Lifetime
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Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Environmental Chambers
Sanwood Environmental Chambers Co ., Ltd.
Sanwood climatic chambers for battery can be tested under controlled temperature and humidity conditions, similar to the conditions under which batteries operate during their lifetime.
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150 MHz USB Oscilloscope
574
The Dataman 574 is a dual channel oscilloscope with 150 MHz bandwidth and USB 2.0 connectivity • USB powered - no additional power supply is required • Dual channel with external trigger • 150 MHz bandwidth • 100 MS/s real time sampling rate • 10 GS/s equivalent sampling rate • 1 MS sample buffer per channel • Hi-speed USB 2.0 connectivity allowing fast and easy connection to PC’s and laptops • Comprehensive 2 years parts and labor warranty • Free life-time software updates
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FLIM Camera Systems
The Excelitas pco.flim camera system consists of the pco.flim camera and pco.flim laser, with a complete frequency synthesizer, which is required for the generation of the modulation signals in the frequency domain. The pco.flim series features a high frequency modulated CMOS image sensor that enables pixel-wise measurements of sample luminescence lifetime distributions in frequency domain suitable for fluorescence lifetime imaging. At a maximum speed of 10 Hz, full luminescence lifetime distributions can be measured at 1 Mpixel resolution. With flexible coupling and easy setup, the pco.flim is an ideal choice for wide-field FD-FLIM instruments and suitable for a variety of biomedical applications requiring a large frame and high-speed acquisition.
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Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
