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Backplane Test
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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16 Slot VME64x 19" Rackmount Development Platform
12V16OPX98Y5VPE0
Elma's Type 12V System Platform family of enclosures for VITA architectures (VME, VME64X, VPX and VXS) provides a rugged, versatile platform. This configuration is based on a 16-slot VME64X backplane. Assembled and tested.
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PCIe 6.0 Protocol Test Backplane
P5563B
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Multi-Interface Test Backplane
SKU-047-01
The Multi-Interface Test Backplane was designed to support hardware and software designers who need to be able to plug in boards with different interfaces (into the host computer).
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3 PICMG® CPU, 4 PCI™, 7 ISA Slots Backplane
HPCI-13S4LU
- Segment: 1- Slots: 3 PICMG® CPU, 4 PCI™, 7 ISA- Supports AT, ATX power supplies- Dimensions: 314.7 mm x 259 mm
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2-Slot 64-Bit 6U CompactPCI Backplane
cBP-6402R
ADLINK offers a wide selection of standard backplanes from single up to 20 slots. Furthermore, a professional OEM team is capable of custom backplanes with a quick turnaround tailored to your specifications. We make designing, developing, prototyping, and maintaining your projects simple & efficient. For all your backplane needs, give us a call, we have a solution for you.
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2 PICMG® CPU, 7 PCI™, 1 ISA Slots Backplane
HPCI-9S7U
- Segment: 1- Slots: 2 PICMG® CPU, 7 PCI™, 1 ISA- Supports AT, ATX power supplies- Dimensions: 213.4 mm x 259.1 mm
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1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-E®x 4, 2 PCI™ Slots Backplane
EBP-D5E2
- Segment: 1- Slots: 1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-E® x4, 2 PCI™- Support ATX power supplies- Dimension: 331 mm x 84 mm
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2-Slot 64-bit 6U CompactPCI Backplane
cBP-6402
ADLINK offers a wide selection of standard backplanes from single up to 20 slots. Furthermore, a professional OEM team is capable of custom backplanes with a quick turnaround tailored to your specifications. We make designing, developing, prototyping, and maintaining your projects simple & efficient. For all your backplane needs, give us a call, we have a solution for you.
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1 PICMG® CPU, 1 PCI-E® x16 (with x8 Bandwidth), 2 PCI-E® x4, 5 PCI-E® x1, 4 PCI Slots Backplane
WBP-13E8
- Segment: 1- Slots: 1 PICMG® CPU, 1 PCI-E® x16(with x8 bandwidth), 2 PCI-E® x4(with x4 bandwidth), 5 PCI-E® x1, 4 PCI®- Support ATX power supplies- Dimension: 327.6mm x 317.5mm- For NuPRO-E72& NuPRO-E43 only
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1 PICMG® CPU, 1 PCI-E® x16,1 PCI-X™, 2 PCI™ Slots Backplane
EBP-5E1
- Segment: 1- Slots:1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-X™, 2 PCI™- Support ATX power supplies- Dimension: 153 mm x 330 mm
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PICMG 2.11 3U CompactPCI 47-pin Power Backplanes
cBP-3061/cBP-3062
- PICMG 2.0 CompactPCI Specification Rev. 2.1 compliant- Design for 47-pin 3U CompactPCI redundant power supply*- cBP-3061 for single power supply, cBP-3062 for dual power supply- AC (and DC) Screw terminal input
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1 PICMG® CPU, 1 PCI-E® x4 Slots Backplane
EBP-D3E1
- Segment: 1- Slots: 1 PICMG® CPU, 1 PCI-E® x4- Support ATX power supplies- Dimension: 331 mm x 39 mm
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-E® x4, 4 PCI™ Slots Backplane
EBP-7E2
- Segment: 1- Slots: 1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-E® x4, 4 PCI™- Support ATX power supplies- Dimension: 328 mm x 206 mm
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14-Slot 32-Bit 6U CompactPCI H.110 Bus Backplane
cBP-6014R
- PICMG 2.0 CompactPCI Specification R3.0 Compliant- PICMG 2.1 CompactPCI Hot Swap Specification R2.0 Compliant- PICMG 2.5 H.110 Computer Telephony Specification R1.0 Compliant- PICMG 2.7 Dual system Bus specificationR1.0 compliant- One system slot with 13 expansion slots, system on the middle slot of the backplane
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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1 PICMG® CPU, 1 PCI-E® x16, 4 PCI-E® x1, 4 PCI® Slots Backplane
EBP-10E5
- Segment: 1- Slots:1 PICMG® CPU, 1 PCI-E® x16, 4 PCI-E® x1, 4 PCI®- Support ATX power supplies- Dimension: 330 mm x 318 mm
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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8-Slot 32-bit 6U CompactPCI Backplane
cBP-6108F
- PICMG:2.0 R3.0, 2.1 R2.0, 2.5 R1.0, 2.9 R1.0Note- Dimension:202.5 x 262.05 (mm, WxH, vertical insertion view)- Segment:One- cPCI Bus:32-bit/33MHz- System Slot:Right-hand side; System Slot Rear I/O:P3, P4 and P5 rear I/O with AB-type shroud
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3U CompactPCI® Subsystem with 8-slot Backplane and 1 + 1 CompactPCI® Redundant Power Modules
cPCIS-2632 Series
- 3U CompactPCI® backplane with seven peripheral slots and one system slot- Temperature, voltage, and fan monitoring LEDs- Supports current sharing on +5 V, +3.3 V, and +12 V- 1 + 1 hot swappable 250 W + 250 W CompactPCI® power supplies- PICMG® 2.11 47-pin power interface- Hot-swappable cooling fans & filter
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
