Silicon
atomic number 14 tetravalent metalloid chemical element.
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
Networking Solutions
Bluetooth Solutions
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Quickly introduce Bluetooth connectivity into sports and fitness, consumer electronics, beacons and smart home applications with easy-to-use and innovative Bluetooth SoCs, modules and software from Silicon Labs.
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Product
AC Input Single
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AC input/single transistor output photocouplers (optocouplers) are optically coupled isolators containing GaAs infrared light emitting diodes and an NPN silicon phototransistor. This type consists of two infrared light emitting diodes connected in inverse-parallel, and operates directly on AC input current.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
PSE Conformance Test Suites for 802.3at & 802.3bt
2-Pair 802.3at & 4-Pair 802.3bt PSE's
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Robust 4-Pair 802.3bt (Type-3,4) PSE Conformance Testing. Fully Automated Port Sequencing and Statistics - Test up to 24 ports with the PSA-3000. Catch Both Repeatable and Intermittent Specification Compliance Issues. Greater than 92% 802.3bt PICS Coverage from 24 Fully Automated Tests. Pop-Up Excel Reports Covering 1 to 24 Ports. Widely Used by PSE System and Silicon Manufacturers World Wide.
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Product
Resistivity Standard
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Resistivity Standards are bare silicon wafers available in 3 in, 8 in and 12 in sizes. The silicon is p-type (Boron) doped to nominal resistivity values, from 0.002 ohm.cm to 75 ohm.cm as available on the 3" model.
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Product
Turbidimeter
DRK6600-200
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Shandong Drick Instruments Co., Ltd.
The main technical parameters:Source: Tungsten halogen lamp 6V, 12WReceiving elements: Silicon photocellMeasuring range NTU: 0.00-50.0; 50.1-200; (automatic range switching)
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Product
Layer Release Systems
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EVG's IR LayerRelease Technology is a fully front-end-compatible layer release technology that features an infrared (IR) laser that can pass through silicon, which is transparent to the IR laser wavelength. Coupled with the use of specially formulated inorganic layers, this technology enables an IR laser-initiated release of any ultra-thin film or layer from silicon carriers with nanometer precision.
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Product
40 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3710
Switch Blade
The aTCA-3710 is a high performance, high bandwidth, 40G Fabric switch blade for AdvancedTCA® platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controller, DPI/security network, IPTV, IP multimedia subsystem, RNC/BSC, broadband access/bearer network, data center, and LTE/4G network applications. The aTCA-3710 provides 40GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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Product
Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
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*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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Product
Climatic Chamber
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Wewon Environmental Chambers Co, Ltd.
Climatic chamber is designed to do high temperature & high humidity, high and low temperature, or temperature cycling test, Climatic chamber mainly used for quality checking and assessing their quality reliability and life test. ● The climatic chamber simulate a full range of temperature testing and humidity testing conditions.These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the industry. ● Climatic test chambers are able to provide rapid product temperature change rates and use varying levels of relative humidity to locate design problems prior to shipping your products, improving product quality and reliability. climatic chamber For conditioning of samples prior to testing. Climatic chamber also can be used for a variety of materials of high – low temperature alternating test. The test temperature, humidity, time can be programmed. Provides conditions of temperature form -70 degree to +150 degree and of humidity from 20% to 98%. ● This type climatic chamber use 16bit Industry-grade PLC, programmable controller to control the test temperature test, and recycle time, more excellent anti jamming, high reliability of the data. ● TEMI880 large color LCD touched screen temperature & humidity controller. Real-time display program running time, the number of segment, the remaining time, repeat frequency,can display experimental data, including the pre-set segment time, heating status, calendar time, etc; climatic chamber directly digital display. ● Climatic chambers apply controllable silicon step-less adjusting technology to adjust temperature and humidity test continuously and precisely, and without over heated as the PID adjusting function. ● The thermal insulation material between outside and inside for climatic chamber is high-quality ultra-fine glass fiber insulation cotton, good thermal insulation effectivity. Thermal insulation layer composed of flame fire PU + glass wool insulation (insulation thickness 10.0 cm)
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Product
Silicon O/C Content Tester
OCT-2000
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Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Product
Surge Suppressor Tester
(SST) 450
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The ATSI SST-450 Surge Suppressor Tester is designed to quickly and easily test allcommonly used transient voltage suppressors: metal-oxide varistors (MOVs), gas-discharge tubes (GDTs), silicon avalanche diodes (SADs), thyristor surge protective devices (TSPDs), and hybrid devices.
