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Test Management Software
See Also: Test Management, Test Management Applications, Test Management Solution, Test Management Suite, Test Management Tools, Test Executive Software
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Test Management Software
XStudio
XStudio allows the scheduling/running offully automated, semi-automated or manual test campaigns. It comes with an integrated requirement management module and a bug-tracking database. Some connectors are also provided to connect real-time with JIRA, Mantis, Bugzilla or TRAC.
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Test Management Software Tool
TestRail
Modern test case management software for QA and development teams. Comprehensive web-based test case management software to efficiently manage, track and organize your software testing efforts. Auto-generate tests and BDD scenarios from requirements and user stories, with full tester control.
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Test management software
Online test case management tool allowing you to manage your test plans, test cases & test runs with ease
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Test Data Management Software
WATS
WATS is an off-the-shelf Quality and Test Management solution, chosen by customers who want real-time test and repair data for monitoring and improving product quality and manufacturing processes. WATS collects and structures Data worldwide, enabling real-time data acquisition, analysis, reporting and management of manufacturing quality.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Test Management Software
Test case management and QA is about Coordination and Visibility. PractiTest allows you to Manage all the Requirements, Tests, Issues and Reporting in one simple software testing solution. Get all the information you need in one integrated test case management software solution. Real value from all the information. A Test Case Management tool to help you manage your work and your team.
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Primary Test Manager
The Primary Test Manager™ (PTM) software supports you during diagnostic testing, condition assessment and data management of medium- and high-voltage assets, such as circuit breakers, rotating machines, grounding systems, instrument and power transformers as well as bushings and on-load tap changers (OLTC).
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LEAK TEST MANAGER SOFTWARE
Leak Test Manager is a software application for PC compatible with Windows XP, 7, 8 and 10 that allows interfacing ForTest equipment to a computer via an RS232 connection (or Ethernet if optional is available on the instrument)
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Companion for on-Site Testing
PTMate
The PTMate app is our mobile companion for the Primary Test Manager™ (PTM) software. It supports you on site by providing additional features on your smartphone, for example, sending images, displaying wiring diagrams, or sharing jobs and reports.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Test Management Software
Easy to use to minimal training. Our Test Management Software is powerful enough to accommodate all of your electrical and function testing requirements, whether testing a cable harness or fully equipped vehicle or aircraft.
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Phi6 Drivers
Phi6 is the software environment to manage, control and program 6TL modules and systems.
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Software - IDEAL Data CENTER
IDC
IDEAL Data CENTER (IDC) is the test result management software for LanTEK III cable certifiers from IDEAL Networks. IDC allows data cable installation professionals to easily download, manage, edit and print pdf reports. IDC offers a simple user interface with time saving features including; Microsoft ribbon toolbars; 4 button clicks to import data from the tester and 3 simple steps to create a professional report. IDC is the fastest management software from IDEAL Networks.
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Digital Management Software
EdgeGO
EdgeGO® is a robust software platform for remote device management in edge computing environments. It prioritizes quick deployment and user-friendly operation while ensuring scalability and security.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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COM-HPC Server Type Size E Reference Development Platform based on Ampere® Altra® SoC
Ampere Altra Developer Platform
Backed by a broad Arm® ecosystem with an Ampere® Altra® SoC at its core, using the Arm® Neoverse™ N1 platform, the Ampere Altra Developer Platform provides premium performance from a cloud-to-edge infrastructure, keeps an extremely low thermal envelope, lower TCO, and significantly lower power consumption than x86 designs. It supports the open source EDKII as bootloader with UEFI, so customers can just download a stock AArch64 (arm64) ISO such as Ubuntu and install it through booting a live ISO directly on the target. The same convenience we have become used to by using x86 / amd64 target systems.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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I-Pi SMARC Development Kit based on NXP® i.MX 8M Plus Quad Arm® Cortex-A53 Processor
I-Pi SMARC IMX8M Plus
The I-Pi SMARC IMX8M Plus is a SMARC-based smart solution development kit powered by NXP i.MX8M Plus (Quad-core Arm Cortex-A53) processor with a Neural Processing Unit (NPU) at up to 2.3 TOPS.This is the first SMARC R2.1 development kit focused on machine learning, vision, advanced multimedia, and industrial IoT with high reliability. As such, it supports dual image processors and two camera inputs for an effective Vision System, as well as applications beyond, including smart homes, building cities, and industry 4.0.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
