SRAM
Static Random Access Memory
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Product
ARM LPC3250 Board
MS 1509
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- 32 Bit ARM LPC3250 Processor (256KB SRAM)- 133MHz External Bus Speed and 266 MHz internal CPU Speed- 32 Bit, 33MHz CPCI Bus, 6U Form Factor- External memory ( Flash – 2 MB, RAM - 512 KB, DPRAM – 128KB)- 10/100 MBPS Ethernet Interface- USB 2.0 Host/Device Interface- 2 RS232 Serial Ports, 4 RS422 Serial Ports- M Module Interface- 6U board compatible with CPCI & PXI backplanes- High Speed Logic Device- Hot Swap Feature- Front Panel and Rear IO Interface- External Bus through Rear IO- Reception of 3Kbytes within 2ms through Ethernet- Board Dimension is 160mm x 233.35mm- Power Requirements: +3.3V, +5V and +/-12V- Board Dimension is 160mm x 233.35mm- Board has Rear IO interface- Ethernet, JTAG, RS232, USB connectors at front side- BSPs and Driver software for Windows and Linux OS
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Product
Low Latency DRAM
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Low Latency DRAM is our newest large-density memory boasting high performance. Incorporating high-performance technology used in our synchronous SRAM and the pseudo-SRAM technology used in mobile-specified RAM, Low Latency DRAM is ideal for use in various networking applications. With a Fast random access time-and data latency lower than other DRAM products-Low Latency DRAM realizes extremely high performance compared to commodity DRAM.
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Product
L-Band RF Tuner and 2-Channel 200 MHz A/D with Virtex-6 FPGA - 6U VPX
Model 57690
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- One L-Band tuners accept RF signals from 925 MHz to 2175 MHz- One programmable LNAs boost LNB (low-noise block) antenna signal levels with up to 60 dB gain- One programmable analog downconverters provide I + Q baseband signals with bandwidths ranging from 4 to 40 MHz- Two 200 MHz 16-bit A/Ds- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Up to 2 GB of DDR3 SDRAM; or: 32 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Clock/sync bus for multiboard synchronization- Optional user-configurable gigabit serial interface- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Product
3-Ch 200 MHz A/D with DDC & 2-Ch 800 MHz D/A with DUC, Virtex-6 FPGA - 6U VPX
Model 57621
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- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Three 200 MHz 16-bit A/Ds- Three multiband DDCs (digital downconverters)- One DUCs (digital upconverters)- Two 800 MHz 16-bit D/As- One multiboard programmable beamformers- 2 GB of DDR3 SDRAM; 32 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Product
4-Channel 200 MHz, 16-bit A/D with Virtex-6 FPGA - 3U VPX
Model 52660
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- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Supports gigabit serial fabrics including PCI Express, Serial RapidIO and Xilinx Aurora- Four 200 MHz 16-bit A/Ds- Up to 2 GB of DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- 3U VPX form factors provides a compact, rugged platform- Compatible with several VITA standards including: VITA-46, VITA-48 AND VITA-65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled versions available
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Product
64 MB RAM Tester
IST-6500
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IST Information Scan Technology, Inc.
The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions.
