Test Management Software
See Also: Test Management, Test Management Applications, Test Management Solution, Test Management Suite, Test Management Tools, Test Executive Software
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Product
High Speed Test Bench
AT444
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AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Military Communications Test
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Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Universal Test System
LEON System
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A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Operations Management Software
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End-to-end visibility, orchestration and control of your entire manufacturing operations.Being competitive in todays market environment means continuously striving for more effective operations as well as more flexibility and agility. ABB’s Manufacturing Operations Management suite provides the backbone for optimized operations by enabling the control and insight needed in effective production-, quality-, inventory- and maintenance operations.
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
In-line High-Density ICT System Series 7i
E9988GL
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The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
NVIDIA® Jetson Orin™ Nano Developer Kit
MIC-711D-ON
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Open-frame carrier design with thermal solution. Embedded with NVIDIA® Jetson Orin™ Nano up to 67 TOPS. Supports 1 x GbE, 2 x USB 3.2 Gen 1 (5 Gbit/s). Supports 1 x mPCIe, 1 x M.2 3052, 1 x M.2 2280.
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Product
Digital Test Instrumentation
EDigital-Series™
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Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
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The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
PCI Express 3.0 Test Platform with SMBus Support
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The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
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The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Antenna Test System
ATS1000
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Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
Bottom Electrode SMD Test Fixture
16197A
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The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Test Management And Reporting Software
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AFL’s PC- and cloud-based software solutions provide both the knowledge and the power to analyze your data and generate standard or custom reports that provide actionable intelligence for your business
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Fixturing Kit
10744A
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The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Semiconductor Yield Management Software
QuickLoad-Central
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QuickLoad-Central is our new STDF filtering, analysis, reporting, managing, viewing and editing tool. It looks at all your STDF files before you need to, pulling out key information to pre-generate reports and help you quickly find the files you need. You can list files of interest with yield and header information on our dashboard, visualize your data, open pre-generated reports or push any information from them that you can think of to JMP, Excel or other analysis tools.
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Product
Service Management Software
CERDAAC
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CERDAAC® SIMCO Manager™is an advanced cloud-based software service that provides complete program management for calibration and repair services performed by SIMCO.
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Product
I-Pi SMARC Development Kit Based On NXP® I.MX 95 Six-Core Arm® Cortex-A55, M7 & M33
I-Pi SMARC IMX95
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The ADLINK LEC-IMX95 is a powerful and versatile SMARC module that delivers high-performance computing, graphics, machine learning, and vision capabilities for IoT and industrial applications. It is based on the NXP i.MX95 processor, which integrates six Arm Cortex-A55 cores, one Arm Cortex-M7 core, one Arm Cortex-M33 core, an Arm Mali GPU, an ISP, and an eIQ Neutron NPU that can run at up to 2 TOPS.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
NI Semiconductor Test Systems
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The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
USRP Software Defined Radio Device
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The USRP Software Defined Radio Device is a reconfigurable RF device that includes a combination of host-based processors, FPGAs, and RF front ends. The USRP Software Defined Radio Device include options that range from lower cost options with fixed FPGA personalities to high-end radios with a large, open FPGAs and wide instantaneous bandwidth. These devices can be used for applications such as multiple input, multiple output (MIMO) and LTE/WiFi testbeds, SIGINT, and radar systems.
