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Product
Receiver, 9025TR, 25 Module, with 20" Platform
310104435
Receiver
Runners along the platform provide a smooth-sliding action, ideal when using fixtures up to 180 pounds. The 9025TR can be adapted to accommodate vacuum or mechanical fixturing. VPC modules can be intermixed to establish flexible custom interfaces which are ideal for functional and system testing applications. The 9025TR uses all standard VPC 90 series modules and contacts, includes a microswitch and is available with optional table legs and keyboard tray kit. Slide kit required, but not included.
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Product
Flying Probe Testers
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SPEA’s Flying Probe Testers help manufacturers of printed circuit boards to deliver top-quality products in the fastest time-to-market, avoiding fixture cost and increasing accessibility when compared to bed-of-nails testers.
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Product
Exchangeable Test Fixture
MA 2109/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Product
High Speed Device & Flash Programmer
JT 2147 QuadPOD
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The JT 2147 QuadPOD high speed device programmer and flash programmer comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. Used for gang, parallel, fast testing / Programming of devices.TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Product
Test Station Spectrum | 1280 Pin
581013
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Test Station Spectrum I Interface TSSE88xx - 1280 Pin. Put together the right fixture kit, consisting of housing and kit.
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Product
PC Based Test Setup for LED Driver of LED
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The tests are Performed as Prescribed in IS the Panel Carries out high voltage, open circuit and performance tests, one by one and provides indication of the Test results as PASS or FAIL lamp for high voltage test. It is very useful and handy in line testing on Mass production line as well as type Testing. Special fixture can be provided for the specific product. This avoids the connections & disconnections of the product for different tests. The total time for entire testing is less than 80 seconds. Micro controller based sequential timer maintains the sequence of operation and displays the test status. The entire system is housed in sturdy M.S cabinet with powder coating.
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Product
Test Accessories
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By combining the latest in LED technology with the unmatched illuminating dynamics of prismatic glass, this High Bay LED luminaire brings a superior, incomparable proficiency and reliability to the table. With its remote driver capability, the TDK HBLED-540 High Bay LED Light Fixture is ideal for EMC chambers with minimal RF emissions.
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Product
Coefficient of Friction Gauges
M5-2-COF
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The M5-2-COF coefficient of friction (COF) gauge is an integral part of a COF testing system, typically including a motorized test stand and COF fixture. With a capacity of 2 lbF [10 N], the gauge can be used to measure friction for a wide range of materials, ideal for conformance to ASTM D1894 and other relevant standards. Static and kinetic coefficients are displayed on the backlit LCD, and are calculated from a user-programmable sled weight.
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Product
EIS Battery Analyzer
BA8100
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The BA8100 is designed to accurately measure the internal impedance of a single cell or battery stack with voltages as high as 80 V. In addition to impedance, auxiliary measurements include voltage, current, phase, capacitance, inductance, quality factor and more. With the provided software, the BA8100 can perform Electrochemical Impedance Spectroscopy (EIS) across a frequency range of 50 mHz to 10 kHz. The impedance spectrum can be evaluated through the Nyquist and Bode plot tools to determine effective series resistance (ESR) and track battery health. Included with the BA8100 is a self-test fixture to verify the instrument’s performance or compensate for resistance introduced by the test leads.
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Product
MCB Thermal Trip Calibration Test Bench (IEC 60898 Cl 9.10.1.2, Annex I.1, IS)
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The test system is designed and customized to carry out 2.55*Intest as per Table 7 (test c) of IEC 60898 (also mentioned for routine testing of MCBs. The test is done at dc current to exactly analyze and correct the bimetallic properties of the MCB as far as thermal tripping is concerned. The unit comes with a pneumatically operated test fixture with in-built dc stepper motor that is controlled by a micro controller / PC to calibrate the breaker into a narrow tripping band programmed by the user.
