Gigabit Ethernet Test
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9516G-4GMPW
Ethernet Switch Module
12 x M12 X-Coded 10/100/1000 Mbps PoE ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2,Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC.
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Product
4GE+2G SFP Managed Ethernet Switch
EKI-7706G-2F
Ethernet Switch Module
4 Gigabit Ethernet ports + 2 SFP ports, SFP socket for easy and flexible fiber expansion. Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D). IXM function enables fast deployment, Security: 802.1x (Port-based, MD5/TLS/TTLS/PEAP encryption), RADIUS, Management: SNMP v1/v2c/v3, WEB, Telnet, standard MIB, private MIB.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
4GE PoE+1G+1G SFP, Unmanaged Ethernet Switch
EKI-2706G-1GFPI
Ethernet Switch Module
Supports 10/100/1000 Mbps Auto Negotiation (EKI-2706G) Supports jumbo frame transmission up to 9 kbytes, DIN-rail with IP30 metal mechanism, Redundant 24~48 VDC power input(BE Version) 4 x IEEE 802.3 af/at PoE ports + 1 x Gigabit Copper + 1 Gigabit SFP ports.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Verification And Diagnostic Tools
Y1131A
Test Fixture
Provides module-specific tests to troubleshoot relay failures and predict maintenance requirements.
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Product
24G+4G Combo Port L2 Managed Switch
EKI-7428G-4CA
Ethernet Switch Module
24 x Gigabit ports + 4 x Gigabit Copper/SFP combo ports, SFP socket for easy and flexible fiber expansion, Management: SNMP v1/v2c/v3, WEB, Telnet, Standard MIB. IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption),HTTPS,SSH and SNMPv3.
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Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
EN50155 Managed PoE Switch
EKI-9528E-12GMPX
Ethernet Switch Module
M12 connector with ruggedized IP54 certified housing, Complies with EN50155 and EN50121-3-2 standards, 24 x PoE IEEE802.3af/at ports. Wide nominal power input range: 24 ~ 110VDC, Operating power input range: 16.8 ~ 137.5VDC, X-Ring Pro delivers rapid and predictable convergence.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
Standard Test Systems
WaveCore™ Products
Test System
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Product
8-Pin M12 Male To 8-Pin M12 Male (Right-Angle), Shielded, FieldDAQ M12 Ethernet Cable
785945-0R3
Ethernet Cable
IP67 Gigabit Ethernet, Shielded X-Code M12 Male to Shielded M12 Male (Right Angle) 0.3M for FieldDAQ
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
5GE Unmanaged Ethernet Switch
EKI-2725
Ethernet Switch Module
Provides 5 Gigabit Ethernet ports with Auto MDI/MDI-X, Supports 10/100/1000Mbps Auto Negotiation, Supports jumbo frame transmission up to 9kbytes, Provides Slim size, DIN-rail with IP30 metal mechanism.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
Test Port Adapter
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Test Port Adapter Set, 1.85 Mm To 1.85 Mm
85130H
Test Port Adapter
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
