Test Pattern Generators
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Product
Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3T-2
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Arbitrary Function Generator
HMF2525/HMF2550
Function Generator
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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Product
2.5GS/s 16Bit 2GS Mem 12CH Arbitrary Waveform Generators
P25812B
Waveform Generator
The Proteus P25812B, is a 2.5GS/s, twelve channel arbitrary waveform generator packaged in a 4U, 19” standalone box with a 9” touch screen and on board PC , offering technologically advanced options and configurations that integrate the ability to transmit, receive and perform digital signal processing all in a single instrument. The P25812B offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Product
120 GSa/s Arbitrary Waveform Generator
M8194A
Arbitrary Waveform Generator
120 GSa/s sample rate supporting signals up to 64 GBaud on 4 channels in a 1-slot AXIe module - simultaneously.
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Product
Standard 0.70 (2.00) - 1.70 (4.80) General Purpose Probe
P2662AG-2V1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Standard 1.68 (48.00) - 3.20 (91.00) General Purpose Probe
HPA-52B
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
PXIe Vector Signal Generator: 1 MHz to 3 GHz or 6 GHz
M9381A
Vector Signal Generator
Choose your RF modulation bandwidth, 40, 100, or 160 MHz, and easily upgrade as test needs change Increase throughput with fastest RF frequency tuning and amplitude switching for high-speed automated test Save space with a compact solution for up to 8x8 MIMO with phase coherence Get up and running quickly with validated application-specific reference solutions Simplify signal creation with Keysight's Signal Studio and Waveform Creator
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Product
Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4F
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2P-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels
M2P.6566-X4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
PXI Multi-Channel Function Generator Module, 32-Channel
41-625-001
Function Generator
The 41-625-001 (PXI) and 43-625-001 (PXIe) are function generator modules that provide 32 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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Product
Standard 1.00 (28.00) - 1.80 (51.00) General Purpose Probe
P2662BG-1Q1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Product
High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2550-6-8
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2C40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
Alternate 3.50 (99.00) - 6.85 (194.00) General Purpose Probe
P2757G-2W2S
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1T
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
Waveform Generator, 20 MHz, 1-Channel, with Arb
33511B
Waveform Generator
Keysight 33500B Series waveform generators with exclusive Trueform signal generation technology offer more capability, fidelity and flexibility than previous generation DDS generators. Easily generate the full range of signals you need to your devices with confidence the signal generator is outputting the signals you expect.
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Product
PXIe Precision AWG: 4 Channels, 400 MHz
M5301A
Arbitrary Waveform Generator
The M5301A is a single-slot PXIe module with four baseband AWG outputs, clock input and output, and four triggers. It provides high performance with easy-to-use programming libraries, real-time sequencing technology, and FPGA programming.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
PXIe-5672, 2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator
779900-02
Vector Signal Generator
2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator —The PXIe‑5672 features quadrature digital upconversion, which reduces waveform download and signal generation time. It is a general-purpose vector signal generator that can generate standard modulation formats such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM. The PXIe‑5672 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks. For specific communications standards, you can use various software add-ons to generate modulated signals according to standards such as WCDMA, DVB‑H, and ZigBee.
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Product
AT-1212, 14-Bit, 1.2 GS/s, 2-Channel Signal Generator Adapter Module for FlexRIO
782248-02
Signal Generator
The AT-1212 provides an analog output channel for signal generation. It also features single-ended, DC-coupled inputs. The AT-1212 is ideal for generating complex signals like digital modulations and RF stimuli for functional and performance tests. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the AT-1212, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Product
Standard 0.70 (20.00) - 1.30 (37.00) Non Replaceable General Purpose Probe
A-S-V
General Purpose Probe
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 230Overall Length (mm): 5.84Rec. Mounting Hole Size (mil): 38Rec. Mounting Hole Size (mm): 0.97Recommended Drill Size: #62 or 0.97 mm
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Product
Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40C
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3B-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
HPA-64 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
