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Product
In-Situ Spectroscopic Ellipsometer for Real-Time Thin Film Monitoring
UVISEL Plus In-Situ
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The UVISEL Plus in-situ spectroscopic ellipsometer can be easily mounted on process chambers (PECVD, MOCVD, sputter, evaporation, ALD, MBE) for the real-time control of thin film deposition or etch processes.The UVISEL Plus in-situ provides the unique combinations of very high speed, sensitivity, dynamic range and accuracy making the instrument able to control deposition / etch at the atomic layer thickness level, even for rapid processes.
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Product
Manual Tablet Testing Units
H-Series
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The manual lab testers of the H-series in the new LAB.line design combine state-of-the art technology with usability: round shapes, generous radii and smooth surfaces allow for easy and hygienic cleaning.Operation of the embedded touch display is simple and intuitive: you can change a product or view informative test results with just a few clicks.The H series consists of three unit variations with usually 500 N, alternatively 50 N or 1000 N. The H5 version offers to connect an external scale (Sartorius/Mettler). With the H5+ version, you can even perform high-precision measurements with the external thickness gauge module.
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Product
Thickness and Flaw Inspection
FOCUS PX / PC / SDK
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Olympus offers a complete advanced phased array integration solution that meets the requirements of your most demanding customers. The solution includes the FOCUS PX, a powerful and scalable acquisition unit; FocusPC, a powerful data acquisition and analysis software program; and three software development kits (SDK), FocusControl, FocusData, and OpenView SDK, to customize your software interface based on your application and control FocusPC for a fully automated inspection solution.
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Product
One-Piece Optical Sensor Head
OP
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Sciences et Techniques Industrielles de la Lumière
OP series consists of a one-piece optical sensor head for dedicated applications (e.g. long distance).The performance and specifications are dedicated to various applications in the industry.Typically integrated as OEM for measuring 3D shapes, glass thickness, autofocus, OP series fits a wide range of applications.
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Product
Ultrasonic Thickness Gauge
UTG-1500
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The new PHASE II UTG-1500 is a hand held microprocessor controlled ultrasonic thickness gauge specifically designed for measuring the thickness of metallic and non-metallic materials such as aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave-conductor as long as it has parallel top and bottom surfaces.
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Product
Laser Series
Jutze
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Jutze laser marker series is equipped with Panasonic high-quality laser units. The laser unit, coupled with Z axis control, makes it capable of handling different thicknesses of PCBs & components. Adjustable range ± 3mm.
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Product
Film Shrink Tester
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The Hanatek FST Film Shrink Tester is used to measure the effect of temperature on plastic films. The application of heat causes certain plastic films to rapidly contract; this effect can be used to seal and pack many items from food to consumer goods. The shrink effect is due to internal forces locked into the film during manufacture being released by heating, it is also known as linear thermal shrink or free shrink. The amount of shrinkage is dependent on the film type, thickness and sealing temperature. Testing the percentage shrink of a film ensures that it is suitable for a particular packaging application and establishes the correct temperature for that application.
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Product
Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
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The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
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Product
Thickness Gauges for Plastic films & Paper
CHY-CA
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CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Product
Thick Film Inspection
785
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For thicker coatings such as coal tars, extruded and tape coatings, the Model 785 has a range of infinite voltage settings from 1,000 to 15,000 volts.
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Product
Thin Film Analyser
TFA
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The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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Product
Advanced Packaging & TSV
FilmTek 2000M TSV
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Scientific Computing International
Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.
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Product
Through Hole Load Washer Load Cell Compression Only
LWO SERIES
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The LW0 Series are washer shaped, strain gage based load cells that have been most commonly used in fastener testing and thru hole load applications. Our stocked ranges from 2,400 through 300,000 lb compression are made from 17-4ph heat treated stainless steel and are matched to bolt diameters and their specific load characteristics. Modifications of diameters, thicknesses, or load range to a specific diameter for OEM applications are welcomed. The sensing element incorporates bonded foil strain gages of the highest quality and are sealed for protection against most industrial environments.
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Product
Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
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*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Product
Resistivity Meter
Model 2180
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The unit is compact and lightweight. The basic system is 7″ wide by 2.5″ high and 12″ long. When measurements are needed below approximately 100 micro-ohm-centimeters, the basic system is piggybacked onto a second enclosure that houses a power amplifier with a current gain of ten. The combined unit measures 7″ wide by 5″ high and 12″ long. The combined unit weighs 11.5 pounds. Two short cables interconnect the two enclosures for powering the power amplifier and routing the signals to the fixture or four point probe. The front panel of the basic system includes a 32-character backlit LCD display and a set of function keys. An easy-to-use menu will allow access to user defined parameters such as sample thickness, sample volume, and calibration constants; upper and lower alarm limits, relative measurements, and several others.
