Test Call Generators
check telecom networks by call event validation.
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Product
PXI-5670, 2.7 GHz RF Vector Signal Generators
PXI-5670 / 778768-03
Vector Signal Generator
2.7 GHz PXI Vector Signal Generator—The PXI‑5670 has the power and flexibility you need for product development applications from design through manufacturing. It can generate custom and standard modulation formats such as AM, FM, PM, ASK, FSK, PSK, MSK, and QAM. The PXI‑5670 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as for emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks.
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Product
Standard 1.00 (28.00) - 2.75 (78.00) Non Replaceable General Purpose Probe
E-S-C
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
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Product
6GHz Dual Channel Signal Generator
LS6082B
Signal Generator
The LS6082B is a 6GHz Dual Channel RF Analog Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4J-1
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
Standard 1.00 (28.00) - 2.75 (78.00) Non Replaceable General Purpose Probe
E-S-R
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-6
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Product
PXIe-5450, 145 MHz Bandwidth, 16-Bit, 512 MB, I/Q PXI Waveform Generator
780419-02
Waveform Generator
PXIe, 145 MHz Bandwidth, 16-Bit, 512 MB, I/Q PXI Waveform Generator—The PXIe‑5450 is a 145 MHz, dual‐channel arbitrary waveform generator optimized for I/Q communications signals. It is an ideal instrument for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator. The PXIe‑5450 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5450 also features advanced synchronization and data streaming capabilities.
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Product
HPA-0B General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
20GHz Dual Channel MW Signal Generator 19" 1U Rack
LSX2092R
Signal Generator
The LSX2092R is a 20GHz Dual Channel Microwave Signal Generator, offers industry leading performance, in a 1U, 19” rack-mounted box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4F-2
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
PXI FlexRIO Signal Generator
FlexRIO Signal Generator
The PXI FlexRIO Signal Generator combines analog I/O and a user-programmable FPGA into a single, customizable instrument. The instrument enables RF signal generation up to 2.9 GHz with 12 bits of resolution. The PXI FlexRIO Signal Generator uses FPGAs from Xilinx alongside LabVIEW and Vivado programming options for custom algorithm implementation and real-time signal processing. Using this instrument with NI-TClk, you can synchronize modules in one or more PXI chassis at up to picosecond‐level accuracy for high‐channel‐count applications.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
PXIe-5745, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO Signal Generator
785596-01
FlexRIO Signal Generator
The PXIe-5745 enables direct RF generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s for generation up to 1.5 GHz or in a single-channel wideband upconversion mode at 6.4 GS/s. The PXIe-5745 is ideal for applications that require high channel density IF signal generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for generating predefined waveforms, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA for dynamically creating waveforms, signal modulation/demodulation, and other custom real-time signal processing.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
Standard 1.50 (43.00) - 3.00 (85.00) General Purpose Probe
P2665G-1V1S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