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Product
Temperature Measurement IR Sensors & Detectors
ST60 High Temperature
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A single-channel silicon-based thermopile that will withstand operating temperatures of 225C, with a small active area of 0.61mm x 0.61mm in a TO-5 package. The reduced height package functions as an internal aperture. Two thermistor options provide ambient package temperature measurement. Currently only available with 8-14um silicon window. Time constant of 18ms with Nitrogen encapsulation gas delivers a very low Temperature Coefficient of Responsivity of -0.4%C. This detector has a very short thermal shock response to ambient temperature change.
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Product
Silicon Pyranometer
LPSILICON-PYRA04
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Pyranometer with silicon photodiode for measuring the GLOBAL SOLAR IRRADIANCE, diffuser for cosine correction. Spectral range 400…1100 nm.
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Product
Digitizer
724 Family
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The 724 is a family of CAEN Waveform Digitizer able to perform basic waveform recording and run online advanced algorithms (DPP) of pulse height analysis and dynamic acquisition window. Data is read by a Flash ADC, 14-bit resolution and 100 MS/s sampling rate, which is well suited for high resolution detectors as Silicon, HPGe or inorganic scintillators like NaI or CsI coupled with Charge Sensitive Preamplifers. In the waveform recording mode, algorithms of zero suppression are also implemented to reduce the data throughput. The acquisition can be channel independent and it is possible to make coincidence/anticoincidence logic among diferent channels and external veto/gating. Multiple boards can be synchronized to build up complex systems.
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Product
Photodiodes
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Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.
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Product
Data Communications
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Renesas' MIL-STD-883-compliant CMOS Manchester Encoder-Decoder (MED) is a high-speed, low power device manufactured using self-aligned silicon gate technology. The device is intended for use in serial data communication, and can be operated in either of two modes, a converter mode or repeater mode. This device is qualified to QML Class Q military standards.
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Product
Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Product
Semiconductor Functional Verification Tools
Trek5
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Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Milk Analyzers
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Measuring parameters: FAT 0.01% - 25%SNF 3% - 15%Density 1015 1040kg/m3Proteins 2% - 7%Lactose 0.01% - 6%Water content 0% - 70%Temp. of milk 1C 40CFreezing point - -0.400 0.700CSolids 0.4 1.5%1. Sample visualization onLCD display(green)2. Possibility to measure 1 sample 90 seconds(option 60 seconds)3. Adapter 220-110 V 4.Spare silicone tubes5. Syringe6. Plastic sample holder7. Calibrations Cow, Sheep, and UHT milk8. Operation Manual9. Cardboard transport case10. CD Service PackMeasuring time 30s
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Product
Avalanche Photodiodes
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Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Product
Spectroelectrochemical Flow Cell
SEC-2F
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Using the spectroelectrochemical flow cell, it is possible to have a different optical path length changing the gasket. We offer, as an optional item, a silicon and Teflon gasket with a 100, 250 and 500 m of the thickness. SEC-2F Spectroelectrochemical flow cell was designed to fit perfectly in the SEC2000 Spectrometer, and it eliminated the use of the optical fiber to connect the Spectrometer to the SEC-2F. Even for another brand of the spectrometer, you can connect the SEC-2F using the collimating lens and optical fiber.
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Product
SparkFun Triple Axis Accelerometer And Gyro Breakout
MPU-6050
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The MPU-6050 is a serious little piece of motion processing tech! By combining a MEMS 3-axis gyroscope and a 3-axis accelerometer on the same silicon die together with an onboard Digital Motion Processor™ (DMP™) capable of processing complex 9-axis MotionFusion algorithms, the MPU-6050 does away with the cross-axis alignment problems that can creep up on discrete parts.
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Product
BSDL File Validation
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Corelis offers services to validate the accuracy of Boundary-Scan Description Language (BSDL) files that characterize the boundary-scan functionality of semiconductor devices. These services include validation of a device's BSDL file while the chip is still in development and BSDL file accuracy verification against actual silicon.
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Product
Semiconductor Technology, Micro Scriber
Precision Micro Diamond Scriber MR200
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Optik Elektronik Gerätetechnik GmbH
Precision micro diamond scriber MR 200 for exact manual scribing for defined cutting of structured silicon wafers.
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Product
RF Power Transistors
Silicon Bipolar
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Macom Technology Solutions Holdings Inc.
At MACOM we offer a broad range of silicon bipolar transistor products designed for applications ranging from DC to 3.5 GHz. Our silicon bipolar transistors are ideal for civil avionics, communications, networks, radar, and industrial, scientific, and medical applications. Our all-gold metallization fabrication processes ensure high performance and long term reliability for ground and space applications.
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Product
Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Product
Switches-Limiter
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Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