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Product
Ellipsometry And Reflectometry Systems
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Based on non-contact optical techniques, FilmTek tools simultaneously measure multiple-angle and multi-modal data to determine film thickness and refractive index. By measuring multiple angles of incidence, a wavelength shift is introduced between spectra collected at different angles. The wavelength shift between the spectra is only a function of the refractive index of the film and the angle difference between the spectra. By independently determining refractive index from a wavelength shift (as opposed to extracting index information from amplitude changes), FilmTek tools have best-in-class performance for film thickness and refractive index measurement. This level of performance allows FilmTek tools to address applications that otherwise may not be possible with more conventional ellipsometry or reflectometry methods.
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Product
Thick Film Passive Element
GBR-183
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GBR-183 series resistors are made in a thick film technology, on ceramic substrates(Al2O3 -96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-183 series elements are used both for general, and professional applications.
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Product
Distance Sensors
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SICK has a wide range of optic and ultrasonic solutions that measure from sub-microns to kilometers. They solve measuring, detecting and positioning applications using triangulation and time-of-flight modes. Sensors using triangulation are ideal for short-range, highly precise measurement. They can inspect miniature parts, thickness and shape, etc. Time-of-flight sensors work at longer distances, are not influenced by reflectivity or ambient light − perfect for positioning AS/RS, rail cars and gantry cranes.
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Product
Diode Submounts
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Ultra-precise patterning of thin film metals on dielectrics with high thermal conductivity are used for diode submount applications. Via the acquisition of Ion Beam Milling, Inc., SemiGen is the industry leader for laser diode submount fabrication. As each application is different, we work with customers to develop a custom design that perfectly fits their requirements. We have experience producing circuits utilizing substrates of varying thicknesses with high thermal conductivity such as alumina (Al), aluminum nitride (AlN), and beryllium oxide (BeO). SemiGen can deliver laser diode submounts with or without Au/Sn pads depending on your needs.
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Product
PosiTector Inspection Kits
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PosiTector Inspection Kits contain a PosiTector gage body (Standard or Advanced) and 3 probes – coating thickness, environmental and surface profile, as well as, accessories in a convenient hard shell carrying case.
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Product
Tactile Measuring Devices
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You want precise results easily, quickly and flexibly? We have the right tool for you with our tactile measuring devices. Benefit from the broadest probe portfolio on the market and get efficient software solutions for data transmission, data evaluation and data export with the Tactile Suite® and the Fischer DataCenter. Whether coating thickness measurement or materials testing: Discover the right solution for your application and your industry.
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Product
Falling Dart Impact Tester
FDI-01
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Jinan Leading Instruments Co., Ltd.
FDI-01 Falling Dart Impact Testeris applicable in the impact result and energy measurement of the falling dartfrom a certain height against plastic films and sheets with a thickness less than1mm, whichwould result in 50% tested specimen failure.
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Product
Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
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*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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Product
Terahertz Gauging And Imaging
TeraMetrix
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TeraMetrix is Luna’s platform for terahertz gauging and imaging, using pulsed terahertz waves to provide precise measurement of single and multi-layer thickness, density, basis weight and caliper thickness.
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Product
Glass Thickness Meters
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Shenzhen Linshang Technology Co., Ltd.
As a supplier of laser glass thickness gauge and glass thickness measuring tool, Linshang provides two models of glass thickness gauge that can be used to measure the thickness of various glasses, i.e: single-layer glass, double glazing, triple glazing, multilayer glass, LOW-E glass, and insulating glass, especially suitable for installed glass, such as doors and windows, curtain wall glass, etc.. It can measure the glass thickness as well as the thickness of air space (between the glass). The glass check works on the basis of reflection in the glass.
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Product
Thin Film Composition and Thickness Monitor
P-1000
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The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
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Product
Contacting Extensometers
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The contacting extensometers are designed for accurate strain and extension measurement of a material up to a maximum sample thickness of 25 mm.
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Product
Non-Contact Sensors
IRIX
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Sciences et Techniques Industrielles de la Lumière
IRIX™ is a family of non-contact sensors based on chromatic confocal technology capable of measuring distances and thicknesses on any material transparent to white light.IRIX™ is capable to measure simultaneously up to five layers of material. The controller can be used in combination with a large family of optical probes with different measurement ranges, mechanical dimensions and metrological specifications to best meet the most diverse application needs.