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Product
Laser Diode Characterization Testing
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The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Product
Insertion Aids
335016
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To simplify handling when installing the assembly in the fixture, so-called insertion aids are installed as pre-centreers. - Stainless steel insertion aids - POM insertion aids (with M3x16 screw)
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Product
XCITE 1100-5 Inertial Mass Excitation System
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The 1100-5 Inertial Mass Modal Excitation system allows the testing of structures where backup fixturing is not available or possible. Accelerating an internal mass with the closed loop hydraulic excitation system generates the inertial forces. The compression control of the Xcite Master Controller maintains a constant force over a frequency sweep by continuously altering the drive signal to maintain the required dynamic force level.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
Multi-points Temperature Tester
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Shenzhen Chuangxin Instruments Co., Ltd.
TP series of multiplex temperature meter is a kind of instrument which suits to real time monitor and trace multi-points temperature simultaneously. With the features of Simplified operation, high precision and reusable thermocouple, it is widely applied in electronic ballast, motor tools, lighting fixtures and household appliances. The application software records and save the temperature rising curve in real time for analyze purpose.
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Product
Testing Services
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*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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Product
Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Product
MIPI Test Fixtures & Software
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The UNH-IOL has been a contributing member of the MIPI Alliance since 2007 and tests all mobile devices looking for MIPI conformance and physical layer testing including C-PHY, D-PHY, DSI, and CSI-2. All UNH-IOL MIPI Test Fixtures and Tools are available to member and non-member companies. Below are just some of the MIPI Solutions we offer. For a full list please visit our MIPI Test Fixtures page.
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Product
Boundary Scan Program Development Service
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No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Product
High speed capture lighting
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EYE / Iwasaki has developed a family of products to address the most demanding test requirements. This includes Overhead Fixtures, Portable Floor and Pit Fixtures, and On-Board Lighting Fixtures.
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Product
In-Circuit Test Fixtures
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In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
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Product
VOC FIXTURE OVER CLAMP ASSEMBLY'S
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Test-X VOC Series overclamps are used for testing bare or loaded printed circuit boards with open vias and to minimize board flex.The VOC Series overclamp comes with adjustable delrin pressure fingers, anti-rotating hex nuts, hinge and latching assemblies, mounting instructions and hardware.The VOC Series will accomodate fixtures with dress frames or newer style fixtures using full-size top plates.
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Product
High Node Count In-Circuit Test Fixtures
HNC Test Fixture
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Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.
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Product
Drop-In Functional Test Fixtures
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Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Product
Test Fixtures
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At A.T.E Solutions we have a dealt with a wide range of test subjects in the past 30 years and have extensive experience in providing reliable test fixture solutions.
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Product
Gas Springs - MMI Series
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The gas springs support the opening and closing of the bonnet - whether vacuum or mechanical, manual or auto-open-close. Different gas springs are used depending on the fixture or bonnet type, as these are determined by weight and size. These gas springs are specifically the gas springs that are fitted as standard in our MMI series.
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Product
G12 - 12 Module Solution
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For maximum versatility and easy access to instrument-side wiring and cable assemblies, VPC offers a selection of slide kits designed to fit most common rack depths. All slides are rated to support 180 lbs (81 kg) to accommodate even the largest fixtures. To order, measure rack depth between mounting rails. With this measurement choose the slide mounting kit that fits the rack. A rack extender kit is available for mounting to racks with recessed rails.
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Product
PXI 22-Channel 2A Fault Insert Switches
40-202-001
Fault Insertion Unit
This is the 22 Channel version of the 40-202 Fault Insertion Switch. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test.
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Product
Solar Radiation Sensors
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The solar radiation sensors that Campbell Scientific offers come in a variety of designs: pyranometers, net radiometers, quantum sensors, and pyrheliometers. These sensors measure various aspects of the energy imparted by the sun on the Earth’s surface. A leveling fixture fitted with a bubble level may be required to accurately install solar radiation sensors.




























