Device Characterization
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PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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ENA Vector Network Analyzer
E5072A
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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PNA-X Microwave Network Analyzer
N5247B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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EasyEXPERT Group+ Software (for PC)
Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Optically Isolated Measurement System
IsoVu
IsoVu offers complete galvanic isolation and is the industry’s first measurement solution capable of accurately resolving high bandwidth, low voltage differential signals in the presence of large common mode voltages. The stand out feature of IsoVu™ is its best in class common mode rejection across the entire bandwidth. Accurate differential measurements rely on a measurement system’s bandwidth, rise time, common mode voltage, common mode rejection capability, and the ability to connect to smaller test points to characterize devices that are shrinking in size and increasing in performance. Despite these requirements, advancements in test and measurement for power testing, EMI testing, ESD testing, and remote measurement capability have been minimal at best and have not kept pace with changing requirements. While differential voltage probes have had modest performance gains in regard to bandwidth, these probes have failed to make any substantial improvements in regard to common mode rejection, and connectivity. IsoVu is a leap forward in technology and is the only solution with the required combination of high bandwidth, high common mode voltage, and high common mode rejection to enable these differential measurements.
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PNA-X Microwave Network Analyzer
N5241A
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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Automated Compliance and Device Characterization Tests
N5990A
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Supercontinuum White Light Lasers
SuperK series
The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Modulation Distortion Up To 90 GHz
S930709B
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Broadband VNA Operation To 170 GHz
S93300B
Configure a 170 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs.
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Modulation Distortion Up To 53 GHz
S95070B
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Keysight N7800A Test Management Environment (TME) Software
Special recommended calibration options: The N7800A software calculates point-to-point ISO GUM measurement uncertainty. The special “H-series” calibration options in the link below provide lower measurement uncertainties through use of direct comparison to devices directly characterized by NPL or NIST (or another NMI), along with data on a CD for easy import into the N7800A (avoids manual entry). The overall resulting N7800A measurement uncertainty then incorporates this lower device uncertainty in the overall calculated uncertainty. For more information on the special options please view this spreadsheet N7800A Special Calibration Matrix.
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Keithley Automated Characterization Suite Software
ACS
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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ThermalAir Desktop Series Temperature Forcing System
ThermalAir TA-1000A Desktop System
The ThermalAir TA-1000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Antenna Characterization
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Thermal Characterization Testing Services
Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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Laser Diode Characterization Testing
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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PCB Material Characterization
N19308B
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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Characterization of Solar Cells
Paios
Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
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Connection Devices
Our Connection Devices include Network Media for Ethernet, ControlNet™, DeviceNet™, Power Media, and Safety Connection Systems. We offer many products for DC Micro (M12), AC Micro (1/2), MiniPlus (1, 1-1/8), Mini (7/8), Pico (M8), and M23: cordsets, patchcords, V- and Y-cables, splitters, field attachable connectors, and receptacles. Our I/O Wiring Systems include interface modules and cables that connect through pre-wired cables to digital and analog I/O. We offer several IEC and NEMA terminal blocks to meet your needs.
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ProxiLAB Quest Contactless Tester
Fully programmable card (PICC), reader (PCD) and NFC signal emulator for device characterization and protocol conformance verification. ProxiLAB Quest offers the performance and features required for full characterization and conformance validation of all 13.56 MHz contactless technologies, including the latest very high bit-rate evolutions. ProxiLAB Quest integrates with a variety of conformance certification solutions and test automation platforms.
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Optomechanical Devices
Optomechanical devices include an optical chopper, scanning galvo mirrors, adaptive optics, a motorized pinhole wheel, a piezo objective scanner, a motorized flip mount, motorized filter wheels, and optical beam shutters.
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Fan Characterization Module
FCM-100
Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
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Microwave Devices
Photonis Defense and its predecessors have been designing and manufacturing Traveling Wave Tubes (TWTs) since their invention in the early 1940’s. Photonis manufactures helix-type tubes that are constructed using the industry standard metal-ceramic construction. Our tubes are conduction cooled and feature rare earth periodic permanent magnets for power-free focusing.
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