Correlators
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Calibration and Test Equipment Management
Is every value precise? The comparability of measurement results has never been more important than in the present era of globalization. The ability to reduce variables to basic units is the fundamental prerequisite to objectively guarantee, increase, and optimize quality. Our calibration service guarantees full correlation to national standards for test equipment of all physical variables – either at our laboratory or on your premises (for measuring tools).
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Hydrogeology
HAPPIE
The H.A.P.P.I.E. program (Hazard of Aquifer Pollution Potential Impact Evaluation) provides a conservative answer to the problem of determining risk levels in emergency conditions, which means that areas where illegal waste disposal sites, overflows and ruptures of impermeable sheeting are present and where water withdrawal should be discontinued can be identified. H.A.P.P.I.E. in fact offers a conservative response to the problem of the determination of the environmental impact in critical conditions that can usually be correlated to the requirements of defining areas in which the supply operations should be interrupted in emergency conditions, therefore in very short times and without the possibility of obtaining an accurate collection of the hydrogeological data.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PXIe-6259, PXIe, 32 AI (16-Bit, 1.25 MS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779778-01
The PXIe-6259 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Test Services
Our services cover all aspects of test, from test plan generation; to hardware and software development; to validation, correlation, ramp and production. Our experts have deep experience in digital, memory, mixed-signal and RF applications. We also specialize in secured applications that require personalization/root of trust during backend production.
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Fibre Channel, Ethernet, & MIL-Firewire Protocol Analyzer
Cipher
Avionics Interface Technologies
Supports Multiple Network Protocols including Ethernet, FibreChannel, & MIL-Firewire (AS5643) - High Performance Filtering & Search - Built-in protocol decoders for: FC-AE-ASM, FC-AE-RDMA, FCAE-1553, AS5643, Ethernet, IPv4, IPv6, UDP - User defined “protocol decoders” for custom & proprietary protocols - Database architecture for handling very large data sets - Multiple, Simultaneous views of data sets with time correlation of data across multiple views. - Compatible with common network analysis tools such as - Wireshark (e.g. Imports/Exports to PCAPNG) - Compatible with AIT’s Fibre Channel Test - Instruments for live capture, triggering, and filtering.
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Soil Mechanics
INSITU
The INSITU program interprets statical and dynamical geotechnical in situ tests. In order to interpret the SPT tests, the program utilises the main correlations that are normally used to determine the geotechnical parameters of a soil. One should enter the geometrical and geotechnical parameters pertaining to the stratigraphy surveyed trough drilling and the number of blows relative to each test; some corrective parameters can be entered that enable one to limit the perturbations in the interpretation of the data caused by the way the test is performed and the type of instrument that is used.
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Wafer ESD Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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PCI-6221, 16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device
779066-01
The PCI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Modulation Distortion Up To 8.5 GHz
S930700B
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Analysis System
Pegasus (EDS-EBSD)
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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AFM Optical Platform
OmegaScope
The OmegaScope is a state-of-the-art turn-key solution that combines Optics and ultra-resolution multi-range research AFM. The OmegaScope AFM is an advanced research instrument that provides path for researchers in spectroscopy and photonics. It is available in reflection configurations providing direct top and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution spectroscopies (Raman, Photoluminescence, Fluorescence) and AFM imaging modes.
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VIS/NIR Sensor
AF26
The AF26 is a high precision dual channel color sensor for inline operation; the secondary wavelength is designed to compensate the desired light absorbance measurement from any undesired light scattering influence, such as suspended solids, gas bubbles, immiscible fluids or window fouling. The AF26 sensor’s output can be correlated to almost any color scale including APHA and Hazen.
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Single Shot Third-order Cross- Correlator
Rincon SS
Specifically developed for measuring a wide array of output parameters from ultrafast laser systems including: contrast ratio of laser pulses, determining pulse pedestal, pre- and post-pulses, and amplified spontaneous emission in femtosecond systems.
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Modulation Distortion Up To 43.5 GHz
S930704B
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Modulation Distortion Up To And Beyond 125 GHz
S930713B
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Measuring Wheel
B20-S
Simple and light Measuring Wheel B20-s can measure up to 10,000m at 10cm graduation.The counter is indicated in 5 digits and has reset button. When we use Leak Noise Correlator LC-2500, we need to input the between pick-up sensors.
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STEREO PERFORMANCE METER
SPM-1
The SPM-1 measures the stereo content present in any left and right audio program material. It measures 0-50 dB separation on live program material by cross correlating the right and left base-band audio information.
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Spectroradiometer
Spectroradiometer is usually used with a integrating sphere to measure the photometric and colorimetric parameters of all kinds of lamps. Relative spectral power distribution P(λ), chromaticity coordinate (x,y), (u,v), correlated color temperature Tc, color rendering index Ra, dominant wavelength, peak wavelength, spectral bandwidth, color purity, color ratio, SDCM, luminous flux, etc.
