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Transceiver Test
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Benchtop Femtosecond/Picosecond Lasers and Amplifiers
The systems feature a portable design with user-friendly front panel control knobs for adjustment of output parameters, such as power, pulse width and repetition rate. With wavelength options of 780 nm, 850 nm, 1310 nm, and 1550 nm, pulse widths as low as < 0.3 ps, and GHz low-jitter synchronization signals, these systems provide ideal optical sources for high speed transceiver conformance testing and photodiode characterization.
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Transceiver Testing
Family of RF test systems designed for transceiver testing. Designed for radio-to-radio testing in a closed mesh network. Step attenuators allow you to dynamically fade up/down the RF signal between radios. These Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted remote commands.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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PXIe-5785, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO IF Transceiver
785585-01
The PXIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PXIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Arbitrary Waveform Transceivers
Proteus Series
Tabor’s Proteus Arbitrary Waveform Transceiver enables you to transmit, receive and perform digital signal processing all in a single instrument. The Proteus AWT is a valuable tool for R&D labs in growing markets such as quantum physics, medicine, aerospace and defense, telecommunications and automotive. For synchronized, phase coherent, multi-channel applications such as quantum physics and radar applications the Proteus arbitrary waveform transceiver is an ideal, space efficient and cost effective solution.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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PXIe-5785, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO IF Transceiver
785584-02
The PXIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PXIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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PXIe-5785, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO IF Transceiver
785585-02
The PXIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PXIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785589-01
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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PXIe-5831, 44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver
786853-01
44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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PXI Vector Transceivers
Get both signal generation and analysis in one PXIe module with real-time field-programmable gate array (FPGA)-accelerated measurements for faster throughput. The PXIe vector transceiver is perfect for manufacturing test of wireless devices, RF power amplifiers, and front-end modules.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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PXIe-5645, 6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver
782377-01
6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver—The PXIe‑5645 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5645 offers the flexibility of a software defined radio architecture with RF instrument class performance. The PXIe‑5645 features a high-performance, differential or single-ended baseband I/Q interface. This interface allows the PXIe‑5645 to address many additional applications, such as testing both the upconverted RF and downconverted baseband signals of a device with a single instrument.
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*PCIe-5785, 12-Bit, 6.4 GS/s, 2-Channel FlexRIO IF Transceiver Device
785587-02
The PCIe-5785 enables direct RF acquisition up to 6 GHz and generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The PCIe-5785 is ideal for applications that require wideband acquisition and generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for acquiring and generating waveforms out of the box, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA to implement custom algorithms for real-time signal processing.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Vector Signal Transceiver-based Radio Solution (VRS)
ATS-3100 VRS
The ATS-3100 VRS, the newest member of the ATS-3100 PXI Integration Platform product family and fifth-generation radio test solution, is a single, consolidated platform for testing legacy, modern, and next-gen, software-defined radios for military, civil, and commercial users. Integrating the PXI Vector Signal Transceiver (VST) from National Instruments (NI), the platform enables faster test time with wider bandwidth (up to 1GHz) than any other radio test solution available today.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-02
The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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mmWave Transceiver System
The mmWave Transceiver System is a modular hardware solution for prototyping real-time communications systems for mmWave frequencies. With 2 GHz of bandwidth, the system can be used to evaluate the ultrawide bandwidth signals being proposed for next-generation wireless communications standards in real time. You can analyze these ultrawide bandwidth signals in real time using a multi-FPGA architecture for computationally intensive digital signal processing. With this processing capability, you can build a real-time two-way communications link with up to 2 GHz of bandwidth.
