Product

Standard Probe Station Chucks & Accessories

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ABET Technologies, Inc.

ABET Technologies, Inc.

In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.

Product

Sealing Kit for PHD-4001A on Cascade Elite E300, Octagon CM300 Probe Station

PHD-4001-TH-Seal

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High Power Pulse Instruments GmbH

PHD-4001-TH-Seal - High Power Pulse Instruments GmbH

*Sealing Kit for PHD-PPM10-H9 and PHD-4001A on Cascade Octagon CM300 probe station*High temperature range -40 °C to +200 °C

Product

Probe Stations

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Probing Solutions, Inc.

Probing Solutions, Inc.

PSI's 600LS Series Probe Station is designed to exceed performance metrics of equipment priced significantly higher.

Product

Lab Assistant

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SemiProbe

SemiProbe

The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.

Product

Stimulus Induced Fault Testing

SIFT

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FA Instruments

SIFT - FA Instruments

SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

Product

Probe Cards

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Picoprobe

Picoprobe

PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.

Product

Cryogenic Probe Station

CryoPro

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Materials Development Corporation

CryoPro - Materials Development Corporation

The MDC Model 441 Cryogenic Probe Station is a cost effective alternative to high-priced vacuum based cryogenic probe stations. With up to five probes available and sample diameters up to six inches, the MDC Cryogenic Probe Station allows for electrical measurements at temperatures near liquid nitrogen levels (77K).

Product

Electrical Probe Systems

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Instec, Inc.

Instec, Inc.

INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

Product

Semi-Automatic Probe Station

P300A

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Micromanipulator Company

P300A - Micromanipulator Company

The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.

Product

Probe Card

T90™ Series

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Celadon

T90™ Series - Celadon

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

Product

Recirculating Chillers

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Lake Shore Cryotronics, Inc.

Lake Shore Cryotronics, Inc.

Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.

Product

Probe Station

S-1160

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Signatone Corp.

S-1160 - Signatone Corp.

S-1160 Probe Station 100mm, 150mm and 200mm wafer stage's completely manual and user friendly.

Product

Controlled Environment Probe Station

CG-196

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EverBeing Int'l Corp

CG-196 - EverBeing Int'l Corp

Everbeing controlled environment probe station allows vacuum and cryogenic probing down to 77K with liquid nitrogen or high temperature probing up to 1273K. Efficient in characterizing your devices at extreme temperatures, vacuum, specific gas, etc.

Product

Probe Station

EPS500

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ECOPIA

EPS500 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum 6pcs of manipulators can be installed on the base unit of probe station EPS500.

Product

CC-TLP Probe

CC-TLP-50-A1

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High Power Pulse Instruments GmbH

CC-TLP-50-A1 - High Power Pulse Instruments GmbH

*Capacitively coupled TLP probearm (CC-TLP) compatible with standard probing stations*18 GHz SMA connector*Tilt angle adjustment*Calibration gauge for needle height

Product

Probe Station

DARK BOX

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ECOPIA

DARK BOX - ECOPIA

Size : 750 × 660 × 660 mm - Material : Steel - We can provide various dark box in size and shape at reasonable price as per customer requirements.And we also provide “integral sphere” with probe station as below.

Product

Technical Manual Probe Station

4060 150-200 mm

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Micromanipulator Company

4060 150-200 mm - Micromanipulator Company

Micromanipulator's Tech Series Probe Station, Model 4060 is designed to provide a quality 6-inch (150mm) or 8-inch (200mm) probe station at a cost effective price

Product

Nano Technology Products

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Salicon Nano Technology

Salicon Nano Technology

We are instrumental in offering quality range of nano technology products that find application in defense research and development organization. Our range encompasses probe station, microscope, extension cable, adopter and RF probing, and vibration isolation products. We have the ability and resources to design products in line with the exact specifications provided by the clients.

Product

Probing Solutions

ES62X-CMPS

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ESDEMC Technology LLC

ES62X-CMPS - ESDEMC Technology LLC

The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.

Product

Fully Manual Systems

SPS-1000, SPS-2000, and SPS-2200

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MicroXact, Inc.

SPS-1000, SPS-2000, and SPS-2200 - MicroXact, Inc.

The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.