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PCI-6280 , 16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device
779108-01
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Active Monitoring or Synthetic Transactions
CloudReady
Always-on, end-to-end user experience monitoringNo complex scripting required, Exoprise maintains the actions the sensors takeMonitors app performance via both Web UI and API transactionsFull network path performance information for correlation and outage detection
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Frequency Response Analyser
DP-cPCI-7554
DP-cPCI-7554 is a cPCI module capable of analyzing the phase and gain characteristics of a system. The system under test is stimulated by the user defined waveform. The obtained response is correlated with the applied stimulus by the on-board DSP processor to determine the phase difference and the gain.Gain and the face analysis is carried out only at sine waveform.
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Portable CCD Spectroradiometer
LMS-6000
The Portable CCD Colorimeter Spectroradiometer has the following versions which can measure different parameters: • LMS-6000: illuminance (lux), E(Fc), Ee(W/m2), Tc (K), Duv Correlated Color Temperature (CCT), Chromaticity Coordinates, CRI, Purity, Peak Wavelength, Dominant Wavelength, Half Bandwidth, Center Wavelength, Centroid Wavelength, Total Color Difference, Brightness Difference, Red-Green Degree, Yellow-Blue Degree, CCT Difference, SDCM Diagram, Spectrum Diagram • LMS-6000L: cd/m2, fL, Tc (K), Duv Correlated Color Temperature (CCT), Chromaticity Coordinates, CRI, Purity, Peak Wavelength, Dominant Wavelength, Half Bandwidth, Center Wavelength, Centroid Wavelength, Total Color Difference, Brightness Difference, Red-Green Degree, Yellow-Blue Degree, CCT Difference, SDCM Diagram, Spectrum Diagram • LMS-6000P: LMS-6000 Parameters+PAR, PPFD, YPFD, Blue-purple irradiance Eb, Yellow-green irradiance Ey, Red-orange irradiance Er, Ratio of red and blue radiation Erb_Ratio • LMS-6000S: LMS-6000 Parameters+PAR, PPFD, YPFD, Blue-purple irradiance Eb, Yellow-green irradiance Ey, Red-orange irradiance Er, Ratio of red and blue radiation Erb_Ratio, Rf and Rg according to TM-30 • LMS-6000F: LMS-6000 Parameters+Flicker test • LMS-6000B: LMS-6000 Parameters+Blue Light Hazard Weighted Irradiance according to GB/T20145, CIE S009/E:2002 • LMS-6000BF: LMS-6000 Parameters+Flicker test, Blue Light Hazard Weighted Irradiance according to GB/T20145, CIE S009/E:2002
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Global Network Monitoring and Incident Response
NetOmni™
NIKSUN NetOmni™ collects information (e.g., Logs, NetFlow, SNMP, Packets, etc) from all network applications, services, and their underlying infrastructure and prioritizes key service delivery, security, and compliance metrics. This enables powerful correlated dashboards and workflows from a single pane of glass.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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PXI-6254, 32 AI (16-Bit, 1 MS/s), 48 DIO, PXI Multifunction I/O Module
779118-01
The PXI-6254 offers analog input, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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ARINC 429 Test And Simulation PCIe Module
PCIe-C429
*4, 8, 16 or 32 software programmable TX / RX channels*X4 lane PCI Express host interface*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Fibolocator
Fibolocator is an innovative device for measuring and characterizing breaks and other backscattering-causing faults in optical fibers. Time-resolved correlation reflectometry is the principle on which the device is based. It analyzes the backscattered light like a pulse OTDR, but unlike such OTDRs, cw laser diodes are used. The requirements for the test signal and the complexity of the system are low, which leads to very low costs for OEM subsystems.
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Motor Test for Stepping Motors
*Stable measurement: Since it uses Prony braking, this model provides stable measurement unaffected by moments of inertia and no coupling loss. In addition, the resulting measurements allow data correlation via the traditional double-balance method.*Precision measurement method: This model’s judgment of synchronization loss achieves high stability using algorithms developed by Sugawara Laboratories. Measurement mode can be chosen based on step angle. For pull-in torque, startup can be measured consistently from the holding state. Allows measurement at 1-Hz resolution.*Broad measurement range: This model offers a range of seven available measurement heads, from 0.5 N to 50 N, allowing use for high-precision measurements. Through selection and use of pulleys, this model can also be used to measure small motors of 0.5 mN·m or less or 500 mN·m motors. Pulley diameters and other settings are easily configured using a personal computer running Windows®. Note: Any of the seven available heads may be attached to a single measurement component.*High-visibility measurement data: Motor characteristics are easily ascertained on automatically plotted performance graphs. Measurement data can be overlaid up to four times. In addition, the cursor can be used to read accurate values from measurement points. Hard copies of data displayed on-screen can be printed from a personal computer.*Can be controlled using standard personal computers: Allows control of measurement operations and display and storage of data from a standard personal computer running Windows®. Data is stored in CSV-format files for compatibility with other software applications.
