Deep Packet Inspection
check to examine data within a packet. Also known as: DPI
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Deep Dive Application Monitoring
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Application performance management (APM) is critical to business success today. Dynatrace automatically sees and analyzes every single user transaction, all the time. All relevant metrics, environment changes, and application deployments are shown in real-time.
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Product
Customized Electrical Test Optical Inspection
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Landrex Technologies Co., Ltd.
Customized Electrical Test Optical Inspection
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Product
PosiTector Inspection Kits
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PosiTector Inspection Kits contain a PosiTector gage body (Standard or Advanced) and 3 probes – coating thickness, environmental and surface profile, as well as, accessories in a convenient hard shell carrying case.
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Product
Semiconductor Package Inspection System
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NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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Product
Inspection & Metrology Platform
Neon
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Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.
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Product
DFM (Deep and Fast Modulated) generators up to 280 GHz
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Insight Product Company offers DFM (Deep and Fast Modulated) mm-wave sources at frequencies from 30 to 280 GHz. DFM generators are designed to go swiftly from the generation to the non-generation mode and back. This process controlled by the external TTL signal. ON/OFF switch time is approximately 2 nanoseconds.
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Product
PDP Driver/Function Inspection System
SRV
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*Greatly Reduced Testing Tact Time*Cutting-Edge Inspection*Easy Operation
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Product
Wafer Inspection System
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JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Product
Compact Inspection Camera
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Fits in your pocket or clips on your beltAffordable1 meter drop-proofLong, thin camera-tipped probe with excellent depth of field penetrates tight, hard-to-reach spacesProbe is waterproof, holds its configured shape, and coils inside clamshell case for storageFour camera-lighting LEDs produce bright, crisp video on large color LCDFour screen controlsFour useful probe tip accessories (pickup hook, magnetic pickup, 45 mirror, thread protector)
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Product
Testing And Inspection Devices
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HEIDENHAIN offers testing and inspection devices that deliver all setup, monitoring, and diagnostic data needed for the analysis of its encoders. Grid encoders from HEIDENHAIN are ideal for machine tool inspection and acceptance testing, accurately measuring CNC machine tool movements in both static and dynamic inspection.
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Product
Thickness and Flaw Inspection
MultiScan MS5800
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Eddy current testing is a noncontact method used to inspect nonferromagnetic tubing. This technique is suitable for detecting and sizing metal discontinuities such as corrosion, erosion, wear, pitting, baffle cuts, wall loss, and cracks in nonferrous materials.
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Product
Purpose Built Network Packet Brokers
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Garland Technology’s Purpose Built Network Packet Brokers (NPBs) are devices that provide access to network traffic from multiple links, helping to centralize and improve efficiencies by sharing packets between the monitoring and security appliances. Additional NPB features include filtering, aggregating, regenerating, and load balancing.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Non-Destructive Test Resonant Inspection Station
RAM-TEST-FIXTURE
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The NDT Test Station, Model RAM-TEST-FIXTURE Resonant Inspection System is an ideal choice for testing when repeatable manual inspections are required. The innovative Test Station allows precise control of part positioning with an adjustable table ranging up to 6.25 inches (158.75 mm) in height.
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Product
Inspection Microscope/Video
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Connector end face contamination is a big problem with fiber optic cables and patch cords and it causes network issues. If you are a professional technician, you need a quality optical microscope. The magnification of connector end faces will allow you to discover any quality problems such as scratches. You need to make sure you have a clean connection with no dirt and debris. Visual inspection is fast, easy and simple. Using this test equipment can help avoid problems.
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Product
Protective Coating Inspection
Kit 5
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A more comprehensive kit than kits 1-4, the Elcometer Protective Coatings Inspection Kit 5 expands the range of instruments available to the protective coatings inspector.
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Product
X-Ray Inspection System
TruView™ Fusion
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The quality of your products is paramount to the success of your business. The TruView™ Fusion X-ray Inspection System allows you to "see inside" your products without destroying them, enabling unprecedented understanding of your manufacturing process. The TruView™ Fusion X-ray is the right solution if you are looking for a radiography system to inspect medical devices, printed circuit boards, electronic components, and mechanical parts.
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Product
Optical Inspection System
OIS Products
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A manual optical inspection system that is able to inspect the wire-bonded leadframe or substrate.
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Product
Inspection & Alignment Services
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As a leading provider of precision measurement services for power generation and turbo-machinery, API has the professional experience necessary to minimize the overall downtime of the outage or rebuild schedule. The ability to fully utilize API’s precision measurement capabilities, combined with experienced Service Engineers in the turbine alignment process, differentiates API for complex alignments.
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Product
For Real-Time X-ray Inspection Systems
Image Processors
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A number of image processing software packages are available. Features include frame averaging, measurement, text, label, marking, 3-D rendering, video recording and image storage. Additionally, BGA analysis and void measurement software can be added as well as other options. See our image processors for x-ray inspection machines below.
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Product
Measuring And Inspection Systems For Extrusion, Injection Molding & Calendering Of Plastics And Films
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Measuring and inspection systems from Micro-Epsilon are used in the plastics processing industry in order to ensure efficient production.
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Product
Magnetic Particle Inspection Systems for Non-Destructive Testing (NDT)
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VERIFY SURFACE AND SUBSURFACE STRUCTURAL INTEGRITY IN: Industrial Crankshafts, Ferrous Parts, Aircraft Components, Landing Gear Components.
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Product
Multibeam Echosounder - Deep Water
HydroSweep DS
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The HydroSweep DS is a deep water multiebeam echosounder ideally suited for seabed mapping in deep water up to full ocean depth based on a sonar frequency between 14 kHz to 16 kHz. Beside bathymetric depth information from 10 m to more than 11,000 m, sidescan data and backscatter data for seabed classification are acquired. The HydroSweep DS does not only gather sea floor information, but also uses adaptive bottom tracking windows to identify sonar targets in the water column and can be optionally operated as a parametric sub-bottom profiler without additional transducers and electronics.
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Product
Analytical Gear Inspection Machine
KNM 2X / 5X series
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Analytical gear inspection machine for workpieces up to Ø 650 mm. Measuring machines for spur and helical gears, rotors, bevel gears, gear tools, shafts etc. Ultimate highly precise measurement of smaller size gears in the lab or on the shop floor - no foundation required.
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Product
Magnetic Particle Inspection
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Shanghai Xianda Denshijiki Industry Co.,Ltd
Using the "leakage magnetic flux" phenomenon generated from the scratches, the magnetic powder (or fluorescent magnetic powder) of the ferromagnetic material scattered on the surface by magnetizing the specimen is adsorbed to the scratch. Observe this and detect scratches.
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Product
Video Inspection Station with Measuring
VIS310
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Video Inspection Stations are available with?or without on-screen measurement capabilities?and offer?an excellent way to evaluate or test small works or items in?difficult to access locations.? As todays electronic and mechanical systems keep getting smaller, it becomes impossible to test or measure these products with traditional methods. For many applications, from development to production testing, video based inspection can help maintain quality control. Many of these systems are used in labs for development or used in production for testing production samples.
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Product
Wafer Inspection System
INSPECTRA® Series
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INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Product
In-Process Wafer Inspection System
7945
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Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
