Device Characterization
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Product
ENA Vector Network Analyzer
E5072A
Vector Network Analyzer
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
PXI-5651, 3.3 GHz RF Signal Generator
779670-01
Signal Generator
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000B
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The ThermalAir TA-3000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Product
PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Product
Multi-Channel Controllers
7000 Series
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The new 7000 Series MultiSource Multi-Channel Controller is designed for applications requiring a large number channels in a cost-effective and compact solution. With both laser driver and temperature controller options, the MultiSource is an excellent building block for system applications such as device burn-in and characterization.
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Product
Manual Tuners / Impedance Tuners
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Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
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Product
Automated Tuners / Impedance Tuners / Load Pull Tuners
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MT97x, MT98x and XT98x series automated tuners (also known as automated impedance tuners and automated load pull tuners) are precision instruments that are optimized for a broad class of in-fixture and on-wafer applications, and may be used in any automated or manual application requiring the ability to match the impedance of a microwave circuit element or to establish specific impedances at a terminal interface. The tuner design is based on the slide screw concept using the inherently broadband slab-line transmission structure. Each unit has two non-contacting probes deliver high VSWR with superb accuracy and reliability over a wide frequency range. These probes can be fully retracted leaving a low-loss, well-matched transmission line, which is a significant benefit in power related applications where two-port tuners capable of handling large amounts of power are required. As integral components of Maury Device Characterization Solutions, these PC-based tuners are controlled using Maury's family of Device Characterization Software tools, including MT930 IVCAD, MT993 ATS and the DLL-based measurement automation environment. Maury Microwave automed impedance tuners are ideal for load pull, harmonic load pull, active load pull, hybrid active load pull, noise figure, noise parameters and all automated tuner applications.
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Product
Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
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The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Product
PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Deep Access RF Probes
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GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Product
IP GAM
SFT 3316
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Hangzhou Softel Optic Co., Ltd.
SFT 3316 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by Softel. It has 1 6 multiplexing channels, 16 scrambling channels and 16 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 16 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
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Product
QE System
PVE300
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The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
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Product
Slide Screw Tuners
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Slide screw tuners are particularly suited to establishing impedances for device characterization, or for any other application requiring a precisely repeatable mismatch condition. This is due to the precision with which a specific matching condition can be repeated if the tuner has calibrated position indicators.
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Product
PNA Network Analyzer Family
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Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
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Product
PNA-X Microwave Network Analyzer
N5245B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
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The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Product
Materials Characterization
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The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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Product
Laser Diode Characterization Testing
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The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Product
Temp Characterized CalPod, 20 GHz
85531B
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CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards. Very useful in thermal chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the thermal testing to perform a normal re-calibration.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Pulse Characterization Sensors
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Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Product
Devices
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Aegis Industrial Software Corp.
Eventually your MES system needs to interact with the physical world and that means hardware is necessary. Aegis offers pre-certified devices such as scanners as well as line control devices of its own design. The benefit for customers is a successful implementation that comes from Aegis' experience of 1600 installations dealing with thousands of identification challenges and process control challenges.
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Product
Surface Analysis and Materials Characterization Services
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The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Product
Beam Characterization
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Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Product
Optical Device
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Optical devices are products that use the optical characteristics (birefringence) of quartz crystals. Murata Manufacturing uses high-precision synthetic quartz crystals grown using our proprietary technology to manufacture high-grade products.
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Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
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Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Product
Characterization of Solar Cells
Paios
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Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
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Product
Power Devices
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Our power portfolio provides a wide range of low-voltage to high-voltage components featuring our advanced process and packaging technologies. These solutions meet the demands of today's most complex power system designs across the infrastructure, mobile, industrial, automotive and aerospace markets.
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Product
Jaw Device
PC-100
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The PC-100 device is designed to determine the taper and the crown of generator core lamination. The device contain series connection which allow the data transmittion to PC.
