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Thin Film Circuits
SemiGen offers build-to-print services for a wide range of materials and metallization schemes. We use our processing technology to fabricate circuits on As-Fired Alumina, Polished Alumina, Superstrate TPS, Aluminum Nitride, Beryllium Oxide, Fused Silica/Quartz, Sapphire, and Hi-K Dielectrics.
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Semiconductors on Film-Frame
Ismeca NY32W
32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enables extended autonomous operation and productivity.
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Uncured Powder Film Comb
155
This enables the application system to be set up and fine tuned prior to the curing process. In turn, this will reduce the amount of scrap and over-spray.Place the comb into the powder and slide the comb along the surface. The measurement points (or teeth) are pointed and allow the powder to flow around them.
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Gas Permeability Tester with Differential Pressure Method
GPT-203
GPT-203 Gas Permeability Tester is based on the differential pressure method and is professionally applicable to the determination of permeance and permeability of plastic films, composite films, high barrier materials, sheeting, metal foils.
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Thin Film Design Software
Scientific Computing International
SCI offers software tools for optical thin film design, material analysis, ellipsometry, and spectrophotometry. SCI’s current standalone optical thin film software includes:
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Programmable Step Attenuator, DC to 40 GHz, 0 to 11 dB, 1 dB steps
84904L
The Keysight 84904L programmable step attenuator offers coaxial measurements to 40 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 11 dB in 1-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with with only 2.4 dB of loss at 40 GHz. The compact size of the unit, 35% smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Surface Quality Monitors
PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Hot Tack Tester
Guangzhou Biaoji Packaging Equipment Co., Ltd.
GBPI Hot Tack Tester To test the sticking strength of packaging films after heat sealed with different temperature, pressure and time. It simulates the use of packaging bag and makes impact experiment on the part of hot tack.
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PCIe Gen3 Full HD, High Speed, Compact Camera for Testing
CB019CG-LX-X8G3
Full HD, High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Thru-beam Type Ultrasonic Sensor
US-N300
Panasonic Industrial Devices Sales Company of America
The Panasonic Thru-Beam Type Ultrasonic Sensor is suitable for detecting transparent film or objects.
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Sputtering Systems
Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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In-Situ Spectroscopic Ellipsometer for Real-Time Thin Film Monitoring
UVISEL Plus In-Situ
The UVISEL Plus in-situ spectroscopic ellipsometer can be easily mounted on process chambers (PECVD, MOCVD, sputter, evaporation, ALD, MBE) for the real-time control of thin film deposition or etch processes.The UVISEL Plus in-situ provides the unique combinations of very high speed, sensitivity, dynamic range and accuracy making the instrument able to control deposition / etch at the atomic layer thickness level, even for rapid processes.
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RF Amplifiers
UST specializes in the testing, repair and refurbishment of all types of RF amplifiers (broadband and narrowband), microwave amplifiers and millimeter-wave amplifiers: solid state, thin film, traveling wave tube (TWT), low noise RF amplifiers, intermediate power RF amplifiers, limiting RF amplifiers, doubler RF amplifiers, driver RF amplifiers, variable gain RF amplifiers, and active frequency multipliers.
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ADT-01 Primary Adhesive Tester
Jinan Leading Instruments Co., Ltd.
ADT-01 Primary Adhesive Tester is applicable in primary adhesive tests of pressure sensitive adhesive tapes, adhesive bandage (plaster), label, protective films and other products.
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Shore A Type Hardness Tester Rubber Hardness Tester
HS-A
Shenzhen Chuangxin Instruments Co., Ltd.
HS-A is a digital Shore A type hardness tester. It is suitable for plastic (such as film, medical appliance, etc.), synthetic rubber(such as seals, tires, rubber roller, rubber hose/belt, wire and cable, shock absorber, etc.) and other related chemical products.
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CWDM Mux/Demux in LGX Box(4,8,16,18-Channel)
Flyin Optronics’ Coarse wavelength division multiplexer (CWDM Mux/Demux) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path.
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Coating Thickness Gauge
456
The Elcometer 456 dry film thickness gauge is available in four different models. Each thickness gauge provides the user with increasing functionality - from the entry level Elcometer 456 Model E, to the top of the range Elcometer 456 Model T.
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Densimeter
H-300 S
Hildebrand Prüf- und Meßtechnik GmbH
The Hildebrand Densimeter Model H-300 S is a cost efficient instrument for calculating the specific gravity with a superior resolution of 0.001. The system is suitable for checking plastics, rubber, films, liquids, sintered metals, ceramics, glass and other non-metal materials. The value is displayed automatically after the elapsed time.
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ALD Services
Our ALD Services help engineers optimize, troubleshoot, and scale their processes, covering everything from custom process development to equipment calibration and advanced film characterization.
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Thin-Film Thickness Measurement Systems
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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kSA RateRat Pro
kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
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Transmissive Rotary Disk
DISK-1
US Digital offers a wide variety of standard rotary encoder disks. They may be ordered as a stand alone disk (see below) or as a codewheel (see the Disks page). These rotary encoder disks are made from mylar polyester film. This material allows for a wide temperature range and is virtually unbreakable. There is no minimum order.
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Basic Digital Systems
The Medical Imaging System can be configured simply by installing the FCR Reader, the CR Console, and the Imager to your existing X-ray equipment. The Imager uses the dry film for output and therefore does not require a dark room as in conventional systems thus saving space. Also, the scanned image can be digitally saved to media and not on films, thus not much storage space is required.
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Spectroradiometer
SpectraScan® PR-670
The SpectraScan® Spectroradiometer PR-670 is JADAK’s enhanced economical portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Tensile Test Chambers
Tensile strength tests are an integral part of material development. Materials that require this test include various metals, plastics, paper, fabrics, fibers, composites, and films for many industries. ESPEC tensile test chambers are designed to work with any tension apparatus and can be customized to meet unique application needs.
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High Voltage Thick Film Chip Resistors
HVTK (HVR)
*Highly reliable multilayer electrode construction*Higher component and equipment reliability*Excellent performance at high voltage*Reduced size of final equipment
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Gradation Heat-Sealing Instrument
HST-02
Jinan Leading Instruments Co., Ltd.
HST-02 Gradation heat sealing instrument candetermine five groups of seal parameters at one time including heat sealtemperature, time and pressure of plastic films, laminated films for flexible package, coating paper, and so on. Different melting point, heat stability,fluidness, and thickness of heat seal materials bring various heat sealproperties and different seal technique parameters as well. With thisinstrument users can get the best heat seal parameters accurately andefficiently.
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Disk Peel Tester
DRK186
Shandong Drick Instruments Co., Ltd.
DRK186 Disk peel tester is applied to test the ink layer bonding strength of plastic film printing and PT print. To test the surface adhesion state of vacuum coating, surface coating, composite process.
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Thickness Gauges for Plastic films & Paper
CHY-CA
CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
