MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Test Requirements Document (TRD) System
TRD Software
System
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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Product
Mezzanine System
5235
System
The 5235 ECM provides 16 bits of simple digital I/O. The digital I/O is connected directly to the digital I/O on the carrier card. Inputs are clamped to about 3V by FET buffer ICs, and are 5V tolerant.
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Product
VIP IFEC & CMS Systems
System
Astronics is the smart choice for inflight connectivity, entertainment, and cabin management solutions for VIP, VVIP, and business aircraft. From the highest-performing global SATCOM connectivity for optimum productivity and entertainment, to our Avenir IFE/CMS line that incorporates the latest technologies to deliver native 4K video distribution through the highest bandwidth Ethernet network system in the industry, Astronics is ready with a cutting-edge solution that delivers the ultimate VIP experience.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
LabVIEW Development Systems
System
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
System
The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Product
VIP Cabin Management Systems
System
Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Checkpoint Security System
ConneCT
System
The ConneCTTM Checkpoint Security System is an advanced aviation security explosive detection system (EDS) engineered to deliver superior threat detection, dramatically improved passenger throughput, and low total cost of ownership.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Compact EMS/EMI Test Platform
CEMS100
Test Platform
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Product
Mezzanine System
5147
System
ECM P/N 5147 provides two channels of 12 bit A/D conversion using the Analog Devices AD9235, and is suitable for medium resolution high speed applications. The two differential inputs are terminated in 120 ohms and buffered with a gain of 1 differential amplifier. Differential Input range is +/-3.0V. Sample rates are 20MHz per channel with a 5MHz 4 pole elliptical analog input filter.
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Product
Mezzanine System
5188
System
ECM P/N 5188 provides an AD8109 crosspoint switch for analog or digital signals with 250MHz of Bandwidth. For single ended applications 8 inputs can be connected up to 8 outputs in any configuration.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
