Bias Test
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Product
Low Input Bias Current Amplifiers (<100 pA)
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Low input bias current op amps are required whenever the difference of currents or voltage is small and needs to be measured accurately. These op amps are used so that the signal is not loaded down by the input of the op amps. Low input bias current op amps are critical for interfacing sensors in applications from photodiodes, pH meters, or other electrometer related functions to downstream electronics. Analog Devices has many precision op amps that fit the definition and range of these applications.
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Product
Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
120 GHz Frequency Extender, Pulsed DC Bias
N5295AX52
Frequency Extender
The N5295AX52 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 120 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
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Product
Bias Network, 100 MHz to 12.4 GHz
11590B
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The Keysight 11590B broadband high power bias networks can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying DC bias to the center conductor of the coax connector for your device while blocking the DC to the RF port.
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Product
Single Site Test Handler
3210
Test Handler
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9162
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The HSCH-9162 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9162 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
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Product
Bias Network, 45 MHz to 50 GHz
11612B
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The Keysight 11612B broadband high power bias network can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying dc bias to the center conductor of the coax connector for your device while blocking the dc to the RF port.
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Product
120 GHz Frequency Extender, Pulsed DC Bias
N5295AX02
Frequency Extender
The N5295AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 120 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
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Product
Bias Networks
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Macom Technology Solutions Holdings Inc.
At MACOM we offer 18 - 40 GHz bias networks suitable for DC biasing of PIN diode control circuits. Our bias networks function as both RF to DC decoupling networks, as well as a DC return. These bias networks can also be used as bi-directional reactive couplers for Schottky detector circuits in multimarket applications.
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Product
External DC Bias Adapter
16200B
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The 16200B test fixture is designed to operate with high frequency LCR meters and impedance analyzers. It allows you to supply a bias current across the device of up to 5 Adc through a 7 mm port by using an external DC current source.
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Product
In-Circuit Testing and Test Engineering
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5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
POGO-72 High Performance Bias Ball Probe
POGO-72
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Test Cells
Emissions
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LaplaCells provide a facility for the rapid and efficient testing of the EMC compliance of products. These cells offer a calibrated and screened environment in which radiated emissions can be measured and immunity to RF radiation can be tested. They \re calibrated according to the methodology of IEC61000-4-20, thus affording compliant testing to IEC61000-4-3 and pre-compliance testing for radiated emission testing.
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Product
Test Prods
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Test prod with 4mm plug, test prod with 2mm pin, safety test prod, test prod 2mm, test prod 4mm, miniature test prod.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
ERP Testing
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Signing up for an ERP package is a big decision for any enterprise since it is closely related to key business processes and has the potential to significantly enhance the customer service and experience. To ensure an optimized return on investment, it is critical to have a successful roll-out with the desired features and benefits. With a high failure rate for ERP implementations, it is very crucial to have a comprehensive QA strategy and expertise. TestingXperts offers you specialist QA and solutions for ERP testing and ensures that your ERP systems function properly and meet your business needs. We have subject matter expertise on leading ERP QA packages, coupled with best-in-class QA processes, frameworks and accelerators to help you achieve your ERP goals. Our expert ERP software testing experts have the ability to test features of core applications end to end and also keep pace with the evolution.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1H-INS-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Mobile Testing
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Mobile devices are inarguably the most disruptive technology invention in recent times and have had an impact on human lives like no other. With a number of mobile devices surpassing the number of human population on earth, making your application mobile-ready is key to keeping today’s digital consumers happy. Across enterprises of all sizes, mobile apps have fuelled growth in the business operations and customer services. However, with the variety of platforms, devices and networks, there is significant infrastructure required for mobile application testing. The testing either is not exhaustive or very costly due to the sub-optimal approach used for testing.
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Product
Motor Testing
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Electronic Systems of Wisconsin, Inc.
ESW's Motor Test Systems come fully equipped with the latest industry features based on your testing needs. The on-screen display in our testers make it easy to read, track, and record your motor information during the testing process. We realize this importance and want to make sure you never have to worry about losing key information ever again. Performance and reliability are important, so we make sure you will have full confidence of every motor you test, whether you place it in your product or send out the door to your customer. ESW's design team works closely with you to determine the tests you need, in order to make a system that will meet all your testing needs. See the slideshow below to see some of our Motor Testers.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T24-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Battery Testing
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With the increasing dependency of back up systems on battery strings, and the escalating cost of replacing batteries, instrumentation and software systems that can measure, trend and manage the life-cycle of cells is a cost effective option.
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Product
DDoS Testing
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DDoS testing missions enable enterprises, operators and governments to test their resilience against DDoS and evaluate their DDoS mitigation infrastructure.
