Interface Test Adapters
Interface Test Adapter; Interface Connector Adapter: Interface Device Also known as: ITA
See Also: Test Adapters, Interface Adapters, ITA
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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PXIe-1486, 8 Input, 8 Output, or 4 Input/4 Output PXI FlexRIO FPD-Link™ Interface Module
787454-01
The PXIe-1486 combines the Texas Instruments Flat Panel Display Link™ (FPD-Link™) interface with the Xilinx FPGA for high-throughput vision and imaging applications. This module provides a high-speed digital interface for using and testing modern advanced driver assistance systems (ADAS) and autonomous drive (AD) camera sensors and electronic control units (ECUs). Additionally, the PXIe-1486 makes use of a combination of FPD-Link™ serializers and deserializers with a Xilinx FPGA to provide a high-throughput and customizable FPD-Link™ interface on PXI. The included FlexRIO driver, with LabVIEW FPGA examples, provides access and control for power-over-coax, I²C back-channel communication, and general-purpose input/output (GPIO) communication on the FPD-Link™ channels. The PXIe-1486 is ideal for applications such as in-vehicle data logging, lab-based playback, or hardware-in-the-loop (HIL). FPD-Link is a trademark of Texas Instruments.
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, to Two 68 Pin Male VHDCI
510140114
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to Two 68 Pin Male VHDCI
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Tool, Adapter, Holding Fixture Adapter AT-1319-29
910121149
Used with Raychem holding fixture to aid in the solder process for Mini-Coax Solder sleeve contacts. Both fixture and adapter are included in Solder Kit Part # 910121144.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, To PCB-Mounted 6x32-Pin Ribbon Cable Headers
510150155
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 6x32-Pin Ribbon Cable Headers
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Mini USB (90º) To 90 Series Interface (R)
J90USBS
Use in Receiver SideTripaddle modules VPC 510104136 required
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Interface
RPCIE-1553
Abaco Systems RPCIE-1553 is the latest generation of performance and flexibility for MIL-STD-1553 A/B Notice II on a native PCI Express module. Available in -40°C to +70°C temperature with one, two or four dual-redundant channels, the RPCIE-1553 includes advanced API (Application Programming Interface) software that reduces application development time.
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Adapter Plate, Receiver, f/ G20x or G40x
310113606
The G20x Adapter Plate allows the G20x or G40x Receiver to accept 2 modules (iCon) in the lower tier.
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PXIe-1487, 8 Input, 8 Output, or 4 Input/4 Output PXI FlexRIO GMSL™ Interface Module
787458-01
The PXIe-1487 combines the Maxim Integrated Gigabit Multimedia Serial Link™ (GMSL™) interface with the Xilinx FPGA for high-throughput vision and imaging applications. This module provides a high-speed digital interface for using and testing modern advanced driver assistance systems (ADAS) and autonomous drive (AD) camera sensors and electronic control units (ECUs). Additionally, the PXIe-1487 makes use of a combination of GMSL™ serializers and deserializers with a Xilinx FPGA to provide a high-throughput and customizable GMSL™ interface on PXI. The included FlexRIO driver, with LabVIEW FPGA examples, provides access and control for power-over-coax, I²C back-channel communication, and general-purpose input/output (GPIO) communication on the GMSL™ channels. The PXIe-1487 is ideal for applications such as in-vehicle data logging, lab-based playback, or hardware-in-the-loop (HIL). GMSL is a trademark of Maxim Integrated Products, Inc.
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MIL-STD-1553 Module
QPM-1553
The QPM-1553 provides the highest level of performance, flexibility and interface density for MIL-STD-1553A/B on a PMC (PCI Mezzanine Card) module. The QPM-1553 is integrated with powerful software that reduces development time. All 1553 databus functionality is supported from our advanced API (Application Programming Interface).
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Embedded Avionics Interfaces
Versatile interfaces that enable embedded systems and computers to communicate with avionics databus networks.
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Interface Panel for SLSC
THROUGHPOINT™
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.
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PXI Interface Module, AIT ARINC 429
M3407A
Interface to the LRU in avionics test solution 4, 8, 16, or 32 software programmable Tx/Rx channels with full error injection/detection Programmable high/low speed operation Real-time recording and post analysis of multiple channels Concurrent operation of all Tx/Rx channels PXI triggers, star trigger, and PXI 10 MHz clock
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Pull-Thru Adapter, Wired, TriPaddle, 68 Pin ML VHDCI, f/ AIT PXI-C1553
510140197
Pull-Thru Adapter, Wired, TriPaddle, 68 Pin ML VHDCI, f/ AIT PXI-C1553.
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PXIe Remote Control Interface Module
43-921-003
The 43-921 PCI Express-to-PXI Express expansion kit provides control of PXI Express modules installed in a PXI Express chassis using high bandwidth PCI Express technology. The extension kit can provide up to 4GB/s using PCIe Gen 2 x8 signalling.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Mini Coax, Contact, Receiver, RG316
610104114
Primary mating contact 610103115. (May mate with other ITA contacts, as well.)*This contact available as a patchcord only. Please select link below to configure a patchcord.Mechanical SpecificationsDurability 20,000 cyclesContact Material Shield – BrassCenter Conductor – BeCuContact Plating Shield – 50µ" Au over 100µ" NiCenter Conductor – 60µ" Au over 100µ" NiContact Termination Center Conductor - SolderShield - CrimpInsulator PTFEMating Force 1.5 lbs max [0.68 kg]Electrical SpecificationsCharacteristic Impedance 50ΩFrequency Range DC to 1 GHzVSWR ≤ 1.06 @ 1 GhzInsertion Loss 1.2 dB @ 1 Ghz1.02 dB @ 500 MhzDWV 1500 VDC Min.Contact Resistance ≤ 5 mΩCable Specifications RG316Environmental SpecificationsOperating Temperature -50°C to +105°CInsulation Resistance 1000 MΩ min.
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Attenuator Interconnect Kit, 3.5 mm
11716E
The 11716E attenuator interconnection kit provides the necessary parts to connect 84904K and 84906K programmable step attenuators in series.
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High Speed Digital Analog
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
510140194
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Interface Board, Low Cost, 8:1 Ethernet RJ45
40-965-901
Low cost converter card for 40-736 Data Communications Multiplexer. Adapts the 78-Pin D-type connector on the front of the module to 9 RJ45 sockets. Allows the multiplexing of up to 8 Ethernet signals with speeds up to 1G bit.
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Keying Pin Kit, ISeries, Receiver And ITA
310113461
The iSeries keying pin kit includes a set of two hex keys. One hex key will allow 6 different options and two can provide 36 different keying options. The keying kit provides a way to isolate your connectors to prevent operational mismatch.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
