Silicon
atomic number 14 tetravalent metalloid chemical element.
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Product
Digital Lux Meter
PM-3
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Is a compact, lightweight & easy to use Illuminance meter. The sensor is a highly stable silicon photo diode having a wide measuring range. Its spectral response is closely matched with the CIE relative photopic luminosity curve by multi-element glass filters. The sensor is also cosine corrected for true response at variable incidence angles.
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Product
AC Hysteresis Graph Test System
DX-2012M
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Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Product
Embedded Systems
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Active Silicon designs and manufactures custom embedded systems, often integrating our leading-edge image acquisition technology. Typically, units are designed for a specific OEM application often in the field of medical devices, industrial automation or remote monitoring. Systems are designed to meet various safety, quality and medical standards as appropriate, as well as being designed for long product life retaining the same fit, form and function for many years.
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
Spectroscopic Reflectometer
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– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Modules - Modules, Automotive
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Automotive modules from Vishay feature a range of technologies including FRED Pt®, High Voltage, MOSFETs, and Silicon Carbide (SiC).
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Product
Miniature Pressure Sensor
Series 2 Mi
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KELLER AG für Druckmesstechnik
Developed for measuring hydrodynamic and aerodynamic pressures. A silicone drum protects the measurement cell from the influence of vibrations and fast acceleration.
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Product
Microscopic Melting Point Meter
DRK8030
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Shandong Drick Instruments Co., Ltd.
Heat transfer material is a silicone oil, in full compliance with USP standard measurement method can simultaneously measure three samples, direct observation of the melting process can be measured colored samples.
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Product
Frame Grabbers
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Active Silicon designs and manufactures a wide range of acquisition solutions based around leading-edge hardware technology and versatile software toolkits. The range includes acquisition solutions for CoaXPress, Camera Link, HD-SDI, SDI and LVDS in different form factors. Operating system support includes 32/64-bit versions of Windows 7/Vista/XP, Linux, QNX, and Mac OS X.
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Product
Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
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Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Product
Optical Component Test
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Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with Luna’s suite of component analyzers and testers.
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Product
Probes
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SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Product
ALD Applications
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Atomic Layer Deposition (ALD) has the potential to optimize product design across a wide array of applications from making silicon chips run faster, to increasing the efficiency of solar panels, to improving the safety of medical implants.
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Schottky Barrier Ring Quads
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SemiGen’s Silicon Schottky Diodes are designed for applications through 40Ghz. The special process technology utilizes various metal schemes to provide excellent performance of Low, Medium, and High Barrier applications. The end result is a low resistance diode with tightly controlled capacitance which allows for optimum performance. Low conversation loss and superior TSS make these diodes ideal for detector / mixer applications with frequency ranges from S band to Ka band as well as modulators, lower power limiters and high speed switches.
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Product
High-Voltage DC Power Supplies
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Higher-voltage and Higher-power Supplies require more complex design solutions. The heat to be dissipated and installation infrastructure, plus choice of insulation system in a HVPS are driven by the output voltage and output power which ultimately dictates packaging. Typical insulation systems are based on air, dielectric oil, epoxy, RTV Silicone and even Sulfur Hexafluoride (SF6). The method of cooling is a factor as well, the choices often coming down to air, water or oil, depending on the platform design requirements. These applications require Excelitas' detailed understanding to help choose the best design solution.
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Product
IsoVu Isolated Probes
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The IsoVu Measurement Systems can make nearly impossible measurements – like high-side Vgs- a reality, providing today’s power engineer with measurement insights not available in other power systems and instruments. When performing near-impossible measurements, especially in those involving Gallium Nitride (GaN) and Silicon Carbide (SiC), it can be extremely time consuming and cumbersome. IsoVu eliminates those concerns: IsoVu probes offer better common mode rejection and higher bandwidth for high EMI environments and on power FETs like SiC and GaN.
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Product
Networking Solutions
Wi-Fi® Modules
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Silicon Labs' all-inclusive Wi-Fi module are targeted for applications where excellent RF performance, low power consumption and easy application development together with fast time to market are key requirements.
