDSL Xpert™
The VDSL Xpert multi-layer analyzer breaks new ground as the only non-intrusive performance analysis solution for VDSL2 products. Built as a modular tool, the VDSL Xpert is designed for R&D and laboratory engineers engaged in the development and deployment of VDSL2 standard-compliant solutions. Utilizing VDSL Xpert accelerates time to market and return on investment by cutting significant time from VDSL2 development, deployment, debugging and interoperability verification.
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Dual-Axis Accelerometer For HS5 & 6 Handyscopes, +/- 2G
TP-ACC20-09
The Accelerometer is a low cost, low power, complete dual-axis accelerometer with signal conditioned voltage outputs. The output signals are analog voltage proportional to acceleration. The Accelerometer is capable of measuring both positive and negative accelerations to at least +/- 2G.
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Bridging And I/O Expansion Versatility. Rapid Hardware Acceleration For Improved Signal Control.
MachXO2
*Up to 256 kbits of user Flash memory and up to 240 kbits sysMEM™ embedded block RAM*Up to 334 hot-socketable IOs that avoid excess leakage*Programmable through JTAG, SPI, I2C or Wishbone*TransFR feature allows in-field design update without interrupting equipment operation*Programmable sysIO™ buffer supports LVCMOS, LVTTL, PCI, LVDS, BLVDS, MLVDS, RSDS, LVPECL, SSTL, HSTL and more
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SMARC
ROM-5420 B1
ROM-5420 SAMRC v1.1 Module integrates ARM Cortex-A9 NXP i.MX6 series ultra low power SoC and I/O solution chips to be OS support ready. NXP i.MX6 supports 2D, 3D graphics acceleration, full HD 1080P video decoding and an HD 1080p video encoding hardware engine.
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Assay System (Rest System for Longevity)
New polymers are constantly being developed and component manufacturing techniques appear, allowing the gradual replacement of metallic materials by plastics or composites, in various fields of application, in different industries. In particular, in the air conditioning, heating and water supply sector, plastic components are subject to the aging process due to the temperature to which they are subjected or due to the amount of oxygen in the fluids. The Test System for Longevity and Accelerated Aging Tests developed by Controlar allows to foresee, in accelerated test, the wear throughout the life of the plastic components of the hydraulic systems, in order to prevent eventual failures during the useful life cycle of the DUT.
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PXA Signal Analyzer, Multi-touch, 3 Hz to 50 GHz
N9030B
Accelerate innovation in demanding applications with measurement options that range from excellent to exceptionalExtend frequency up to 110 GHz with Keysight smart mixersCapture transient or intermittent signals with real-time spectrum analysisSimplify application-specific testing with X-Series appsPerform deeper troubleshooting with the 89600 VSA software
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EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Productivity Software
From simple connection to programmatic control, Keysight provides all the software tools necessary to accelerate the process. Compatible with the most common interfaces (GPIB, RS-232, LAN, PXI, and USB), Keysight's IO Libraries will quickly discover and configure instruments. Once the connection is established, Command Expert can control instruments using IVI-COM drivers and Standard Commands for Programmable Instruments (SCPI) Command Sets. Instrument drivers provide a higher-level and more abstract view of the instrument. IntuiLink software links an instrument to some PC applications. BenchVue software offers multiple instrument measurement visibility and data capture from a PC or mobile device with no programming.
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Vibration Test System
3-axis
This small 3-axis vibration test system has been developed in response to many customers' request for ?gcompact and easy to handle & use h multi-axis VTSs without sacrificing performances, featured by its small installation area of W900mm by D850mm, relatively quiet due to employment of small fans insterad of bolower(s), a displacement of 25mmp-p for each axis and max. transient acceleration of over 98m/s2<10G>*,
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LT-200A Aging-Life Test System For LEDs
Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Accelerate Semiconductor Development With IP-Centric Design
MethodicsIPLM
Methodics IPLM provides a scalable IP lifecycle management platform that tracks IP and its metadata across projects, providing end-to-end traceability and enabling effortless IP reuse. Learn more by connecting with an IP expert today.
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Packaged Freight Transport Environment Data Recorder
A recorder for recording actual traveling vibration acceleration data for electric servomotor type 3-axis vibration tester.
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Power Sensors
RTP5006
Providing the highest video bandwidth and fastest rise times, the 50 MHz to 6 GHz Power Sensor by Boonton is the ideal instrument for fast, accurate and reliable RF power measurements.This module is ideal for many different applications including Crest Factor and Peak to Average Power Ratio (PAPR) measurements for Power Amplifiers and RF components; Telecommunication & Satellite signals: W-CDMA, QAM, OFDM, LTE-FDD and LTE-TDD; WiFi signals: 802.11ac and legacy 802.11 a/g/n/b; RF and Microwave pulse modulated power measurements: RADAR, MRI, Particle Accelerators; General purpose scalar measurements such as gain and return loss using modulated and pulsed signals as well as CW; and Monitoring, Recording, ALC loops, transient phenomena.
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2U 19” Edge Server with Intel® Xeon® Scalable Silver/Gold Processors for 5G MEC Infrastructure Deployment
MECS-7210
The MECS-7210 Edge Server focuses on the edge of 5G networks to provide an open, white box platform for 5G Open RAN, private 5G networks, and a wide range of 5G MEC applications including smart cities, retail, manufacturing, autonomous vehicles, Argument Reality(AR), virtual reality(VR) and healthcare. As one of the first NGC-Ready validated and OTII compliant edge servers, the MECS-7210 is designed to meet stringent requirements by delivering a high level of deployment flexibility, reliability, scalability, and carrier-grade processing performance further augmented by hardware expansion. With a 420mm system depth in a small footprint 2U chassis, all I/O front access, wide operating temperature support (-5°C to +55°C), and dual FHFL PCIe expansion slots reserved for access to acceleration hardware such as GPU, FGPA and QAT adapters, ADLINK’s MECS-7210 is a high performance COTS platform that meets varying application and deployment requirements, and enables customers to focus on differentiating their end solutions.
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3U OpenVPX SOSA™-aligned PWM Servo Motor Drive
68PW1
The 68PW1 is a 3U OpenVPX SOSA™-aligned (basis, Snapshot 2) single-axis PWM servo motor drive that can be configured with closed loop feedback measurement options including Hall, Resolver/Synchro or Encoder. The PWM drive provides programmable PWM output drive (up to 65 V @ 10 A continuous) from a single +28 VDC input source. Ideally suited for rugged Mil-Aero applications, the 68PW1 delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Digital Current Integrator
The ORTEC Model 439 Digital Current Integrator was designed to accurately measure DC currents or the average value of pulse currents such as produced by accelerator beams. It digitizes the input current by producing an output pulse for specific values of input charge. A front-panel switch permit the selection of three different amounts of charge (10–10, 10–8 or 10–6 coulomb) required to produce an output pulse. The instrument has a digitizing rate from 0 to 10 kHz to provide wide dynamic range on each setting and high-resolution readout without meter interpolation.
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Acoustic Microscope
AMI P300
The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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FEC Accelerator Based On Intel® VRAN Dedicated Accelerator ACC100
PCIe-ACC100
ADLINK’s PCIe-ACC100 is a PCIe interface accelerator adapter developed based on Intel's vRAN Dedicated Accelerator ACC100 eASIC chip. It supports 4G and 5G codec acceleration, checksum rate matching, onboard 4G ECC memory, and hybrid automatic repeat request technology (HARQ). The PCIe form factor HHHL (half-height, half-length) can meet the needs of most application scenarios.
