Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
-
Product
Regenerative Power System, 1000 V, ±60 A, 20 KW, 400/480 VAC
RP7972A
-
The RP7972A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
-
Product
Keysight Dual/Quad 4x8 Reed Matrix for 34980A
34933A
-
The Keysight 34933A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 2-wire configurations 64 2-wire or 128 1-wire cross-points High-speed reed relays Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter ±150 V peak, .5 A switch, 1.5 A carry current
-
Product
NI-9229, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module
779785-01
-
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
-
Product
Regenerative Power System, 500 V, 20 A, 5 kW, 400/480 VAC
RP7961A
-
The Keysight RP7961A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
-
Product
Regenerative Power System, 500 V, 40 A, 10 kW, 400/480 VAC
RP7962A
-
The RP7962A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
-
Product
Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
-
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
-
Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
-
The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
-
Product
Keysight Dual 4x16 Armature Matrix for 34980A
34932A
-
The Keysight 34932A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x16, 8x16, or 4x32 configurations 128 2-wire cross-points 300 V, 1 A switch; 2 A carry current Connections to the internal DMM Latching armature relays, with relay counter Expandable via four 2-wire analog buses
-
Product
1kV, 120 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3106A-NOACC
-
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
-
Product
CDNs - Coupling Decoupling Network
-
Coupling Decoupling Networks, commonly called CDNs for IEC-61000-4-6 conducted immunity testing, serve the purpose of Injecting common mode disturbances These CDNs also ensures these signals do not interfere (decoupling) with auxiliary equipment connected to the device under test (DUT)
-
Product
DUT Prototype Board
DPB8800
-
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
-
Product
2 GHz Dual 1:4 RF Mux, 50 Ohm Module for 34970A/34972A
34905A
-
The Keysight 34905A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation.
-
Product
Quad 4x32 Reed Matrix for 34980A
34934A
-
The Keysight 34934A module for the 34980A Multifunction Switch/Measure Unit offers the highest density matrix for connecting paths between your device under test and your test equipment, allowing for multiple instrument connections to multiple points on your device under test at the same time.
-
Product
Manual Power Supply Network Manual
KH3766
-
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
-
Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
-
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
-
Product
Modular Power
RFP DC Load
-
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
-
Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
-
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
-
Product
PXI Matrix Switch: 4x32, 2-Wire, 100Vrms/2A, Armature Relays
M9120A
-
The M9120A high-density matrix offers higher voltage switching of multiple channels in a single instance. Any row can be connected to any column, making it ideal for routing instrument signals to the device under test. This 2-wire switch matrix provides the durable armature switches allowing multiple channels to be connected at one time, up to 60W per channel. The 4-wire wide bus can be used to route signals between test instruments and the device under test. Choose from the durable connector block or standard cable connections.
-
Product
Test Probe
-
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
-
Product
Error Detector Remote Head 32 and 17 Gb/s
N4952A
-
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
-
Product
6kV, 100 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3605A
-
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
-
Product
Multi-Channel Attenuation Control Unit (4-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7204A
-
The J7204A is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204A reduces cost of ownership and provide the best measurement accuracy.
-
Product
PXI 8/16-Channel Isolated D/A Converter
M9185A
-
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
-
Product
Power Quality Analyzer
PQM-711
-
PQM-711 power quality analyzer is an advanced product for wide type of measurements, analysis and recording of network parameters 50/60 Hz and the power quality diagnostic according to European standard EN 50160. PQM-711 is an innovative model with a wireless communication Wi-Fi , which allows for automatic pairing with the included tablet, with a large 10" touch screen. Tablet allows full operating of the analyzer, live data preview and the reading and analysis of data stored in the internal memory. With this solution, the PQM-711 is an unique device that combines the advantages of the analyzer with built-in display and typical portable analyzers (known as Black Boxes).With the tablet you can very fast checked the device under test. On the other hand, you can leave the analyzer module for multi-measurements as a typical logger without display. You can very fast diagnose the machine under test using the tablet. On the other hand, you can leave the analyzer module itself for many days measurement as a typical logger without display. PQM-711 has a transient registration with a maximum sampling rate of 10 MHz (rapid changes in voltage) and control signals. The minimum duration of the registered transient is 650 ns.
-
Product
Solderability Tester
LBT210
-
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
-
Product
sbRIO-9229 , Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780874-01
-
Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9229 performs differential analog input. The sbRIO‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Non-enclosed modules are designed for OEM applications.
-
Product
2-Axis Rate and Position Tables
-
When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
-
Product
RSE Wireless EMC Spurious Emission
TS8996
-
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
Product
Pulse Function Arbitrary Noise Generator
81160A
-
Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits. Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern
-
Product
LCR Meters
-
PeakTech Prüf- und Messtechnik GmbH
A type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component.[1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably accurate if the capacitor or inductor device under test does not have a significant resistive component of impedance. More advanced designs measure true inductance or capacitance, as well as the equivalent series resistance of capacitors and the Q factor of inductive components.





























