Radio Test Sets
See Also: TPS
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Product
Universal Test Set
UTS
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The Universal Test Set (UTS) is a portable, battery-powered, programmable, ruggedized radio frequency test set designed to validate improvised explosive device (IED) jamming equipment. Our unit is intended to provide an in-field confidence testing for warfighters employing IED jammers prior to departure.
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Product
5G Radio Test Set
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Operating from 20 to 40 GHz, two radios may be connected to the system allowing full duplex operation. Each radio may operates over identical Air Interface with uni or bi-directional multipath. The delays between radios may be varied from 0 to 1 mile in 5 foot steps with propagation loss control. The 2040+ creates a variable test range right in your lab. It can be used as a design aid and as a test tool for new modulation and encryption schemes prior to expensive and time consuming field testing.
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Product
Radio Test Set
CMA180
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With its frequency range from 100 kHz to 3 GHz, the R&S®CMA180 is ideal for testing all common analog and digital radio systems. Input levels up to 150 W are no problem for the R&S®CMA180. The flexible internal switching capabilities for the audio and RF paths make the R&S®CMA180 suitable for a wide range of test requirements. Users can configure the internal generators, external audio sources, filters and measurements according to the given application. In the predefined test scenarios for receiver, transmitter and duplex tests, the RF and audio paths are preconfigured. This saves time and eliminates configuration errors for standard test cases.
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Product
Tactical Radio Test Set
CTS-6100
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The CTS-6100 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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Product
Universal Radio Test Set for FM and AM Radio Stations of the VHF Band
RST-430
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RST - 430 Radio-Communication Service Tester is designed for maintenance and repair of FM and AM radio stations operating in the HF and VHF bands. It is a multipurpose radio measuring device for maintenance of communication equipment in indoor and field conditions.
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Radio Test Set
CTS-6000 Series
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Bring your radio test function into the modern age with the new CTS-6000 Series radio test set. Combining nineinstruments into one, this tester offers fault detection and operational verification of your radio communicationssystem whether in the factory, at the depot, or deployed in the field.
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Product
USRP‑2930, 20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device
781910-01
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20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device - The USRP‑2930 is a tunable RF transceiver with a high-speed analog‑to‑digital converter and digital‑to‑analog converter for streaming baseband I and Q signals to a host PC over 1 Gigabit Ethernet. It also features a GPS-disciplined oscillator (GPSDO) with PPS accuracy of ±50 ns. You also can use the NI USRP‑2930 for the following communications applications: white space; broadcast FM; public safety; land-mobile, low-power unlicensed devices on industrial, scientific, and medical (ISM) bands; sensor networks; cell phone; amateur radio; or GPS.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
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The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
USRP-2955, 10 MHz to 6 GHz, 80 MHz Bandwidth, GPS-Disciplined OCXO, Reconfigurable USRP Software Defined Radio Device
785264-01
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The USRP-2955 provides an integrated hardware and software solution for rapidly prototyping high-performance wireless receiver systems. It is designed for over-the-air signal acquisition and analysis. It features a two-stage superheterodyne architecture with four independent receiver channels and shares local oscillators for phase-coherent operation. It also offers a Kintex-7 FPGA programmable with the LabVIEW FPGA Module. With these features, the USRP-2955 has the RF and processing performance for applications such as spectrum monitoring, direction finding, signals intelligence, wideband recording, and radar prototyping. The USRP-2955 is equipped with a GPS-disciplined 10 MHz oven-controlled crystal oscillator (OCXO) Reference Clock, which improves frequency accuracy and synchronization.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
EOL RF Functional Test
AS652
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With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Military Communications Test
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Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Mixed Signal Battery Test System
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The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
PXI Digital Test Instrument
PXIe-6943
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
VXI Digital Test Instrument
T940 Series
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The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Product
ARINC-708 Module
M4K708
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The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
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Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