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Product
High Temperature XY Planar Biaxial Extensometer 1200 C or 1600 C)
Model 7651
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Jinan Testing Equipment IE Corporation
Model 7651 extensometers measure combined in-plane strains in flat cruciform specimens tested in machines capable of simultaneous X and Y (perpendicular) axial loading and on standard flat samples tested in pure tension. All models are capable of bi-directional displacement in both axes and may be used for strain-controlled fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7651 models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to eliminate crosstalk between axes and to provide high accuracy, high resolution measurements. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods with conical rod tips for specimen contact when testing to 1200℃(2200°F). Silicon carbide rods are used for the 1600℃(2900°F) high temperature option.
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Product
Hybrid Verification Platform
HES-DVM
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HES-DVM™ is a fully automated and scalable hybrid verification environment for SoC and ASIC designs. Utilizing the latest co-emulation standards like SCE-MI or TLM and newest FPGA technology, hardware and software design teams obtain early access to the hardware prototype of the design. Working concurrently with one another they develop and verify high-level code with RTL accuracy and speed-effective SoC emulation or prototyping models reducing test time and a risk of silicon re-spins.
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Product
Schottky Barrier Bridge Quads
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SemiGen’s Silicon Schottky Diodes are designed for applications through 40Ghz. The special process technology utilizes various metal schemes to provide excellent performance of Low, Medium, and High Barrier applications. The end result is a low resistance diode with tightly controlled capacitance which allows for optimum performance. Low conversation loss and superior TSS make these diodes ideal for detector / mixer applications with frequency ranges from S band to Ka band as well as modulators, lower power limiters and high speed switches.
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Product
Emulation Adapters
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With some of the more advanced 32-bit microcontrollers and SoCs, the full program and data trace capabilities of the device are not made available on production silicon. Instead, semiconductor vendors provide special 'emulation devices'. These typically feature more pins than the production device, thereby providing the interface to the trace interface.
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Product
Wireless Networking Systems
ZigBee®
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Silicon Labs is the vendor of choice for OEMs developing ZigBee networking into their products. The Silicon Labs ZigBee platform is the most integrated, complete and feature rich ZigBee solution available a family of Wireless SoCs, based on ARM Cortex processor and 2.4 GHz transceiver, together the most reliable, scalable and advanced ZigBee software and supported by best-in-class development tools.
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Product
DisplayPort v1.3 Protocol Analysis Probe
FS4500
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The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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Product
Electronic Dmm Test Lead Kit For Hand-Held Meters
5543B
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Electronic DMM test lead kit for hand-held meters. Test leads with a right angle banana plug are ideal for use with hand held digital multimeter. Flexible test leads feature high strand count silicone wire for extreme flexibility and high temperature resistance.
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Product
Interference Lithography Gratings
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Interference lithography is an optical nanolithography technology for the fabrication of extensive periodic nanostructures. Critical dimensions of less than 50 nm can be realized. At AMO two interference lithography tools are installed. One setup for extensive, high quality gratings with fixed periods, the other more flexible tool allows quick prototyping. We offer grating fabrication on silicon, silicon dioxide and other substrates with tailored pitch, etch depth and size.
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Product
Accessories & Cables
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Active Silicon offer a range of accessories for our hardware products, including CoaXPress and Camera Link cables and FireBird IO adapters for use with our frame grabbers. The products listed on our website are in stock and readily available. Other cable lengths or adapter types, are available on request, especially for higher order volumes.
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Product
MICROWAVE VARIABLE-CAPACITANCE DIODES FROM 1 to 40 GHz
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Insight Product Company offers Microwave Variable-Capacitance Diodes with capacity coverage ratio over 10 times and operating in frequency range from 1 to 40 GHz. The p+ -n1 - n2 -n+ silicon variable-capacitance diodes are designed to electrically tune frequences and phases of microwave oscillators - parts of hybrid microcircuits that provide capsulation and protection against ambient action.
