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Surface Contamination
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Surface Contamination Monitors
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Surface Contamination Kit
138/2
The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Omicron Fiber Optic Connector
Teledyne Impulse-PDM’s Omicron 5030/5070 optical connectors utilize proven small form factor ferrule technology and are available for multi-mode or single-mode operation.The connectors are offered, as standard, in stainless steel to BSEN10088-3 Grade 1.4404 (316L), which is electro-polished to remove surface contamination, thus improving resistance to corrosion. Connector bodies can also be manufactured in other materials, either to address specific anti-corrosion requirements, or to increase depth rating. Engaging nuts are normally manufactured in naval brass to UNS C46400.
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Surface Quality Monitors
PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Chemical Testing
Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Surface contamination monitoring
Personal surface contamination monitor [IEC 61098/IEC 61256 compliant]. *Innovative plastic scintillation detector for beta rays
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Optical 12,000 Meter Connector
Teledyne Impulse-PDM’s 5135/5175 optical connectors utilize proven standard ferrule technology and are available for multi-mode or single-mode operation.The connectors are manufactured in Titanium Ti 6Al-4V, which is electro-polished to remove surface contamination, thus improving resistance to corrosion. The engaging nuts are also manufactured in the same grade of Titanium and the threads are coated with a Nickel/PTFE composite coating to prevent galling. The connectors have been qualifi ed to 12,000 meter operating depth.
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Surface Contamination Monitor
IMI Inspector Alert™ V2
The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Spectrometers
*Search and detection of gamma radiation sources with automatic identification of the radionuclide composition;*Measurement of the dose rate of gamma radiation;*Detection of neutron radiation and measurement of the neutron count rate (AT6102);*Measurement of the dose rate of neutron radiation (external detection unit BDKN-03);*Measurement of the flux density of alpha and beta particles from contaminated surfaces (external detection units BDPA-01 / BDPB-01)
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Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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Analytical Techniques
Anderson Materials Evaluation, Inc.
Our numerous analytical techniques, we tackle a wide range of materials challenges and commonly combines several analytical techniques to fully address complex and multi-dimensional materials issues. Our materials analysis laboratory provides XPS surface analysis, thermal analysis (TGA, DSC, TMA), FTIR infrared spectroscopy, UV-Vis spectrophotometry and reflectivity measurements, gas chromatography – mass spectroscopy (GC-MS), SEM/EDX, optical microscopy, mechanical testing, electrochemistry and corrosion analyses, residual gas mass spectroscopy, contact angle measurements, surface contamination measurements, adhesive bonding failure analysis, facility testing for silicone contamination, mechanical testing, metallography and fractography, density and porosity measurements, volatile organic component testing, friction, and other analytical capabilities. We continue to upgrade and expand our arsenal of analytical techniques and custom analytical methods to support our customers’ needs.
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Elcometer Bresle Patches
135B
Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Geiger Counter
ONYX®
ONYX features a modern, streamlined look and the use of advanced technologies, making it a one-of-a-kind Geiger Counter. It weighs only 7 oz. (200g.) and measures a mere 5.1 X 2.6 X 0.9 in. (72 X 37 X 13 mm.) making it easy to transport. Despite its compact size ONYX is capable of detecting alpha, beta and gamma radiation with the same sensitivity as the IMI Inspector Alert™, and like the IMI Inspector Alert™ V2, ONYX is optimized for surface contamination measurements through use of its 2 in. pancake Geiger Mueller tube.
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Microbial Contamination Monitors
Is an active sampling method that is superior to the usage of settle plates, that additionally creates validated and actionable data.
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Contamination & Clearance
Provides the ultimate user-friendly operation, with thorough and reliable detection of external contamination on personnel working in nuclear environments.
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Sample Holder/Stocker For Contaminant Measurement
EDXIR-Holder
Measure the Samples Kept in the Holder with EDX and FTIR The Holder Can Be Used as the Sample Stocker after the Measurement
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Surface Photovoltage
The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
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Contaminating Fluid Testing
Products manufactured using plastics, coated and painted surfaces, seals or other "A" surface materials can come in contact with spilled chemicals, sweat, cleaners, lubricants and fuels that can be a potential stress source for a product. These stress sources can cause discoloration, deterioration and de-lamination failures. We can create a list of fluids and/or follow TRCA, DO-160, MIL-STD-810 and ASTM guidelines for a list of products that should be used to test your part's compatibility.
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Surface Cleanliness
Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Surface Roughness Testers
Widely used in production site to measure surface roughness of various machinery-processed parts, calculate corresponding parameters according to selected measuring conditions and clearly display all measurement parameters.
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Surface Roughness Gage
1000
The Adcole Model 1000 represents the state of the art in surface roughness measurement for crankshafts, camshafts and other cylindrical components. The machine is pre-programmed for optimized workflows. Operators simply need to load and unload the parts. In addition to its unprecedented accuracy, this product is also the fastest system for taking critical surface measurements.The base gage is a rugged, self-standing horizontal granite surface plate with affixed headstock, tailstock and carriage. Scanned data is immediately available for review on the touchscreen monitor or printing.
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Absolute Contamination Standards (ACS)
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Surface Thermometers
Tel-Tru® Manufacturing Company
Tel-Tru Surface Thermometers are designed to measure surface temperatures on a wide variety of surfaces and are available in several configurations.
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Surface Roughness Tester
A precision instrument used to evaluate the texture of a surface, determining whether it is rough or smooth.
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Contamination Detection and Analysis
Contamination testing, detection, analysis, troubleshooting and resolution expertise to minimise downtime, maintain customer confidence, for quality & safety
